{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:24:13Z","timestamp":1750307053198,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":21,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,7,15]],"date-time":"2012-07-15T00:00:00Z","timestamp":1342310400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,7,15]]},"DOI":"10.1145\/2338966.2336799","type":"proceedings-article","created":{"date-parts":[[2012,7,26]],"date-time":"2012-07-26T14:41:14Z","timestamp":1343313674000},"page":"7-11","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":7,"title":["Extended program invariants: applications in testing and fault localization"],"prefix":"10.1145","author":[{"given":"Mohammad Amin","family":"Alipour","sequence":"first","affiliation":[{"name":"Oregon State University, USA"}]},{"given":"Alex","family":"Groce","sequence":"additional","affiliation":[{"name":"Oregon State University, USA"}]}],"member":"320","published-online":{"date-parts":[[2012,7,15]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/52.88940"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/503272.503275"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1166591"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1062455.1062522"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/512760.512770"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1134285.1134435"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1138912.1138918"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1984.5010257"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.908957"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/2338965.2336763"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101948"},{"key":"e_1_3_2_1_12_1","first-page":"60","volume-title":"Proceedings of the 25th International Conference on Software Engineering (Washington, DC, USA, 2003), ICSE'03, IEEE Computer Society","author":"HARDER M.","unstructured":"HARDER , M. , MELLEN , J. , AND ERNST , M. D. Improving test suites via operational abstraction . In Proceedings of the 25th International Conference on Software Engineering (Washington, DC, USA, 2003), ICSE'03, IEEE Computer Society , pp. 60 - 71 . HARDER, M., MELLEN, J., AND ERNST, M. D. Improving test suites via operational abstraction. In Proceedings of the 25th International Conference on Software Engineering (Washington, DC, USA, 2003), ICSE'03, IEEE Computer Society, pp. 60-71."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/581339.581397"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-00593-0_33"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/781131.781148"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065014"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/1145735.1145743"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1145\/302405.302637"},{"key":"e_1_3_2_1_19_1","volume-title":"AADEBUG","author":"PYTLIK B.","year":"2003","unstructured":"PYTLIK , B. , RENIERIS , M. , KRISHNAMURTHI , S. , AND REISS , S. Automated fault localization using potential invariants . In AADEBUG ( 2003 ). PYTLIK, B., RENIERIS, M., KRISHNAMURTHI, S., AND REISS, S. Automated fault localization using potential invariants. In AADEBUG (2003)."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2003.1240292"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1145\/566172.566212"}],"event":{"name":"ISSTA '12: International Symposium on Software Testing and Analysis","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","SIGPLAN ACM Special Interest Group on Programming Languages"],"location":"Minneapolis MN USA","acronym":"ISSTA '12"},"container-title":["Proceedings of the Ninth International Workshop on Dynamic Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2338966.2336799","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2338966.2336799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T09:21:08Z","timestamp":1750238468000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2338966.2336799"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,7,15]]},"references-count":21,"alternative-id":["10.1145\/2338966.2336799","10.1145\/2338966"],"URL":"https:\/\/doi.org\/10.1145\/2338966.2336799","relation":{},"subject":[],"published":{"date-parts":[[2012,7,15]]},"assertion":[{"value":"2012-07-15","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}