{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,7]],"date-time":"2026-07-07T14:53:41Z","timestamp":1783436021042,"version":"3.54.6"},"publisher-location":"New York, NY, USA","reference-count":11,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,6,3]],"date-time":"2012-06-03T00:00:00Z","timestamp":1338681600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["GRC Task 1836.093"],"award-info":[{"award-number":["GRC Task 1836.093"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,6,3]]},"DOI":"10.1145\/2228360.2228456","type":"proceedings-article","created":{"date-parts":[[2012,5,31]],"date-time":"2012-05-31T12:10:51Z","timestamp":1338466251000},"page":"536-541","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":8,"title":["Variability-aware, discrete optimization for analog circuits"],"prefix":"10.1145","author":[{"given":"Seobin","family":"Jung","sequence":"first","affiliation":[{"name":"Seoul National University, Seoul, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yunju","family":"Choi","sequence":"additional","affiliation":[{"name":"Seoul National University, Seoul, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaeha","family":"Kim","sequence":"additional","affiliation":[{"name":"Seoul National University, Seoul, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2012,6,3]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"International Technology Roadmap For Semiconductors (ITRS): 2009 Edition Available: http:\/\/www.itrs.net\/Links\/2009ITRS\/Home2009.hht.  International Technology Roadmap For Semiconductors (ITRS): 2009 Edition Available: http:\/\/www.itrs.net\/Links\/2009ITRS\/Home2009.hht."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/5.899053"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.848091"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.810742"},{"key":"e_1_3_2_1_5_1","volume-title":"Wiley Interscience","author":"Cover T.","year":"2006"},{"key":"e_1_3_2_1_6_1","unstructured":"S. Jung S. Youn and J. Kim \"Analysis on Performance Controllability under Process Variability: A Step Towards Grid-Based Analog Circuit Optimizers \" Frontiers in Analog Circuit (FAC) Synthesis and Verification July 2011.  S. Jung S. Youn and J. Kim \"Analysis on Performance Controllability under Process Variability: A Step Towards Grid-Based Analog Circuit Optimizers \" Frontiers in Analog Circuit (FAC) Synthesis and Verification July 2011."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8659.2009.01645.x"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/502109.502111"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/9.119632"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.857417"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.819120"}],"event":{"name":"DAC '12: The 49th Annual Design Automation Conference 2012","location":"San Francisco California","acronym":"DAC '12","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"]},"container-title":["Proceedings of the 49th Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2228360.2228456","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2228360.2228456","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:49:02Z","timestamp":1750236542000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2228360.2228456"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6,3]]},"references-count":11,"alternative-id":["10.1145\/2228360.2228456","10.1145\/2228360"],"URL":"https:\/\/doi.org\/10.1145\/2228360.2228456","relation":{},"subject":[],"published":{"date-parts":[[2012,6,3]]},"assertion":[{"value":"2012-06-03","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}