{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:20:52Z","timestamp":1750306852845,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":61,"publisher":"ACM","license":[{"start":{"date-parts":[[2013,12,7]],"date-time":"2013-12-07T00:00:00Z","timestamp":1386374400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000144","name":"Division of Computer and Network Systems","doi-asserted-by":"publisher","award":["CNS-1117782"],"award-info":[{"award-number":["CNS-1117782"]}],"id":[{"id":"10.13039\/100000144","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2013,12,7]]},"DOI":"10.1145\/2540708.2540720","type":"proceedings-article","created":{"date-parts":[[2013,12,17]],"date-time":"2013-12-17T13:36:21Z","timestamp":1387287381000},"page":"123-135","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":6,"title":["Virtually-aged sampling DMR"],"prefix":"10.1145","author":[{"given":"Raghuraman","family":"Balasubramanian","sequence":"first","affiliation":[{"name":"University of Wisconsin-Madison"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Karthikeyan","family":"Sankaralingam","sequence":"additional","affiliation":[{"name":"University of Wisconsin-Madison"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2013,12,7]]},"reference":[{"volume-title":"Leakage in Nanometer CMOS Technologies","year":"2006","key":"e_1_3_2_1_1_1","unstructured":"Body biasing. In S. Narendra and A. Chandrakasan, editors, Leakage in Nanometer CMOS Technologies . Springer US , 2006 . Body biasing. In S. Narendra and A. Chandrakasan, editors, Leakage in Nanometer CMOS Technologies. Springer US, 2006."},{"key":"e_1_3_2_1_2_1","volume-title":"International Roadmap for Semiconductors","author":"Semiconductor Industry Association (SIA)","year":"2009","unstructured":"Semiconductor Industry Association (SIA) , Design , International Roadmap for Semiconductors , 2009 edition. Semiconductor Industry Association (SIA), Design, International Roadmap for Semiconductors, 2009 edition."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1816024"},{"volume-title":"MICRO '99","author":"Austin T. M.","key":"e_1_3_2_1_5_1","unstructured":"T. M. Austin . Diva : A reliable substrate for deep submicron microarchitecture design . In MICRO '99 . T. M. Austin. Diva: A reliable substrate for deep submicron microarchitecture design. In MICRO '99."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.37"},{"volume-title":"DATE '12","author":"Boon-Chan T.","key":"e_1_3_2_1_7_1","unstructured":"T. Boon-Chan , J. Sartori , P. Gupta , and R. Kumar . On the efficacy of nbti mitigation techniques . In DATE '12 . T. Boon-Chan, J. Sartori, P. Gupta, and R. Kumar. On the efficacy of nbti mitigation techniques. In DATE '12."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629915"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.8"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1594233.1594264"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1594233.1594244"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.39"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1232255"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/1165573.1165645"},{"volume-title":"MICRO '03","key":"e_1_3_2_1_16_1","unstructured":"Ernst : A low-power pipeline based on circuit-level timing speculation . In MICRO '03 . Ernst et al. Razor: A low-power pipeline based on circuit-level timing speculation. In MICRO '03."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/1736020.1736063"},{"volume-title":"DATE '11","author":"Gherman V.","key":"e_1_3_2_1_18_1","unstructured":"V. Gherman , J. Massas , S. Evain , S. Chevobbe , and Y. Bonhomme . Error prediction based on concurrent self-test and reduced slack time . In DATE '11 . V. Gherman, J. Massas, S. Evain, S. Chevobbe, and Y. Bonhomme. Error prediction based on concurrent self-test and reduced slack time. In DATE '11."},{"volume-title":"DATE '11","author":"Gizopoulos D.","key":"e_1_3_2_1_19_1","unstructured":"D. Gizopoulos , M. Psarakis , S. V. Adve , P. Ramachandran , S. K. S. Hari , D. Sorin , A. Meixner , A. Biswas , and X. Vera . Architectures for online error detection and recovery in multicore processors . In DATE '11 . D. Gizopoulos, M. Psarakis, S. V. Adve, P. Ramachandran, S. K. S. Hari, D. Sorin, A. Meixner, A. Biswas, and X. Vera. Architectures for online error detection and recovery in multicore processors. In DATE '11."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/859618.859631"},{"volume-title":"HPCA '09","author":"Greskamp B.","key":"e_1_3_2_1_21_1","unstructured":"B. Greskamp , L. Wan , U. R. Karpuzcu , J. J. Cook , J. Torrellas , D. Chen , and C. Zilles . Blueshift: Designing processors for timing speculation from the ground up . In HPCA '09 . B. Greskamp, L. Wan, U. R. Karpuzcu, J. J. Cook, J. Torrellas, D. Chen, and C. Zilles. Blueshift: Designing processors for timing speculation from the ground up. In HPCA '09."},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771786"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251276"},{"volume-title":"IEDM '02","author":"Hosoi T.","key":"e_1_3_2_1_24_1","unstructured":"T. Hosoi , P. Lo Re , Y. Kamakura , and K. Taniguchi . A new model of time evolution of gate leakage current after soft breakdown in ultra-thin gate oxides . In IEDM '02 . T. Hosoi, P. Lo Re, Y. Kamakura, and K. Taniguchi. A new model of time evolution of gate leakage current after soft breakdown in ultra-thin gate oxides. In IEDM '02."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669169"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669169"},{"volume-title":"ASP-DAC '09","author":"Kumar S. V.","key":"e_1_3_2_1_27_1","unstructured":"S. V. Kumar , C. H. Kim , and S. S. Sapatnekar . Adaptive techniques for overcoming performance degradation due to aging in digital circuits . In ASP-DAC '09 . S. V. Kumar, C. H. Kim, and S. S. Sapatnekar. Adaptive techniques for overcoming performance degradation due to aging in digital circuits. In ASP-DAC '09."},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.100"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629926"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2007.346196"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/1346281.1346315"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2003.12.010"},{"volume-title":"VTS '04","author":"McCluskey E. J.","key":"e_1_3_2_1_33_1","unstructured":"E. J. McCluskey , A. Al-Yamani , J. C.-M. Li , C.-W. Tseng , E. Volkerink , F.-F. Ferhani , E. Li , and S. Mitra . Elf-murphy data on defects and test sets . VTS '04 . E. J. McCluskey, A. Al-Yamani, J. C.-M. Li, C.-W. Tseng, E. Volkerink, F.-F. Ferhani, E. Li, and S. Mitra. Elf-murphy data on defects and test sets. VTS '04."},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.8"},{"key":"e_1_3_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1145\/545214.545227"},{"volume-title":"HPCA '06","author":"Nakano J.","key":"e_1_3_2_1_36_1","unstructured":"J. Nakano , P. Montesinos , K. Gharachorloo , and J. Torrellas . Revivei\/o: efficient handling of i\/o in highly-available rollback-recovery servers . In HPCA '06 . J. Nakano, P. Montesinos, K. Gharachorloo, and J. Torrellas. Revivei\/o: efficient handling of i\/o in highly-available rollback-recovery servers. In HPCA '06."},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1145\/2024723.2000089"},{"key":"e_1_3_2_1_38_1","unstructured":"OpenRISC http:\/\/opencores.org\/or1k\/.  OpenRISC http:\/\/opencores.org\/or1k\/."},{"volume-title":"VTS '12","author":"Park J.","key":"e_1_3_2_1_39_1","unstructured":"J. Park and J. Abraham . An aging-aware flip-flop design based on accurate, run-time failure prediction . In VTS '12 . J. Park and J. Abraham. An aging-aware flip-flop design based on accurate, run-time failure prediction. In VTS '12."},{"volume-title":"ICCAD '92","author":"Pomeranz I.","key":"e_1_3_2_1_40_1","unstructured":"I. Pomeranz and S. M. Reddy . An efficient non-enumerative method to estimate path delay fault coverage . In ICCAD '92 . I. Pomeranz and S. M. Reddy. An efficient non-enumerative method to estimate path delay fault coverage. In ICCAD '92."},{"key":"e_1_3_2_1_41_1","doi-asserted-by":"publisher","DOI":"10.1145\/1555815.1555769"},{"key":"e_1_3_2_1_42_1","doi-asserted-by":"publisher","DOI":"10.1145\/545214.545228"},{"volume-title":"ITC '01","author":"Rearick J.","key":"e_1_3_2_1_43_1","unstructured":"J. Rearick . Too much delay fault coverage is a bad thing . In ITC '01 . J. Rearick. Too much delay fault coverage is a bad thing. In ITC '01."},{"key":"e_1_3_2_1_44_1","doi-asserted-by":"publisher","DOI":"10.1145\/1993498.1993518"},{"key":"e_1_3_2_1_45_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.006"},{"key":"e_1_3_2_1_46_1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2007.23"},{"key":"e_1_3_2_1_47_1","doi-asserted-by":"publisher","DOI":"10.1145\/1168857.1168868"},{"key":"e_1_3_2_1_49_1","volume-title":"Proc. of Workshop on SELSE","author":"Smolens J. C.","year":"2007","unstructured":"J. C. Smolens , B. T. Gold , J. C. Hoe , B. Falsafi , and K. Mai . Detecting emerging wearout faults . In Proc. of Workshop on SELSE , 2007 . J. C. Smolens, B. T. Gold, J. C. Hoe, B. Falsafi, and K. Mai. Detecting emerging wearout faults. In Proc. of Workshop on SELSE, 2007."},{"key":"e_1_3_2_1_50_1","doi-asserted-by":"publisher","DOI":"10.1145\/545214.545229"},{"key":"e_1_3_2_1_51_1","volume-title":"IBM","author":"Srinivasan J.","year":"2003","unstructured":"J. Srinivasan , S. Adve , P. Bose , J. Rivers , and C. Hu . Ramp: A model for reliability aware microprocessor design . IBM , Poughkeepsie, NY , 2003 . J. Srinivasan, S. Adve, P. Bose, J. Rivers, and C. Hu. Ramp: A model for reliability aware microprocessor design. IBM, Poughkeepsie, NY, 2003."},{"key":"e_1_3_2_1_52_1","doi-asserted-by":"publisher","DOI":"10.5555\/1050987"},{"key":"e_1_3_2_1_53_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.145"},{"key":"e_1_3_2_1_54_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.27"},{"key":"e_1_3_2_1_55_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771785"},{"key":"e_1_3_2_1_56_1","first-page":"112","volume-title":"Symposium on VLSI Circuits","year":"2009","unstructured":"Tschanz Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance . In Symposium on VLSI Circuits , pages 112 -- 113 . IEEE, 2009 . Tschanz et al. Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance. In Symposium on VLSI Circuits, pages 112--113. IEEE, 2009."},{"volume-title":"ISSCC '02","key":"e_1_3_2_1_57_1","unstructured":"Tschanz Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage , ISSCC '02 . Tschanz et al. Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage, ISSCC '02."},{"key":"e_1_3_2_1_58_1","volume-title":"Mos device aging analysis with hspice and customsim. Technical report","author":"Tudor B.","year":"2012","unstructured":"B. Tudor , J. Wang , W. Liu , and H. Elhak . Mos device aging analysis with hspice and customsim. Technical report , 2012 . B. Tudor, J. Wang, W. Liu, and H. Elhak. Mos device aging analysis with hspice and customsim. Technical report, 2012."},{"key":"e_1_3_2_1_59_1","doi-asserted-by":"publisher","DOI":"10.1145\/2366231.2337198"},{"key":"e_1_3_2_1_60_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401593"},{"key":"e_1_3_2_1_61_1","doi-asserted-by":"publisher","DOI":"10.1145\/1508244.1508265"},{"volume-title":"DSN '12","author":"Zandian B.","key":"e_1_3_2_1_62_1","unstructured":"B. Zandian , W. Dweik , S. H. Kang , T. Punihaole , and M. Annavaram . Wearmon: Reliability monitoring using adaptive critical path testing . In DSN '12 . B. Zandian, W. Dweik, S. H. Kang, T. Punihaole, and M. Annavaram. Wearmon: Reliability monitoring using adaptive critical path testing. In DSN '12."}],"event":{"name":"MICRO-46: The 46th Annual IEEE\/ACM International Symposium on Microarchitecture","sponsor":["SIGMICRO ACM Special Interest Group on Microarchitectural Research and Processing","IEEE CS"],"location":"Davis California","acronym":"MICRO-46"},"container-title":["Proceedings of the 46th Annual IEEE\/ACM International Symposium on Microarchitecture"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2540708.2540720","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2540708.2540720","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:10:22Z","timestamp":1750234222000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2540708.2540720"}},"subtitle":["unifying circuit failure prediction and circuit failure detection"],"short-title":[],"issued":{"date-parts":[[2013,12,7]]},"references-count":61,"alternative-id":["10.1145\/2540708.2540720","10.1145\/2540708"],"URL":"https:\/\/doi.org\/10.1145\/2540708.2540720","relation":{},"subject":[],"published":{"date-parts":[[2013,12,7]]},"assertion":[{"value":"2013-12-07","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}