{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:18:07Z","timestamp":1750306687302,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":13,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1145\/2593069.2593154","type":"proceedings-article","created":{"date-parts":[[2014,5,27]],"date-time":"2014-05-27T12:57:10Z","timestamp":1401195430000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Leveraging pre-silicon data to diagnose out-of-specification failures in mixed-signal circuits"],"prefix":"10.1145","author":[{"given":"Parijat","family":"Mukherjee","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2014,6]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146921"},{"key":"e_1_3_2_1_2_1","first-page":"464","volume-title":"Yield-aware analog integrated circuit optimization using geostatistics motivated performance modeling,\" in ICCAD '07","author":"Yu G.","year":"2007","unstructured":"G. Yu and P. Li , \" Yield-aware analog integrated circuit optimization using geostatistics motivated performance modeling,\" in ICCAD '07 , pp. 464 -- 469 , IEEE , 2007 . G. Yu and P. Li, \"Yield-aware analog integrated circuit optimization using geostatistics motivated performance modeling,\" in ICCAD '07, pp. 464--469, IEEE, 2007."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/54.124515"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"crossref","unstructured":"M. Tian and C.-J. Shi \"Worst case tolerance analysis of linear analog circuits using sensitivity bands \" TCAS '00 vol. 47 no. 8 pp. 1138--1145 2000.  M. Tian and C.-J. Shi \"Worst case tolerance analysis of linear analog circuits using sensitivity bands \" TCAS '00 vol. 47 no. 8 pp. 1138--1145 2000.","DOI":"10.1109\/81.873869"},{"key":"e_1_3_2_1_5_1","volume-title":"Computer methods for circuit analysis and design","author":"Vlach J.","year":"1983","unstructured":"J. Vlach and K. Singhal , Computer methods for circuit analysis and design . Springer , 1983 . J. Vlach and K. Singhal, Computer methods for circuit analysis and design. Springer, 1983."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1002\/9783527626212"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593091"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429420"},{"key":"e_1_3_2_1_10_1","volume-title":"programs for machine learning","author":"Quinlan J. R.","year":"1993","unstructured":"J. R. Quinlan , C4.5 : programs for machine learning . San Francisco, CA, USA : Morgan Kaufmann Publishers Inc ., 1993 . J. R. Quinlan, C4.5: programs for machine learning. San Francisco, CA, USA: Morgan Kaufmann Publishers Inc., 1993."},{"key":"e_1_3_2_1_11_1","volume-title":"of the 12th International Conference on Machine Learning","author":"Cohen W. W.","year":"1994","unstructured":"W. W. Cohen , \"Fast effective rule induction,\" in Proc. of the 12th International Conference on Machine Learning , 1994 . W. W. Cohen, \"Fast effective rule induction,\" in Proc. of the 12th International Conference on Machine Learning, 1994."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1013203451"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.5555\/1622826.1622827"}],"event":{"name":"DAC '14: The 51st Annual Design Automation Conference 2014","sponsor":["EDAC Electronic Design Automation Consortium","SIGBED ACM Special Interest Group on Embedded Systems","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"],"location":"San Francisco CA USA","acronym":"DAC '14"},"container-title":["Proceedings of the 51st Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2593154","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2593069.2593154","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T07:01:23Z","timestamp":1750230083000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2593154"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":13,"alternative-id":["10.1145\/2593069.2593154","10.1145\/2593069"],"URL":"https:\/\/doi.org\/10.1145\/2593069.2593154","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]},"assertion":[{"value":"2014-06-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}