{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:22:16Z","timestamp":1750306936390,"version":"3.41.0"},"reference-count":43,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2013,1,1]],"date-time":"2013-01-01T00:00:00Z","timestamp":1356998400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000143","name":"Division of Computing and Communication Foundations","doi-asserted-by":"publisher","award":["CCF-0915302, CCF-1110290, CCF-1061164, and CCF-1205176"],"award-info":[{"award-number":["CCF-0915302, CCF-1110290, CCF-1061164, and CCF-1205176"]}],"id":[{"id":"10.13039\/100000143","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2013,1]]},"abstract":"<jats:p>As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection techniques, including logic implication-based checker hardware, are capable of detecting at least some of these errors as they occur. However, recovery may be expensive, and the underlying problem may lead to multiple failures of a core over time. In this article, we will investigate the diagnostic capability of logic implications to identify possible failure locations when an error is detected online. We will then utilize this information to select a highly efficient test set that can be used to effectively test the identified suspect locations in both the failing core and in other identical cores in the system.<\/jats:p>","DOI":"10.1145\/2390191.2390205","type":"journal-article","created":{"date-parts":[[2013,1,15]],"date-time":"2013-01-15T15:32:11Z","timestamp":1358263931000},"page":"1-19","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Using implications to choose tests through suspect fault identification"],"prefix":"10.1145","volume":"18","author":[{"given":"Jennifer","family":"Dworak","sequence":"first","affiliation":[{"name":"Southern Methodist University, Dallas, TX"}]},{"given":"Kundan","family":"Nepal","sequence":"additional","affiliation":[{"name":"University of St. Thomas, MN"}]},{"given":"Nuno","family":"Alves","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI"}]},{"given":"Yiwen","family":"Shi","sequence":"additional","affiliation":[{"name":"Oracle, San Jose, CA"}]},{"given":"Nicholas","family":"Imbriglia","sequence":"additional","affiliation":[{"name":"Intel, WA"}]},{"given":"R.","family":"Iris Bahar","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI"}]}],"member":"320","published-online":{"date-parts":[[2013,1,16]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2043590"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687418"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1785481.1785513"},{"volume-title":"Proceedings of the IEEE VLSI Test Symposium (VTS'11)","author":"Alves N.","key":"e_1_2_1_5_1"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278667"},{"key":"e_1_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.38"},{"key":"e_1_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.51"},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2003.1206281"},{"volume-title":"Proceedings of the 4th International Symposium on Quality Electronic Design (ISQED'03)","author":"Drineas P.","key":"e_1_2_1_10_1"},{"volume-title":"Proceedings of the IEEE International Test Conference (ITC'07)","year":"2007","author":"Dworak J.","key":"e_1_2_1_11_1"},{"volume-title":"Proceedings of the IEEE International Test Conference (ITC'00)","author":"Dworak J.","key":"e_1_2_1_12_1"},{"key":"e_1_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/54.902820"},{"key":"e_1_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.26"},{"key":"e_1_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.856980"},{"key":"e_1_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2005.63"},{"volume-title":"Proceedings of the IEEE International Test Conference. 195--204","author":"Hellebrand S.","key":"e_1_2_1_17_1"},{"key":"e_1_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.916875"},{"volume-title":"Proceedings of the IEEE International Test Conference. (ITC'08)","author":"Inoue H.","key":"e_1_2_1_19_1"},{"key":"e_1_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2032375"},{"volume-title":"Proceedings of the IEEE\/ACM International Conference on Computer-Aided Design (ICCAD'07)","author":"Kang K.","key":"e_1_2_1_21_1"},{"volume-title":"Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. 491--500","author":"Kapur R.","key":"e_1_2_1_22_1"},{"key":"e_1_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.152"},{"key":"e_1_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"e_1_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1007\/11527695_27"},{"volume-title":"Proceedings of the European Conference on Design and Test (EDTC'97)","author":"Manich S.","key":"e_1_2_1_26_1"},{"key":"e_1_2_1_27_1","doi-asserted-by":"crossref","unstructured":"Mitra S. and McCluskey E. J. 2000. Which concurrent error detection scheme to choose&quest; In Proceedings of the IEEE International Test Conference (ITC'00). 985--994. Mitra S. and McCluskey E. J. 2000. Which concurrent error detection scheme to choose&quest; In Proceedings of the IEEE International Test Conference (ITC'00). 985--994.","DOI":"10.1109\/TEST.2000.894311"},{"volume-title":"Proceedings of the ACM\/IEEE, International Symposium on Microarchitecture. 29--40","author":"Mukherjee S. S.","key":"e_1_2_1_28_1"},{"volume-title":"Proceedings of the IEEE, International Test Conference (ITC'08)","author":"Nepal K.","key":"e_1_2_1_29_1"},{"key":"e_1_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1017"},{"key":"e_1_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.238041"},{"volume-title":"Proceedings of the 19th IEEE International Symposium Defect and Fault Tolerance in VLSI Systems. 183--190","author":"Pomeranz I.","key":"e_1_2_1_32_1"},{"key":"e_1_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.834955"},{"key":"e_1_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403662"},{"volume-title":"Proceedings of the IEEE International Test Conference (ITC'06)","author":"Shahidi S.","key":"e_1_2_1_35_1"},{"volume-title":"Proceedings of the 18th International Symposium on Fault-Tolerant Computing. 164--169","author":"Sharma R.","key":"e_1_2_1_36_1"},{"key":"e_1_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.48"},{"volume-title":"Proceedings of the VLSI Test Symposium (VTS'10)","author":"Shi Y.","key":"e_1_2_1_38_1"},{"key":"e_1_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.8"},{"key":"e_1_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-011-5205-z"},{"key":"e_1_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.28"},{"key":"e_1_2_1_42_1","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538759"},{"key":"e_1_2_1_43_1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.414.0463"}],"container-title":["ACM Transactions on Design Automation of Electronic Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2390191.2390205","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2390191.2390205","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:35:45Z","timestamp":1750235745000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2390191.2390205"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,1]]},"references-count":43,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2013,1]]}},"alternative-id":["10.1145\/2390191.2390205"],"URL":"https:\/\/doi.org\/10.1145\/2390191.2390205","relation":{},"ISSN":["1084-4309","1557-7309"],"issn-type":[{"type":"print","value":"1084-4309"},{"type":"electronic","value":"1557-7309"}],"subject":[],"published":{"date-parts":[[2013,1]]},"assertion":[{"value":"2011-09-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2012-10-01","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2013-01-16","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}