{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,13]],"date-time":"2025-09-13T16:34:08Z","timestamp":1757781248338,"version":"3.41.0"},"reference-count":29,"publisher":"Association for Computing Machinery (ACM)","issue":"3","license":[{"start":{"date-parts":[[2013,9,1]],"date-time":"2013-09-01T00:00:00Z","timestamp":1377993600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000144","name":"Division of Computer and Network Systems","doi-asserted-by":"publisher","award":["CNS-0844995 and CNS-1059390"],"award-info":[{"award-number":["CNS-0844995 and CNS-1059390"]}],"id":[{"id":"10.13039\/100000144","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000183","name":"Army Research Office","doi-asserted-by":"publisher","award":["57958CS"],"award-info":[{"award-number":["57958CS"]}],"id":[{"id":"10.13039\/100000183","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["J. Emerg. Technol. Comput. Syst."],"published-print":{"date-parts":[[2013,9]]},"abstract":"<jats:p>Verifying the trustworthiness of Integrated Circuits (ICs) is of utmost importance, as hardware Trojans may destroy ICs bound for critical applications. A novel methodology combining on-chip structure with external current measurements is proposed to verify whether or not an IC is Trojan free. This method considers Trojans' impact on neighboring cells and on the entire IC's power consumption, and effectively localizes the measurement of dynamic power. To achieve this, we develop a new on-chip ring oscillator network structure distributed across the entire chip and place each ring oscillator's components in different rows of a standard-cell design. By developing novel statistical data analysis, the effect of process variations on the ICs' transient power will be separated from the effect of Trojans. Simulation results using 90nm technology and experimental results on Xilinx Spartan-6 FPGAs demonstrate the efficiency of our proposed method.<\/jats:p>","DOI":"10.1145\/2491677","type":"journal-article","created":{"date-parts":[[2013,10,3]],"date-time":"2013-10-03T13:37:30Z","timestamp":1380807450000},"page":"1-20","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":24,"title":["Detection of trojans using a combined ring oscillator network and off-chip transient power analysis"],"prefix":"10.1145","volume":"9","author":[{"given":"Xuehui","family":"Zhang","sequence":"first","affiliation":[{"name":"University of Connecticut, CT"}]},{"given":"Andrew","family":"Ferraiuolo","sequence":"additional","affiliation":[{"name":"University of Connecticut, CT"}]},{"given":"Mohammad","family":"Tehranipoor","sequence":"additional","affiliation":[{"name":"University of Connecticut, CT"}]}],"member":"320","published-online":{"date-parts":[[2013,10,8]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1558607.1558671"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2007.36"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559047"},{"key":"e_1_2_1_4_1","unstructured":"Bushnell M. and Agrawal V. 2004. Types of testing. In Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits. Kluwer Academic 21--24.  Bushnell M. and Agrawal V. 2004. Types of testing. In Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits. Kluwer Academic 21--24."},{"volume-title":"Proceedings of the IEEE Region 5 Technical Conference.","author":"Di J.","key":"e_1_2_1_5_1"},{"key":"e_1_2_1_6_1","unstructured":"Digilentinc.Com. 2010. http:\/\/digilentinc.com\/Products\/Detail.cfm&quest;NavPath=2 66 828&Prod=ADEPT2.  Digilentinc.Com. 2010. http:\/\/digilentinc.com\/Products\/Detail.cfm&quest;NavPath=2 66 828&Prod=ADEPT2."},{"key":"e_1_2_1_7_1","doi-asserted-by":"crossref","unstructured":"Embabi S. H. K. 1993. Digital BiCMOS Integrated Circuit Design. Kluwer.  Embabi S. H. K. 1993. Digital BiCMOS Integrated Circuit Design. Kluwer.","DOI":"10.1007\/978-1-4615-3174-6"},{"key":"e_1_2_1_8_1","unstructured":"Iwls Org. 2005. http:\/\/iwls.org\/iwls2005\/benchmarks.html.  Iwls Org. 2005. http:\/\/iwls.org\/iwls2005\/benchmarks.html."},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/HASE.2008.37"},{"key":"e_1_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559049"},{"key":"e_1_2_1_11_1","unstructured":"Jolliffe I. T. 2002. Principal Component Analysis 2nd Ed. Springer.  Jolliffe I. T. 2002. Principal Component Analysis 2 nd Ed. Springer."},{"key":"e_1_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403703"},{"key":"e_1_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559038"},{"volume-title":"Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust (HOST'10)","author":"Narasimhan S.","key":"e_1_2_1_14_1"},{"key":"e_1_2_1_15_1","unstructured":"Office of the Under Secretary of Defense for Acquisition Technology and Logistics. 2005. Report of the defense science board task force on high performance microchip supply. Defense Science Board US Department of Defense. http:\/\/www.acq.osd.mil\/dsb\/reports\/2005-02-HPMSi Report Final.pdf.  Office of the Under Secretary of Defense for Acquisition Technology and Logistics. 2005. Report of the defense science board task force on high performance microchip supply. Defense Science Board US Department of Defense. http:\/\/www.acq.osd.mil\/dsb\/reports\/2005-02-HPMSi Report Final.pdf."},{"key":"e_1_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630091"},{"key":"e_1_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/359423.359430"},{"key":"e_1_2_1_18_1","unstructured":"Rabaey J. M. Chandrakasan A. and Nikolic B. 2003. Digital Integrated Circuits: A Design Perspective 2nd Ed. Prentice Hall.  Rabaey J. M. Chandrakasan A. and Nikolic B. 2003. Digital Integrated Circuits: A Design Perspective 2 nd Ed. Prentice Hall."},{"key":"e_1_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559037"},{"volume-title":"Proceedings of the IEEE International Conference on Computer-Aided Design. 10--13","author":"Rad R. M.","key":"e_1_2_1_20_1"},{"key":"e_1_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"e_1_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2093547"},{"key":"e_1_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"e_1_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2010.369"},{"key":"e_1_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559039"},{"key":"e_1_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.61"},{"key":"e_1_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403703"},{"volume-title":"Proceedings of the Design, Automation, and Test in Europe Conference and Exhibition (DATE'11)","author":"Zhang X.","key":"e_1_2_1_28_1"},{"key":"e_1_2_1_29_1","unstructured":"Zhao S. Roy K. and Koh C.-K. 2000. Frequency domain analysis of switching noise on power supply network. ECE Tech. rep. 23. http:\/\/docs.lib.purdue.edu\/cgi\/viewcontent.cgi&quest;article=1023&context=ecetr.  Zhao S. Roy K. and Koh C.-K. 2000. Frequency domain analysis of switching noise on power supply network. ECE Tech. rep. 23. http:\/\/docs.lib.purdue.edu\/cgi\/viewcontent.cgi&quest;article=1023&context=ecetr."}],"container-title":["ACM Journal on Emerging Technologies in Computing Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2491677","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2491677","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:39:22Z","timestamp":1750235962000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2491677"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":29,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2013,9]]}},"alternative-id":["10.1145\/2491677"],"URL":"https:\/\/doi.org\/10.1145\/2491677","relation":{},"ISSN":["1550-4832","1550-4840"],"issn-type":[{"type":"print","value":"1550-4832"},{"type":"electronic","value":"1550-4840"}],"subject":[],"published":{"date-parts":[[2013,9]]},"assertion":[{"value":"2011-10-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2012-05-01","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2013-10-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}