{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T03:47:02Z","timestamp":1772164022045,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":3,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,6,11]],"date-time":"2012-06-11T00:00:00Z","timestamp":1339372800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,6,11]]},"DOI":"10.1145\/2254756.2254822","type":"proceedings-article","created":{"date-parts":[[2012,6,11]],"date-time":"2012-06-11T09:03:31Z","timestamp":1339405411000},"page":"419-420","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Fast cost efficient designs by building upon the plackett and burman method"],"prefix":"10.1145","author":[{"given":"Manish","family":"Arora","sequence":"first","affiliation":[{"name":"UC San Diego, La Jolla, CA, USA"}]},{"given":"Feng","family":"Wang","sequence":"additional","affiliation":[{"name":"Qualcomm Inc., San Diego, CA, USA"}]},{"given":"Bob","family":"Rychlik","sequence":"additional","affiliation":[{"name":"Qualcomm Inc., San Diego, CA, USA"}]},{"given":"Dean","family":"Tullsen","sequence":"additional","affiliation":[{"name":"UC San Diego, La Jolla, CA, USA"}]}],"member":"320","published-online":{"date-parts":[[2012,6,11]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Design and Analysis of Experiments","author":"Montgomery D. C.","year":"2006","unstructured":"D. C. Montgomery . Design and Analysis of Experiments . John Wiley & Sons , 2006 . D. C. Montgomery. Design and Analysis of Experiments. John Wiley & Sons, 2006."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/33.4.305"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.5555\/822080.822822"}],"event":{"name":"SIGMETRICS '12: ACM SIGMETRICS\/PERFORMANCE Joint International Conference on Measurement and Modeling of Computer Systems","location":"London England, UK","acronym":"SIGMETRICS '12","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation","IFIP International Federation for Information Processing"]},"container-title":["Proceedings of the 12th ACM SIGMETRICS\/PERFORMANCE joint international conference on Measurement and Modeling of Computer Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2254756.2254822","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2254756.2254822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T05:20:50Z","timestamp":1750224050000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2254756.2254822"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6,11]]},"references-count":3,"alternative-id":["10.1145\/2254756.2254822","10.1145\/2254756"],"URL":"https:\/\/doi.org\/10.1145\/2254756.2254822","relation":{"is-identical-to":[{"id-type":"doi","id":"10.1145\/2318857.2254822","asserted-by":"object"}]},"subject":[],"published":{"date-parts":[[2012,6,11]]},"assertion":[{"value":"2012-06-11","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}