{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:22:53Z","timestamp":1750306973989,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","license":[{"start":{"date-parts":[[2013,5,29]],"date-time":"2013-05-29T00:00:00Z","timestamp":1369785600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2013,5,29]]},"DOI":"10.1145\/2463209.2488822","type":"proceedings-article","created":{"date-parts":[[2013,5,28]],"date-time":"2013-05-28T16:35:41Z","timestamp":1369758941000},"page":"1-7","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":8,"title":["Multidimensional analog test metrics estimation using extreme value theory and statistical blockade"],"prefix":"10.1145","author":[{"given":"Haralampos-G.","family":"Stratigopoulos","sequence":"first","affiliation":[{"name":"TIMA Laboratory (CNRS - Grenoble INP - UJF), Grenoble, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pierre","family":"Faubet","sequence":"additional","affiliation":[{"name":"Infiniscale S.A., Grenoble-Montbonnot, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoann","family":"Courant","sequence":"additional","affiliation":[{"name":"Infiniscale S.A., Grenoble-Montbonnot, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Firas","family":"Mohamed","sequence":"additional","affiliation":[{"name":"Infiniscale S.A., Grenoble-Montbonnot, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2013,5,29]]},"reference":[{"volume-title":"IEEE International Test Conference","year":"2010","author":"Mannath D.","key":"e_1_3_2_1_1_1"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_2_1","DOI":"10.1109\/TEST.2012.6401587"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_3_1","DOI":"10.1109\/DATE.2005.277"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_4_1","DOI":"10.1109\/TVLSI.2009.2017196"},{"key":"e_1_3_2_1_5_1","first-page":"226","volume-title":"IEEE VLSI Test Symposium","author":"Sunter S.","year":"1999"},{"volume-title":"Stochastic Modeling and Applied Probability. Springer","year":"1997","author":"Embrechts P.","key":"e_1_3_2_1_6_1"},{"doi-asserted-by":"crossref","unstructured":"S.\n       \n      Coles An Introduction to Statistical Modeling of Extreme Values Springer Series in Statistics\n  . \n  Springer 2001\n  .  S. Coles An Introduction to Statistical Modeling of Extreme Values Springer Series in Statistics. Springer 2001.","key":"e_1_3_2_1_7_1","DOI":"10.1007\/978-1-4471-3675-0"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_8_1","DOI":"10.1109\/VLSI.2008.54"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_9_1","DOI":"10.1109\/TCAD.2009.2020721"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_10_1","DOI":"10.1109\/TCAD.1983.1270035"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_11_1","DOI":"10.1109\/43.285252"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_12_1","DOI":"10.1109\/ETS.2011.47"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_13_1","DOI":"10.1007\/s10836-007-5006-6"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_14_1","DOI":"10.1109\/TCAD.2011.2149522"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_15_1","DOI":"10.1109\/TCAD.2009.2016136"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_16_1","DOI":"10.5555\/2132325.2132491"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_17_1","DOI":"10.1109\/TCAD.2012.2185931"},{"unstructured":"Y. Courant P. H\u00e9r\u00e9dia and F. Mohamed \"Nonlinear modelling for sub 65nm IC statistical analysis \" in 2nd European Workshop on CMOS Variability 2011.  Y. Courant P. H\u00e9r\u00e9dia and F. Mohamed \"Nonlinear modelling for sub 65nm IC statistical analysis \" in 2nd European Workshop on CMOS Variability 2011.","key":"e_1_3_2_1_18_1"}],"event":{"sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"],"acronym":"DAC '13","name":"DAC '13: The 50th Annual Design Automation Conference 2013","location":"Austin Texas"},"container-title":["Proceedings of the 50th Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2463209.2488822","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2463209.2488822","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:39:29Z","timestamp":1750235969000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2463209.2488822"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5,29]]},"references-count":18,"alternative-id":["10.1145\/2463209.2488822","10.1145\/2463209"],"URL":"https:\/\/doi.org\/10.1145\/2463209.2488822","relation":{},"subject":[],"published":{"date-parts":[[2013,5,29]]},"assertion":[{"value":"2013-05-29","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}