{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:50:35Z","timestamp":1750308635300,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":17,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,3,26]],"date-time":"2012-03-26T00:00:00Z","timestamp":1332720000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,3,26]]},"DOI":"10.1145\/2245276.2231960","type":"proceedings-article","created":{"date-parts":[[2012,6,11]],"date-time":"2012-06-11T13:03:31Z","timestamp":1339419811000},"page":"1171-1176","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Estimating software reliability via pseudo maximum likelihood method"],"prefix":"10.1145","author":[{"given":"Shinya","family":"Ikemoto","sequence":"first","affiliation":[{"name":"Hiroshima University, Kagamiyama, Higashi-Hiroshima, Japan"}]},{"given":"Tadashi","family":"Dohi","sequence":"additional","affiliation":[{"name":"Hiroshima University, Kagamiyama, Higashi-Hiroshima, Japan"}]},{"given":"Hiroyuki","family":"Okamura","sequence":"additional","affiliation":[{"name":"Hiroshima University, Kagamiyama, Higashi-Hiroshima, Japan"}]}],"member":"320","published-online":{"date-parts":[[2012,3,26]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985800"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.2307\/1913472"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.2307\/1913471"},{"key":"e_1_3_2_1_5_1","volume-title":"Handbook of Software Reliability Engineering","author":"Lyu M. R.","year":"1996","unstructured":"M. R. Lyu . Handbook of Software Reliability Engineering . McGraw-Hill , New York , 1996 . M. R. Lyu. Handbook of Software Reliability Engineering. McGraw-Hill, New York, 1996."},{"key":"e_1_3_2_1_6_1","volume-title":"Measurement, Prediction, Application","author":"Musa J. D.","year":"1987","unstructured":"J. D. Musa , A. Iannino , and K. Okumoto . Software Reliability , Measurement, Prediction, Application . McGraw-Hill , New York , 1987 . J. D. Musa, A. Iannino, and K. Okumoto. Software Reliability, Measurement, Prediction, Application. McGraw-Hill, New York, 1987."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.5555\/800054.801975"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539308002903"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.14"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/IWSM-MENSURA.2011.26"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.5555\/1890580.1890602"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1198\/004017005000000292"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/COMPSAC.2006.68"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2006.28"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1002\/asm.3150010108"},{"key":"e_1_3_2_1_17_1","first-page":"79","article-title":"Software reliability growth modeling with number of test runs","volume":"67","author":"Yamada S.","year":"1984","unstructured":"S. Yamada , S. Osaki , and H. Narihisa . Software reliability growth modeling with number of test runs . Transactions of the IECE of Japan , E67 : 79 -- 83 , 1984 . S. Yamada, S. Osaki, and H. Narihisa. Software reliability growth modeling with number of test runs. Transactions of the IECE of Japan, E67: 79--83, 1984.","journal-title":"Transactions of the IECE of Japan"}],"event":{"name":"SAC 2012: ACM Symposium on Applied Computing","sponsor":["SIGAPP ACM Special Interest Group on Applied Computing"],"location":"Trento Italy","acronym":"SAC 2012"},"container-title":["Proceedings of the 27th Annual ACM Symposium on Applied Computing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2245276.2231960","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2245276.2231960","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T19:08:03Z","timestamp":1750273683000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2245276.2231960"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3,26]]},"references-count":17,"alternative-id":["10.1145\/2245276.2231960","10.1145\/2245276"],"URL":"https:\/\/doi.org\/10.1145\/2245276.2231960","relation":{},"subject":[],"published":{"date-parts":[[2012,3,26]]},"assertion":[{"value":"2012-03-26","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}