{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T03:47:26Z","timestamp":1772164046864,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":1,"publisher":"ACM","license":[{"start":{"date-parts":[[2013,6,17]],"date-time":"2013-06-17T00:00:00Z","timestamp":1371427200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2013,6,17]]},"DOI":"10.1145\/2465529.2465748","type":"proceedings-article","created":{"date-parts":[[2013,6,18]],"date-time":"2013-06-18T08:36:08Z","timestamp":1371544568000},"page":"365-366","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Parallel scaling properties from a basic block view"],"prefix":"10.1145","author":[{"given":"Melanie","family":"Kambadur","sequence":"first","affiliation":[{"name":"Columbia University, New York, NY, USA"}]},{"given":"Kui","family":"Tang","sequence":"additional","affiliation":[{"name":"Columbia University, New York, NY, USA"}]},{"given":"Joshua","family":"Lopez","sequence":"additional","affiliation":[{"name":"Columbia University, New York, NY, USA"}]},{"given":"Martha A.","family":"Kim","sequence":"additional","affiliation":[{"name":"Columbia University, New York, NY, USA"}]}],"member":"320","published-online":{"date-parts":[[2013,6,17]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"ISCA","author":"Kambadur M.","year":"2012","unstructured":"M. Kambadur , K. Tang , and M. A. Kim . Harmony: Collection and analysis of parallel block vectors . In ISCA , June 2012 . M. Kambadur, K. Tang, and M. A. Kim. Harmony: Collection and analysis of parallel block vectors. In ISCA, June 2012."}],"event":{"name":"SIGMETRICS '13: ACM SIGMETRICS \/ International Conference on Measurement and Modeling of Computer Systems","location":"Pittsburgh PA USA","acronym":"SIGMETRICS '13","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"]},"container-title":["Proceedings of the ACM SIGMETRICS\/international conference on Measurement and modeling of computer systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2465529.2465748","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2465529.2465748","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:39:16Z","timestamp":1750221556000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2465529.2465748"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6,17]]},"references-count":1,"alternative-id":["10.1145\/2465529.2465748","10.1145\/2465529"],"URL":"https:\/\/doi.org\/10.1145\/2465529.2465748","relation":{"is-identical-to":[{"id-type":"doi","id":"10.1145\/2494232.2465748","asserted-by":"object"}]},"subject":[],"published":{"date-parts":[[2013,6,17]]},"assertion":[{"value":"2013-06-17","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}