{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:21:40Z","timestamp":1750306900128,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":14,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,3,20]],"date-time":"2012-03-20T00:00:00Z","timestamp":1332201600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,3,20]]},"DOI":"10.1145\/2393091.2393130","type":"proceedings-article","created":{"date-parts":[[2012,11,13]],"date-time":"2012-11-13T15:04:07Z","timestamp":1352819047000},"page":"206-215","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Multi-relationship evaluation design"],"prefix":"10.1145","author":[{"given":"Brian A.","family":"Weiss","sequence":"first","affiliation":[{"name":"National Institute of Standards and Technology, Gaithersburg, Maryland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Linda C.","family":"Schmidt","sequence":"additional","affiliation":[{"name":"University of Maryland, College Park, Maryland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2012,3,20]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1007\/s003550050105"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00163-002-0019-8"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00199-004-0556-7"},{"key":"e_1_3_2_1_4_1","unstructured":"Hillinger Claude 2004 \"Voting and the Cardinal Aggregation of Judgments \" Munich Discussion Paper 2004--9 (May 2004) http:\/\/epub.ub.uni-muenchen.de\/353\/.  Hillinger Claude 2004 \"Voting and the Cardinal Aggregation of Judgments \" Munich Discussion Paper 2004--9 (May 2004) http:\/\/epub.ub.uni-muenchen.de\/353\/."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2004.02.010"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00355-005-0046-2"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/s001639870001"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1115\/1.1363610"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"crossref","unstructured":"Weiss B. A. Schmidt L. C. Scott H. and Schlenoff C. I. 2010 \"The Multi-Relationship Evaluation Design Framework: Designing Testing Plans to Comprehensively Assess Advanced and Intelligent Technologies \" Proceedings of the ASME 2010 International Design Engineering Technical Conferences (IDETC) --- 22ND International Conference on Design Theory and Methodology (DTM).  Weiss B. A. Schmidt L. C. Scott H. and Schlenoff C. I. 2010 \"The Multi-Relationship Evaluation Design Framework: Designing Testing Plans to Comprehensively Assess Advanced and Intelligent Technologies \" Proceedings of the ASME 2010 International Design Engineering Technical Conferences (IDETC) --- 22ND International Conference on Design Theory and Methodology (DTM) .","DOI":"10.1115\/DETC2010-28928"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/2377576.2377603"},{"key":"e_1_3_2_1_11_1","first-page":"2","article-title":"The Multi-Relationship Evaluation Design Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems","volume":"32","author":"Weiss B. A.","year":"2011","unstructured":"Weiss , B. A. and Schmidt , L. C. , 2011 , \" The Multi-Relationship Evaluation Design Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems ,\" ITEA Journal. 32 , 2 (June 2011), 191--200. Weiss, B. A. and Schmidt, L. C., 2011, \"The Multi-Relationship Evaluation Design Framework: Producing Evaluation Blueprints to Test Emerging, Advanced, and Intelligent Systems,\" ITEA Journal. 32, 2 (June 2011), 191--200.","journal-title":"ITEA Journal."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"crossref","unstructured":"Weiss B. A. and Schmidt L. C. 2011 \"Multi-Relationship Evaluation Design: Formalizing Test Plan Input and Output Elements for Evaluating Developing Intelligent Systems \" Proceedings of the ASME 2011 International Design Engineering Technical Conferences (IDETC) --- 23RD International Conference on Design Theory and Methodology (DTM).  Weiss B. A. and Schmidt L. C. 2011 \"Multi-Relationship Evaluation Design: Formalizing Test Plan Input and Output Elements for Evaluating Developing Intelligent Systems \" Proceedings of the ASME 2011 International Design Engineering Technical Conferences (IDETC) --- 23RD International Conference on Design Theory and Methodology (DTM) .","DOI":"10.1115\/DETC2011-47971"},{"key":"e_1_3_2_1_13_1","first-page":"4","article-title":"Multi-Relationship Evaluation Design: Formalizing Test Plan Input and Output Blueprint Elements for Testing Developing Intelligent Systems","volume":"32","author":"Weiss B. A.","year":"2011","unstructured":"Weiss , B. A. and Schmidt , L. C. , 2011 , \" Multi-Relationship Evaluation Design: Formalizing Test Plan Input and Output Blueprint Elements for Testing Developing Intelligent Systems ,\" ITEA Journal. 32 , 4 (December 2011), 479--488. Weiss, B. A. and Schmidt, L. C., 2011, \"Multi-Relationship Evaluation Design: Formalizing Test Plan Input and Output Blueprint Elements for Testing Developing Intelligent Systems,\" ITEA Journal. 32, 4 (December 2011), 479--488.","journal-title":"ITEA Journal."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2007.904832"}],"event":{"name":"PerMIS'12: Performance Metrics for Intelligent Systems","sponsor":["University of Maryland University of Maryland","NIST National Institute of Standards & Technology","SIGAI ACM Special Interest Group on Artificial Intelligence"],"location":"College Park Maryland","acronym":"PerMIS'12"},"container-title":["Proceedings of the Workshop on Performance Metrics for Intelligent Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2393091.2393130","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2393091.2393130","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:19:10Z","timestamp":1750234750000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2393091.2393130"}},"subtitle":["modeling an automatic test plan generator"],"short-title":[],"issued":{"date-parts":[[2012,3,20]]},"references-count":14,"alternative-id":["10.1145\/2393091.2393130","10.1145\/2393091"],"URL":"https:\/\/doi.org\/10.1145\/2393091.2393130","relation":{},"subject":[],"published":{"date-parts":[[2012,3,20]]},"assertion":[{"value":"2012-03-20","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}