{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:18:06Z","timestamp":1750306686287,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":14,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1145\/2593069.2593101","type":"proceedings-article","created":{"date-parts":[[2014,5,27]],"date-time":"2014-05-27T12:57:10Z","timestamp":1401195430000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":12,"title":["BTI-Induced Aging under Random Stress Waveforms"],"prefix":"10.1145","author":[{"given":"Ketul","family":"Sutaria","sequence":"first","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Athul","family":"Ramkumar","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rongjun","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Renju","family":"Rajveev","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yao","family":"Ma","sequence":"additional","affiliation":[{"name":"College of Physical Science and Technology, Sichuan University, Chengdu, China 610064"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2014,6]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.323909"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.012"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"e_1_3_2_1_5_1","first-page":"729","article-title":"Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise","author":"Grasser T.","year":"2009","journal-title":"IEDM"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2157828"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"crossref","unstructured":"J. Velamala K. Sutaria T. Sato and Y. Cao \"Aging statistics based on trapping\/detrapping: Silicon evidence modeling and long-term prediction \" IRPS 2F.2.1--2F.2.5 2012. J. Velamala K. Sutaria T. Sato and Y. Cao \"Aging statistics based on trapping\/detrapping: Silicon evidence modeling and long-term prediction \" IRPS 2F.2.1--2F.2.5 2012.","DOI":"10.1109\/IRPS.2012.6241795"},{"issue":"7","key":"e_1_3_2_1_8_1","first-page":"22","article-title":"Circuit reliability simulation using TMI2","volume":"1","author":"Jeng M.","year":"2013","journal-title":"CICC"},{"issue":"1114","key":"e_1_3_2_1_9_1","first-page":"2","article-title":"NBTI lifetime prediction in SiON p-MOSFETs by H\/H2 Reaction-Diffusion(RD) and dispersive hole trapping model","volume":"1105","author":"Deora S.","year":"2010","journal-title":"IRPS"},{"issue":"4","key":"e_1_3_2_1_10_1","first-page":"509","article-title":"Compact modeling and simulation of circuit relaibility for 65nm CMOS technology","volume":"7","author":"Wang W.","year":"2007","journal-title":"TDMR"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds:20070225"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2281986"},{"key":"e_1_3_2_1_13_1","first-page":"15","article-title":"An analysis Of the benefits of NBTI recovery under circuit operating conditions","author":"Kufluoglu H.","year":"2012","journal-title":"IRPS"},{"key":"e_1_3_2_1_14_1","first-page":"143","article-title":"A device array for efficient bias temperature instability measurements","author":"Sato T.","year":"2011","journal-title":"ESSDERC"}],"event":{"name":"DAC '14: The 51st Annual Design Automation Conference 2014","sponsor":["EDAC Electronic Design Automation Consortium","SIGBED ACM Special Interest Group on Embedded Systems","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"],"location":"San Francisco CA USA","acronym":"DAC '14"},"container-title":["Proceedings of the 51st Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2593101","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2593069.2593101","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T07:01:23Z","timestamp":1750230083000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2593101"}},"subtitle":["Modeling, Simulation and Silicon Validation"],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":14,"alternative-id":["10.1145\/2593069.2593101","10.1145\/2593069"],"URL":"https:\/\/doi.org\/10.1145\/2593069.2593101","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]},"assertion":[{"value":"2014-06-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}