{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:28:44Z","timestamp":1750307324591,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":11,"publisher":"ACM","license":[{"start":{"date-parts":[[2011,6,5]],"date-time":"2011-06-05T00:00:00Z","timestamp":1307232000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,6,5]]},"DOI":"10.1145\/2024724.2024913","type":"proceedings-article","created":{"date-parts":[[2011,9,6]],"date-time":"2011-09-06T15:10:46Z","timestamp":1315321846000},"page":"842-847","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["Facing the challenge of new design features"],"prefix":"10.1145","author":[{"given":"Wisam","family":"Kadry","sequence":"first","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ronny","family":"Morad","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alex","family":"Goryachev","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eli","family":"Almog","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Krygowski","sequence":"additional","affiliation":[{"name":"IBM Systems & Technology Group Poughkeepsie, NY"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2011,6,5]]},"reference":[{"doi-asserted-by":"publisher","key":"e_1_3_2_1_1_1","DOI":"10.1109\/MDT.2004.1277900"},{"key":"e_1_3_2_1_2_1","volume-title":"Microprocessor Test and Verification","author":"Adir A.","year":"2002","unstructured":"A. Adir , R. Emek , and E. Marcus . Adaptive test generation . In Microprocessor Test and Verification , 2002 . A. Adir, R. Emek, and E. Marcus. Adaptive test generation. In Microprocessor Test and Verification, 2002."},{"key":"e_1_3_2_1_3_1","volume-title":"Writing Testbenches: Functional Verification of HDL Models","author":"Bergeron J.","year":"2000","unstructured":"J. Bergeron . Writing Testbenches: Functional Verification of HDL Models . Kluwer Academic Publishers , January 2000 . J. Bergeron. Writing Testbenches: Functional Verification of HDL Models. Kluwer Academic Publishers, January 2000."},{"key":"e_1_3_2_1_4_1","volume-title":"Verification Methodology Manual for SystemVerilog","author":"Bergeron J.","year":"2005","unstructured":"J. Bergeron , E. Cerny , A. Hunter , and A. Nightingale . Verification Methodology Manual for SystemVerilog . Springer-Verlag New York, Inc. , Secaucus, NJ, USA , 2005 . J. Bergeron, E. Cerny, A. Hunter, and A. Nightingale. Verification Methodology Manual for SystemVerilog. Springer-Verlag New York, Inc., Secaucus, NJ, USA, 2005."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_5_1","DOI":"10.1145\/1629911.1629971"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_6_1","DOI":"10.1145\/1278480.1278700"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_7_1","DOI":"10.5555\/1114283.1114504"},{"unstructured":"IBM. Power Systems. http:\/\/www-03.ibm.com\/systems\/power\/.  IBM. Power Systems. http:\/\/www-03.ibm.com\/systems\/power\/.","key":"e_1_3_2_1_8_1"},{"unstructured":"IBM. System z. http:\/\/www-03.ibm.com\/systems\/z\/.  IBM. System z. http:\/\/www-03.ibm.com\/systems\/z\/.","key":"e_1_3_2_1_9_1"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_10_1","DOI":"10.1147\/sj.301.0034"},{"unstructured":"Power.org. PowerISA v2.06. http:\/\/www.power.org\/resources\/downloads.  Power.org. PowerISA v2.06. http:\/\/www.power.org\/resources\/downloads.","key":"e_1_3_2_1_11_1"}],"event":{"sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE Council on Electronic Design Automation (CEDA)"],"acronym":"DAC '11","name":"DAC '11: The 48th Annual Design Automation Conference 2011","location":"San Diego California"},"container-title":["Proceedings of the 48th Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2024724.2024913","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2024724.2024913","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T11:05:59Z","timestamp":1750244759000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2024724.2024913"}},"subtitle":["an effective verification approach"],"short-title":[],"issued":{"date-parts":[[2011,6,5]]},"references-count":11,"alternative-id":["10.1145\/2024724.2024913","10.1145\/2024724"],"URL":"https:\/\/doi.org\/10.1145\/2024724.2024913","relation":{},"subject":[],"published":{"date-parts":[[2011,6,5]]},"assertion":[{"value":"2011-06-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}