{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:15:35Z","timestamp":1763468135222,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":41,"publisher":"ACM","license":[{"start":{"date-parts":[[2013,8,26]],"date-time":"2013-08-26T00:00:00Z","timestamp":1377475200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000181","name":"Air Force Office of Scientific Research","doi-asserted-by":"publisher","award":["FA9550-09-1-0129, FA9550-10-1-0406"],"award-info":[{"award-number":["FA9550-09-1-0129, FA9550-10-1-0406"]}],"id":[{"id":"10.13039\/100000181","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000144","name":"Division of Computer and Network Systems","doi-asserted-by":"publisher","award":["CCF-1161767, CCF-0747009, CNS-0958346"],"award-info":[{"award-number":["CCF-1161767, CCF-0747009, CNS-0958346"]}],"id":[{"id":"10.13039\/100000144","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000143","name":"Division of Computing and Communication Foundations","doi-asserted-by":"publisher","award":["CCF-1161767, CCF-0747009, CNS-0958346"],"award-info":[{"award-number":["CCF-1161767, CCF-0747009, CNS-0958346"]}],"id":[{"id":"10.13039\/100000143","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2013,8,26]]},"DOI":"10.1145\/2491627.2491650","type":"proceedings-article","created":{"date-parts":[[2013,9,3]],"date-time":"2013-09-03T11:57:17Z","timestamp":1378209437000},"page":"52-61","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":22,"title":["Continuous test suite augmentation in software product lines"],"prefix":"10.1145","author":[{"given":"Zhihong","family":"Xu","sequence":"first","affiliation":[{"name":"University of Nebraska-Lincoln, Lincoln, NE"}]},{"given":"Myra B.","family":"Cohen","sequence":"additional","affiliation":[{"name":"University of Nebraska-Lincoln, Lincoln, NE"}]},{"given":"Wayne","family":"Motycka","sequence":"additional","affiliation":[{"name":"University of Nebraska-Lincoln, Lincoln, NE"}]},{"given":"Gregg","family":"Rothermel","sequence":"additional","affiliation":[{"name":"University of Nebraska-Lincoln, Lincoln, NE"}]}],"member":"320","published-online":{"date-parts":[[2013,8,26]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TAIC-PART.2006.18"},{"key":"e_1_3_2_1_2_1","first-page":"187","volume-title":"International Conference on Software Engineering","author":"Batory D.","year":"2003","unstructured":"D. Batory , J. N. Sarvela , and A. Rauschmayer . Scaling step-wise refinement . In International Conference on Software Engineering , pages 187 -- 197 , 2003 . D. Batory, J. N. Sarvela, and A. Rauschmayer. Scaling step-wise refinement. In International Conference on Software Engineering, pages 187--197, 2003."},{"key":"e_1_3_2_1_3_1","series-title":"Lecture Notes in Computer Science. 3014","doi-asserted-by":"crossref","first-page":"181","DOI":"10.1007\/978-3-540-24667-1_14","volume-title":"PLUTO: A test methodology for product families","author":"Bertolino A.","year":"2004","unstructured":"A. Bertolino and S. Gnesi . PLUTO: A test methodology for product families . In Lecture Notes in Computer Science. 3014 , pages 181 -- 197 , 2004 . A. Bertolino and S. Gnesi. PLUTO: A test methodology for product families. In Lecture Notes in Computer Science. 3014, pages 181--197, 2004."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.624306"},{"key":"e_1_3_2_1_5_1","volume-title":"Software Change Impact Analysis","author":"Bohner S.","year":"1996","unstructured":"S. Bohner and R. Arnold . Software Change Impact Analysis . IEEE Computer Society Press , Los Alamitos, CA , 1996 . S. Bohner and R. Arnold. Software Change Impact Analysis. IEEE Computer Society Press, Los Alamitos, CA, 1996."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.5555\/1885639.1885662"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1180405.1180445"},{"key":"e_1_3_2_1_8_1","volume-title":"Software Product Lines: Practices and Patterns","author":"Clements P.","year":"2001","unstructured":"P. Clements and L. M. Northrop . Software Product Lines: Practices and Patterns . Addison Wesley , 2001 . P. Clements and L. M. Northrop. Software Product Lines: Practices and Patterns. Addison Wesley, 2001."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/1147249.1147257"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/SBCARS.2010.14"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1159733.1159762"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/2382756.2382783"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/32.988497"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.14"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065036"},{"key":"e_1_3_2_1_16_1","volume-title":"June","author":"Gupta R.","year":"1996","unstructured":"R. Gupta , M. Harrold , and M. Soffa . Program slicing-based regression testing techniques. Journal of Software Testing, Verification, and Reliability, 6(2):83--111 , June 1996 . R. Gupta, M. Harrold, and M. Soffa. Program slicing-based regression testing techniques. Journal of Software Testing, Verification, and Reliability, 6(2):83--111, June 1996."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/2379776.2379787"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1145\/2362536.2362563"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/1960275.1960284"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2007.38"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-30473-6_7"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.5555\/645418.652082"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.v14:2"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1145\/1029894.1029928"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/2019136.2019143"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/1453101.1453131"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/1993498.1993558"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.5555\/1759394.1759427"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/186258.187171"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1145\/248233.248262"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2008.32"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-11266-9_10"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1145\/1081706.1081750"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-28872-2_19"},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1145\/2001420.2001422"},{"key":"e_1_3_2_1_36_1","volume-title":"Otto-von-Guericke-Univerit\u00e4t","author":"Thum T.","year":"2012","unstructured":"T. Thum , S. Apel , C. K\u00e4stner , M. Kuhlemann , I. Schaefer , and G. Saake . Analysis strategies for software product lines. Technical report, Faukul\u00e4t f\u00fcr Informatik , Otto-von-Guericke-Univerit\u00e4t , April 2012 . T. Thum, S. Apel, C. K\u00e4stner, M. Kuhlemann, I. Schaefer, and G. Saake. Analysis strategies for software product lines. Technical report, Faukul\u00e4t f\u00fcr Informatik, Otto-von-Guericke-Univerit\u00e4t, April 2012."},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2008.56"},{"key":"e_1_3_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1145\/1830483.1830734"},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2011.21"},{"key":"e_1_3_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1145\/1882291.1882330"},{"key":"e_1_3_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2009.29"}],"event":{"name":"SPLC 2013: 17th International Software Product Line Conference","sponsor":["IPSJ Information Processing Society of Japan"],"location":"Tokyo Japan","acronym":"SPLC 2013"},"container-title":["Proceedings of the 17th International Software Product Line Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2491627.2491650","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2491627.2491650","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:39:22Z","timestamp":1750235962000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2491627.2491650"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8,26]]},"references-count":41,"alternative-id":["10.1145\/2491627.2491650","10.1145\/2491627"],"URL":"https:\/\/doi.org\/10.1145\/2491627.2491650","relation":{},"subject":[],"published":{"date-parts":[[2013,8,26]]},"assertion":[{"value":"2013-08-26","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}