{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T11:25:27Z","timestamp":1784028327164,"version":"3.55.0"},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,3,24]],"date-time":"2014-03-24T00:00:00Z","timestamp":1395619200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,3,24]]},"DOI":"10.1145\/2554850.2554942","type":"proceedings-article","created":{"date-parts":[[2014,7,22]],"date-time":"2014-07-22T15:08:30Z","timestamp":1406041710000},"page":"420-427","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":30,"title":["A model-based approach to test automation for context-aware mobile applications"],"prefix":"10.1145","author":[{"given":"Tobias","family":"Griebe","sequence":"first","affiliation":[{"name":"University of Duisburg-Essen, Essen, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Volker","family":"Gruhn","sequence":"additional","affiliation":[{"name":"University of Duisburg-Essen, Essen, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2014,3,24]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.5555\/647985.743843"},{"key":"e_1_3_2_1_2_1","volume-title":"Model Based Testing. In Software Quality Week Conference","author":"Apfelbaum L.","year":"1997","unstructured":"L. Apfelbaum and J. Doyle . Model Based Testing. In Software Quality Week Conference , 1997 . L. Apfelbaum and J. Doyle. Model Based Testing. In Software Quality Week Conference, 1997."},{"key":"e_1_3_2_1_3_1","volume-title":"Clay. Model Driven Testing - Using the UML Testing Profile","year":"2008","unstructured":"Baker , Paul and Ru Dai, Zhen and Grabowski, Jens and Haugen, Oystein and Schieferdecker, Ina and Williams , Clay. Model Driven Testing - Using the UML Testing Profile . Springer--Verlag Berlin Heidelberg , 2008 . Baker, Paul and Ru Dai, Zhen and Grabowski, Jens and Haugen, Oystein and Schieferdecker, Ina and Williams, Clay. Model Driven Testing - Using the UML Testing Profile. Springer--Verlag Berlin Heidelberg, 2008."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1543137.1543161"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.5555\/1088934"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1230040.1230097"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/98.626984"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/634067.634210"},{"key":"e_1_3_2_1_9_1","volume-title":"Towards Model-Driven Testing. Electr. Notes Theor. Comput. Sci., 82(6)","author":"Heckel R.","year":"2003","unstructured":"R. Heckel and M. Lohmann . Towards Model-Driven Testing. Electr. Notes Theor. Comput. Sci., 82(6) , 2003 . R. Heckel and M. Lohmann. Towards Model-Driven Testing. Electr. Notes Theor. Comput. Sci., 82(6), 2003."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/ECBS.2010.14"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC.2006.1706785"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/SNPD.2007.525"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2004.55"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/1138929.1138931"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.5555\/1317530.1317806"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1265525"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/WMCSA.1994.16"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1145\/1555321.1555325"}],"event":{"name":"SAC 2014: Symposium on Applied Computing","location":"Gyeongju Republic of Korea","acronym":"SAC 2014","sponsor":["SIGAPP ACM Special Interest Group on Applied Computing"]},"container-title":["Proceedings of the 29th Annual ACM Symposium on Applied Computing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2554850.2554942","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2554850.2554942","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T08:18:17Z","timestamp":1750234697000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2554850.2554942"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,3,24]]},"references-count":18,"alternative-id":["10.1145\/2554850.2554942","10.1145\/2554850"],"URL":"https:\/\/doi.org\/10.1145\/2554850.2554942","relation":{},"subject":[],"published":{"date-parts":[[2014,3,24]]},"assertion":[{"value":"2014-03-24","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}