{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T22:50:49Z","timestamp":1768517449309,"version":"3.49.0"},"reference-count":41,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2014,1,1]],"date-time":"2014-01-01T00:00:00Z","timestamp":1388534400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100001665","name":"Agence Nationale de la Recherche","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["J. Emerg. Technol. Comput. Syst."],"published-print":{"date-parts":[[2014,1]]},"abstract":"<jats:p>Scaling beyond CMOS require a new combination of computing paradigm and new devices. In this context, memristor are often considered as best candidate to implement efficiently synapses in hardware neural networks. In this article, we analyze the impact of memristor parameter variability. We build an analytical model of the global reliability at the crossbar level. It is based on a supervised learning method with multilayer and redundancy extensions. Comparisons with Monte Carlo simulations of small neural network validate our analytical model. It can be used to extrapolate directly the reliability of large-scale neural system. Our extrapolations show that high defect rate and important parameter variability can be handle efficiency with a moderate amount of redundancy.<\/jats:p>","DOI":"10.1145\/2539123","type":"journal-article","created":{"date-parts":[[2014,1,14]],"date-time":"2014-01-14T13:39:57Z","timestamp":1389706797000},"page":"1-20","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":25,"title":["Robust learning approach for neuro-inspired nanoscale crossbar architecture"],"prefix":"10.1145","volume":"10","author":[{"given":"Djaafar","family":"Chabi","sequence":"first","affiliation":[{"name":"IEF, Univ. Paris-Sud, Orsay, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Damien","family":"Querlioz","sequence":"additional","affiliation":[{"name":"IEF, Univ. Paris-Sud, Orsay, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weisheng","family":"Zhao","sequence":"additional","affiliation":[{"name":"IEF, Univ. Paris-Sud, Orsay, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacques-Olivier","family":"Klein","sequence":"additional","affiliation":[{"name":"IEF, Univ. Paris-Sud, Orsay, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2014,1,13]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200902170"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0806642106"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature08940"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH.2011.5941495"},{"key":"e_1_2_1_5_1","volume-title":"Proceedings of the 5th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS). 23--25","author":"Chabi D.","unstructured":"Chabi D. , and Klein J. O . 2010. Hight fault tolerance in neural crossbar . In Proceedings of the 5th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS). 23--25 . Chabi D., and Klein J. O. 2010. Hight fault tolerance in neural crossbar. In Proceedings of the 5th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS). 23--25."},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/14\/4\/311"},{"key":"e_1_2_1_7_1","first-page":"505","volume-title":"Proceedings of the 4th IEEE Conference on Nanotechnology.","author":"Choi Y.","unstructured":"Choi , Y. , Lee , M. , and Kim , Y . 2004. A two-level redundancy scheme for enhancing scalability of molecular-based crossbar memories . In Proceedings of the 4th IEEE Conference on Nanotechnology. pp. 505 -- 508 . Choi, Y., Lee, M., and Kim, Y. 2004. A two-level redundancy scheme for enhancing scalability of molecular-based crossbar memories. In Proceedings of the 4th IEEE Conference on Nanotechnology. pp. 505--508."},{"key":"e_1_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.114851"},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1976.10092"},{"key":"e_1_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2005.11.013"},{"key":"e_1_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1049\/el:20080442"},{"key":"e_1_2_1_12_1","volume-title":"et al","author":"Heath J. R.","year":"1998","unstructured":"Heath , J. R. et al . 1998 . A defect-tolerant computer architecture: Opportunities in nanotechnology. Science 280, 5370, 1716--1721. Heath, J. R. et al. 1998. A defect-tolerant computer architecture: Opportunities in nanotechnology. Science 280, 5370, 1716--1721."},{"key":"e_1_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1066192"},{"key":"e_1_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl904092h"},{"key":"e_1_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl8037689"},{"key":"e_1_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1993.5.3.473"},{"key":"e_1_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1002\/smll.200500120"},{"key":"e_1_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/16\/6\/043"},{"key":"e_1_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1002\/cta.v35:3"},{"key":"e_1_2_1_20_1","first-page":"2172","article-title":"Design of neuro-inspired learning circuit using OG-CNTFET modelling and technology","author":"Liao S. Y.","year":"2011","unstructured":"Liao S. Y. 2011 . Design of neuro-inspired learning circuit using OG-CNTFET modelling and technology , IEEE Trans. CAS I , 58, 2172 -- 2181 . Liao S. Y. et al. 2011. Design of neuro-inspired learning circuit using OG-CNTFET modelling and technology, IEEE Trans. CAS I, 58, 2172--2181.","journal-title":"IEEE Trans. CAS"},{"key":"e_1_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2062187"},{"key":"e_1_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2748"},{"key":"e_1_2_1_23_1","first-page":"292","volume-title":"Perceptrons: An Introduction to Computation Geometry","author":"Minsky L. M.","year":"1988","unstructured":"Minsky , L. M. and Papert , A. S . 1988 . Perceptrons: An Introduction to Computation Geometry . MIT Press , pp. 292 . Minsky, L. M. and Papert, A. S. 1988. Perceptrons: An Introduction to Computation Geometry. MIT Press, pp. 292."},{"key":"e_1_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/13\/3\/323"},{"key":"e_1_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH.2011.5941497"},{"key":"e_1_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat3510"},{"key":"e_1_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/25\/254023"},{"key":"e_1_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/18\/36\/365202"},{"key":"e_1_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/16\/6\/045"},{"key":"e_1_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"e_1_2_1_31_1","volume-title":"Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability","author":"Tahoori M. B.","unstructured":"Tahoori , M. B. 2008. Defect tolerance in crossbar array nano-architectures . In Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability . M. Tehranipoor, ed., Springer . 121--151. Tahoori, M. B. 2008. Defect tolerance in crossbar array nano-architectures. In Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability. M. Tehranipoor, ed., Springer. 121--151."},{"key":"e_1_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1986.1085953"},{"key":"e_1_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2009.03.132"},{"key":"e_1_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.21236\/AD0241531"},{"key":"e_1_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900822"},{"key":"e_1_2_1_36_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3693392"},{"key":"e_1_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3564883"},{"key":"e_1_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1021\/nl901874j"},{"key":"e_1_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/21\/17\/175202"},{"key":"e_1_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2012.2206051"},{"key":"e_1_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1090899"}],"container-title":["ACM Journal on Emerging Technologies in Computing Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2539123","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2539123","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T07:34:50Z","timestamp":1750232090000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2539123"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,1]]},"references-count":41,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2014,1]]}},"alternative-id":["10.1145\/2539123"],"URL":"https:\/\/doi.org\/10.1145\/2539123","relation":{},"ISSN":["1550-4832","1550-4840"],"issn-type":[{"value":"1550-4832","type":"print"},{"value":"1550-4840","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,1]]},"assertion":[{"value":"2012-03-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2012-12-01","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2014-01-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}