{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:22:04Z","timestamp":1750306924134,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2012,11,5]],"date-time":"2012-11-05T00:00:00Z","timestamp":1352073600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2012,11,5]]},"DOI":"10.1145\/2429384.2429419","type":"proceedings-article","created":{"date-parts":[[2013,1,22]],"date-time":"2013-01-22T15:29:29Z","timestamp":1358868569000},"page":"180-186","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["A dynamic method for efficient random mismatch characterization of standard cells"],"prefix":"10.1145","author":[{"given":"Wangyang","family":"Zhang","sequence":"first","affiliation":[{"name":"IBM Systems and Technology Group, Hopewell Junction, NY"}]},{"given":"Amith","family":"Singhee","sequence":"additional","affiliation":[{"name":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY"}]},{"given":"Jinjun","family":"Xiong","sequence":"additional","affiliation":[{"name":"IBM Thomas J. Watson Research Center, Yorktown Heights, NY"}]},{"given":"Peter","family":"Habitz","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Essex Junction, VT"}]},{"given":"Amol","family":"Joshi","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Essex Junction, VT"}]},{"given":"Chandu","family":"Visweswariah","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Hopewell Junction, NY"}]},{"given":"James","family":"Sundquist","sequence":"additional","affiliation":[{"name":"IBM Systems and Technology Group, Essex Junction, VT"}]}],"member":"320","published-online":{"date-parts":[[2012,11,5]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"223","article-title":"Modeling and analysis of manufacturing variations","author":"Nassif S.","year":"2001","unstructured":"S. Nassif , \" Modeling and analysis of manufacturing variations ,\" IEEE CICC , pp. 223 -- 228 , 2001 . S. Nassif, \"Modeling and analysis of manufacturing variations,\" IEEE CICC, pp. 223--228, 2001.","journal-title":"IEEE CICC"},{"key":"e_1_3_2_1_2_1","volume-title":"International Technology Roadmap for Semiconductors","author":"Semiconductor Industry Association","year":"2011","unstructured":"Semiconductor Industry Association , International Technology Roadmap for Semiconductors , 2011 . Semiconductor Industry Association, International Technology Roadmap for Semiconductors, 2011."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/996566.996663"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065751"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1119772.1119779"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.20"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2011666"},{"key":"e_1_3_2_1_8_1","first-page":"1514","article-title":"A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology","author":"Zhu H.","year":"2007","unstructured":"H. Zhu , X. Zeng , W. Cai , J. Xue and D. Zhou , \" A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology ,\" IEEE DATE , pp. 1514 -- 1519 , 2007 . H. Zhu, X. Zeng, W. Cai, J. Xue and D. Zhou, \"A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology,\" IEEE DATE, pp. 1514--1519, 2007.","journal-title":"IEEE DATE"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403517"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.927671"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1007\/s003659900119"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1137\/S1064827501387826"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.5555\/103013"},{"key":"e_1_3_2_1_14_1","volume-title":"Design for Manufacturability and Statistical Design: A Constructive Approach","author":"Orshansky M.","year":"2007","unstructured":"M. Orshansky , S. Nassif , and D. Boning , Design for Manufacturability and Statistical Design: A Constructive Approach , Springer , 2007 . M. Orshansky, S. Nassif, and D. Boning, Design for Manufacturability and Statistical Design: A Constructive Approach, Springer, 2007."},{"key":"e_1_3_2_1_15_1","volume-title":"Timing","author":"Sapatnekar S.","year":"2004","unstructured":"S. Sapatnekar , Timing , Springer , 2004 . S. Sapatnekar, Timing, Springer, 2004."}],"event":{"name":"ICCAD '12: The International Conference on Computer-Aided Design","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA"],"location":"San Jose California","acronym":"ICCAD '12"},"container-title":["Proceedings of the International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2429384.2429419","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2429384.2429419","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:35:25Z","timestamp":1750235725000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2429384.2429419"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11,5]]},"references-count":15,"alternative-id":["10.1145\/2429384.2429419","10.1145\/2429384"],"URL":"https:\/\/doi.org\/10.1145\/2429384.2429419","relation":{},"subject":[],"published":{"date-parts":[[2012,11,5]]},"assertion":[{"value":"2012-11-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}