{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:22:03Z","timestamp":1750306923126,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":26,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,11,5]],"date-time":"2012-11-05T00:00:00Z","timestamp":1352073600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["GRK 1103BE 1176-15\/2PO 1220-2\/2"],"award-info":[{"award-number":["GRK 1103BE 1176-15\/2PO 1220-2\/2"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,11,5]]},"DOI":"10.1145\/2429384.2429391","type":"proceedings-article","created":{"date-parts":[[2013,1,22]],"date-time":"2013-01-22T15:29:29Z","timestamp":1358868569000},"page":"30-36","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":40,"title":["Small-delay-fault ATPG with waveform accuracy"],"prefix":"10.1145","author":[{"given":"Matthias","family":"Sauer","sequence":"first","affiliation":[{"name":"Albert-Ludwigs-University Freiburg, Freiburg, Germany"}]},{"given":"Alexander","family":"Czutro","sequence":"additional","affiliation":[{"name":"Albert-Ludwigs-University Freiburg, Freiburg, Germany"}]},{"given":"Ilia","family":"Polian","sequence":"additional","affiliation":[{"name":"University of Passau, Passau, Germany"}]},{"given":"Bernd","family":"Becker","sequence":"additional","affiliation":[{"name":"Albert-Ludwigs-University Freiburg, Freiburg, Germany"}]}],"member":"320","published-online":{"date-parts":[[2012,11,5]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"342","volume-title":"Test Conf.","author":"Smith G. L.","year":"1985","unstructured":"G. L. Smith , \"Model for Delay Faults Based upon Paths,\" in Int'l Test Conf. , pp. 342 -- 349 , 1985 . G. L. Smith, \"Model for Delay Faults Based upon Paths,\" in Int'l Test Conf., pp. 342--349, 1985."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.559333"},{"key":"e_1_3_2_1_3_1","unstructured":"W. Qiu and D. M. H. Walker \"An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit \" in Int'l Test Conf. pp. 592--601 2003.  W. Qiu and D. M. H. Walker \"An Efficient Algorithm for Finding the K Longest Testable Paths Through Each Gate in a Combinational Circuit \" in Int'l Test Conf. pp. 592--601 2003."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.19"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2043591"},{"key":"e_1_3_2_1_6_1","first-page":"1","volume-title":"ITC 2009","author":"Devta-Prasanna N.","year":"2009","unstructured":"N. Devta-Prasanna , S. Goel , A. Gunda , M. Ward , and P. Krishnamurthy , \" Accurate Measurement of Small Delay Defect Coverage of Test Patterns,\" in Test Conference, 2009 . ITC 2009 . International , pp. 1 -- 10 , nov. 2009 . N. Devta-Prasanna, S. Goel, A. Gunda, M. Ward, and P. Krishnamurthy, \"Accurate Measurement of Small Delay Defect Coverage of Test Patterns,\" in Test Conference, 2009. ITC 2009. International, pp. 1--10, nov. 2009."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.28"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.766720"},{"key":"e_1_3_2_1_9_1","first-page":"9","volume-title":"2010 28th","author":"Christou K.","year":"2010","unstructured":"K. Christou , M. Michael , and S. Neophytou , \" Identification of Critical Primitive Path Delay Faults without any Path Enumeration,\" in VLSI Test Symposium (VTS) , 2010 28th , pp. 9 -- 14 , april 2010 . K. Christou, M. Michael, and S. Neophytou, \"Identification of Critical Primitive Path Delay Faults without any Path Enumeration,\" in VLSI Test Symposium (VTS), 2010 28th, pp. 9--14, april 2010."},{"key":"e_1_3_2_1_10_1","first-page":"45","volume-title":"Effects of Delay Models on Peak Power Estimation of VLSI Sequential Circuits,\" in Int'l Conf. on CAD","author":"Hsiao M. S.","year":"1997","unstructured":"M. S. Hsiao , E. M. Rudnick , and J. H. Patel , \" Effects of Delay Models on Peak Power Estimation of VLSI Sequential Circuits,\" in Int'l Conf. on CAD , pp. 45 -- 51 , November 1997 . M. S. Hsiao, E. M. Rudnick, and J. H. Patel, \"Effects of Delay Models on Peak Power Estimation of VLSI Sequential Circuits,\" in Int'l Conf. on CAD, pp. 45--51, November 1997."},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.5555\/940821"},{"key":"e_1_3_2_1_12_1","volume-title":"Models in Hardware Testing, ch. 3","author":"Reddy S.","year":"2010","unstructured":"S. Reddy , Models in Hardware Testing, ch. 3 . Springer , 2010 . S. Reddy, Models in Hardware Testing, ch. 3. Springer, 2010."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.5555\/574323"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2013269"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.159998"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.5555\/1266366.1266586"},{"key":"e_1_3_2_1_17_1","first-page":"9","volume-title":"Proceedings. ITC 2005","author":"Sato Y.","year":"2005","unstructured":"Y. Sato , S. Hamada , T. Maeda , A. Takatori , Y. Nozuyama , and S. Kajihara , \" Invisible delay quality - SDQM model lights up what could not be seen,\" in Test Conference, 2005 . Proceedings. ITC 2005 . IEEE International , pp. 9 pp. --1210, nov. 2005 . Y. Sato, S. Hamada, T. Maeda, A. Takatori, Y. Nozuyama, and S. Kajihara, \"Invisible delay quality - SDQM model lights up what could not be seen,\" in Test Conference, 2005. Proceedings. ITC 2005. IEEE International, pp. 9 pp. --1210, nov. 2005."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10766-009-0124-7"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763207"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.108614"},{"key":"e_1_3_2_1_21_1","unstructured":"\"Nangate 45nm Open Cell Library.\" http:\/\/www.nangate.com.  \"Nangate 45nm Open Cell Library.\" http:\/\/www.nangate.com."},{"key":"e_1_3_2_1_22_1","volume-title":"antom --- Solver Description,\" in SAT Race","author":"Schubert T.","year":"2010","unstructured":"T. Schubert , M. Lewis , and B. Becker , \" antom --- Solver Description,\" in SAT Race , 2010 . T. Schubert, M. Lewis, and B. Becker, \"antom --- Solver Description,\" in SAT Race, 2010."},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10703-011-0122-4"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1007\/11499107_5"},{"key":"e_1_3_2_1_25_1","first-page":"93","volume-title":"SAT-based Analysis of Sensitisable Paths,\" in IEEE Design and Diagnostics of Electronic Circuits and Systems","author":"Sauer M.","year":"2011","unstructured":"M. Sauer , A. Czutro , T. Schubert , S. Hillebrecht , I. Polian , and B. Becker , \" SAT-based Analysis of Sensitisable Paths,\" in IEEE Design and Diagnostics of Electronic Circuits and Systems , pp. 93 -- 98 , April 2011 . Best Paper Award in the Test Category . M. Sauer, A. Czutro, T. Schubert, S. Hillebrecht, I. Polian, and B. Becker, \"SAT-based Analysis of Sensitisable Paths,\" in IEEE Design and Diagnostics of Electronic Circuits and Systems, pp. 93--98, April 2011. Best Paper Award in the Test Category."},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2011.43"}],"event":{"name":"ICCAD '12: The International Conference on Computer-Aided Design","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA"],"location":"San Jose California","acronym":"ICCAD '12"},"container-title":["Proceedings of the International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2429384.2429391","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2429384.2429391","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:35:25Z","timestamp":1750235725000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2429384.2429391"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11,5]]},"references-count":26,"alternative-id":["10.1145\/2429384.2429391","10.1145\/2429384"],"URL":"https:\/\/doi.org\/10.1145\/2429384.2429391","relation":{},"subject":[],"published":{"date-parts":[[2012,11,5]]},"assertion":[{"value":"2012-11-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}