{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:16:34Z","timestamp":1763468194678,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":28,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1145\/2593069.2593172","type":"proceedings-article","created":{"date-parts":[[2014,5,27]],"date-time":"2014-05-27T12:57:10Z","timestamp":1401195430000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":16,"title":["On Trading Wear-leveling with Heal-leveling"],"prefix":"10.1145","author":[{"given":"Yu-Ming","family":"Chang","sequence":"first","affiliation":[{"name":"Macronix International Co., Ltd., Emerging System Lab., Hsinchu, Taiwan, R.O.C. and Department of Computer Science and Information Engineering National Taiwan University Taipei, Taiwan, R.O.C."}]},{"given":"Yuan-Hao","family":"Chang","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Academia Sinica Taipei, Taiwan, R.O.C."}]},{"given":"Jian-Jia","family":"Chen","sequence":"additional","affiliation":[{"name":"TU Dortmund University, Germany"}]},{"given":"Tei-Wei","family":"Kuo","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Information Engineering National Taiwan University Taipei, Taiwan, R.O.C. and Research Center for Information Technology Innovation, Academia Sinica Taipei, Taiwan, R.O.C."}]},{"given":"Hsiang-Pang","family":"Li","sequence":"additional","affiliation":[{"name":"Macronix International Co., Ltd., Emerging System Lab., Hsinchu, Taiwan, R.O.C."}]},{"given":"Hang-Ting","family":"Lue","sequence":"additional","affiliation":[{"name":"Macronix International Co., Ltd., Emerging Central Lab., Hsinchu, Taiwan, R.O.C."}]}],"member":"320","published-online":{"date-parts":[[2014,6]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"Flash File System. US Patent 540 448.  Flash File System. US Patent 540 448."},{"issue":"4","key":"e_1_3_2_1_2_1","first-page":"489","volume":"91","author":"Bez R.","year":"2003","unstructured":"R. Bez , E. Camerlenghi , A. Modelli , and A. Visconti . Introduction to flash memory. Proceedings of the IEEE , 91 ( 4 ): 489 -- 502 , 2003 . R. Bez, E. Camerlenghi, A. Modelli, and A. Visconti. Introduction to flash memory. Proceedings of the IEEE, 91(4):489--502, 2003.","journal-title":"Introduction to flash memory. Proceedings of the IEEE"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1244002.1244248"},{"volume-title":"RTAS '02","author":"Chang L.-P.","key":"e_1_3_2_1_4_1","unstructured":"L.-P. Chang and T.-W. Kuo . An adaptive striping architecture for flash memory storage systems of embedded systems . RTAS '02 . L.-P. Chang and T.-W. Kuo. An adaptive striping architecture for flash memory storage systems of embedded systems. RTAS '02."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1879021.1879045"},{"volume-title":"Dheating: Dispersed heating repair for self-healing nand flash memory. CODES+ISSS '13","author":"Chen R.","key":"e_1_3_2_1_6_1","unstructured":"R. Chen , Y. Wang , and Z. Shao . Dheating: Dispersed heating repair for self-healing nand flash memory. CODES+ISSS '13 . R. Chen, Y. Wang, and Z. Shao. Dheating: Dispersed heating repair for self-healing nand flash memory. CODES+ISSS '13."},{"volume-title":"SiPS '08","author":"B.","key":"e_1_3_2_1_7_1","unstructured":"B. chen et al. Error correction for multi-level nand flash memory using reed-solomon codes . SiPS '08 . B. chen et al. Error correction for multi-level nand flash memory using reed-solomon codes. SiPS '08."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(99)00059-X"},{"volume-title":"TCSI '11","author":"Dong G.","key":"e_1_3_2_1_9_1","unstructured":"G. Dong , N. Xie , and T. Zhang . On the use of soft-decision error-correction codes in nand flash memory . TCSI '11 . G. Dong, N. Xie, and T. Zhang. On the use of soft-decision error-correction codes in nand flash memory. TCSI '11."},{"volume-title":"IEDM '12","author":"H.-T.","key":"e_1_3_2_1_10_1","unstructured":"H.-T. L. et al. Radically extending the cycling endurance of flash memory (to > 100m cycles) by using built-in thermal annealing to self-heal the stress-induced damage . IEDM '12 . H.-T. L. et al. Radically extending the cycling endurance of flash memory (to > 100m cycles) by using built-in thermal annealing to self-heal the stress-induced damage. IEDM '12."},{"volume-title":"IRPS '02","author":"I.","key":"e_1_3_2_1_11_1","unstructured":"I. D. et al. Localization of silc in flash memories after program\/erase cycling . IRPS '02 . I. D. et al. Localization of silc in flash memories after program\/erase cycling. IRPS '02."},{"key":"e_1_3_2_1_12_1","author":"J.-D. L.","year":"2004","unstructured":"J.-D. L. et al. Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells. IEEE Trans. Device Mater. Rel. 2004 . J.-D. L. et al. Effects of interface trap generation and annihilation on the data retention characteristics of flash memory cells. IEEE Trans. Device Mater. Rel. 2004.","journal-title":"Trans. Device Mater. Rel."},{"volume-title":"TCE '02","author":"J.","key":"e_1_3_2_1_13_1","unstructured":"J. K. et al. A space-efficient flash translation layer for compactflash systems . TCE '02 . J. K. et al. A space-efficient flash translation layer for compactflash systems. TCE '02."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/1138041.1138043"},{"volume-title":"IRPS '10","author":"M.","key":"e_1_3_2_1_15_1","unstructured":"M. C. et al. Investigation of the threshold voltage instability after distributed cycling in nanoscale nand flash memory arrays . IRPS '10 . M. C. et al. Investigation of the threshold voltage instability after distributed cycling in nanoscale nand flash memory arrays. IRPS '10."},{"volume-title":"MSST '11","author":"M.","key":"e_1_3_2_1_16_1","unstructured":"M. M. et al. Rejuvenator: A static wear leveling algorithm for nand flash memory with minimized overhead . MSST '11 . M. M. et al. Rejuvenator: A static wear leveling algorithm for nand flash memory with minimized overhead. MSST '11."},{"volume-title":"FMS'12","author":"M.","key":"e_1_3_2_1_17_1","unstructured":"M. V. et al. refresh ssds: Enabling high endurance, low cost flash in datacenters. Technical report , FMS'12 . M. V. et al. refresh ssds: Enabling high endurance, low cost flash in datacenters. Technical report, FMS'12."},{"key":"e_1_3_2_1_18_1","author":"N. M.","year":"2004","unstructured":"N. M. et al. Flash eeprom threshold instabilities due to charge trapping during program\/erase cycling. IEEE Trans. Device Mater. Rel. 2004 . N. M. et al. Flash eeprom threshold instabilities due to charge trapping during program\/erase cycling. IEEE Trans. Device Mater. Rel. 2004.","journal-title":"Trans. Device Mater. Rel."},{"volume-title":"IRPS '06","author":"N.","key":"e_1_3_2_1_19_1","unstructured":"N. M. et al. Recovery effects in the distributed cycling of flash memories . IRPS '06 . N. M. et al. Recovery effects in the distributed cycling of flash memories. IRPS '06."},{"volume-title":"HotStorage '11","author":"Q.","key":"e_1_3_2_1_20_1","unstructured":"Q. W. et al. Exploiting heat-accelerated flash memory wear-out recovery to enable self-healing ssds . HotStorage '11 . Q. W. et al. Exploiting heat-accelerated flash memory wear-out recovery to enable self-healing ssds. HotStorage '11."},{"key":"e_1_3_2_1_21_1","unstructured":"V. M. et al. How i learned to stop worrying and love flash endurance. HotStorage'10.  V. M. et al. How i learned to stop worrying and love flash endurance. HotStorage'10."},{"volume-title":"SIPS '06","author":"W.","key":"e_1_3_2_1_22_1","unstructured":"W. L. et al. Low-power high-throughput bch error correction vlsi design for multi-level cell nand flash memories . SIPS '06 . W. L. et al. Low-power high-throughput bch error correction vlsi design for multi-level cell nand flash memories. SIPS '06."},{"volume-title":"DAC '07","author":"Y.-H.","key":"e_1_3_2_1_23_1","unstructured":"Y.-H. C. et al. Endurance enhancement of flash-memory storage, systems: An efficient static wear leveling design . DAC '07 . Y.-H. C. et al. Endurance enhancement of flash-memory storage, systems: An efficient static wear leveling design. DAC '07."},{"key":"e_1_3_2_1_24_1","first-page":"155","volume-title":"Usenix Winter","author":"Kawaguchi A.","year":"1995","unstructured":"A. Kawaguchi , S. Nishioka , and H. Motoda . A flash-memory based file system . In Usenix Winter , pages 155 -- 164 , 1995 . A. Kawaguchi, S. Nishioka, and H. Motoda. A flash-memory based file system. In Usenix Winter, pages 155--164, 1995."},{"volume-title":"USENIX '12","author":"Lee S.","key":"e_1_3_2_1_25_1","unstructured":"S. Lee , T. Kim , K. Kim , and J. Kim . Lifetime management of flash-based ssds using recovery-aware dynamic throttling . USENIX '12 . S. Lee, T. Kim, K. Kim, and J. Kim. Lifetime management of flash-based ssds using recovery-aware dynamic throttling. USENIX '12."},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/146941.146943"},{"key":"e_1_3_2_1_27_1","unstructured":"SNIA IOTTA Repository. http:\/\/iotta.snia.org\/.  SNIA IOTTA Repository. http:\/\/iotta.snia.org\/."},{"key":"e_1_3_2_1_28_1","unstructured":"Tx58TEGxDCJTAX0 Datasheet. Toshiba Inc.  Tx58TEGxDCJTAX0 Datasheet. Toshiba Inc."}],"event":{"name":"DAC '14: The 51st Annual Design Automation Conference 2014","sponsor":["EDAC Electronic Design Automation Consortium","SIGBED ACM Special Interest Group on Embedded Systems","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"],"location":"San Francisco CA USA","acronym":"DAC '14"},"container-title":["Proceedings of the 51st Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2593172","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2593069.2593172","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T07:01:24Z","timestamp":1750230084000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2593172"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":28,"alternative-id":["10.1145\/2593069.2593172","10.1145\/2593069"],"URL":"https:\/\/doi.org\/10.1145\/2593069.2593172","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]},"assertion":[{"value":"2014-06-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}