{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:18:01Z","timestamp":1750306681734,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1145\/2593069.2602978","type":"proceedings-article","created":{"date-parts":[[2014,5,27]],"date-time":"2014-05-27T12:57:10Z","timestamp":1401195430000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Using a High-Level Test Generation Expert System for Testing In-Car Networks"],"prefix":"10.1145","author":[{"given":"Allon","family":"Adir","sequence":"first","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alex","family":"Goryachev","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lev","family":"Greenberg","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tamer","family":"Salman","sequence":"additional","affiliation":[{"name":"IBM Research - Haifa, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2014,6]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"ATG - IBM\u00ae Rational\u00ae Rhapsody\u00aeAutomatic Test Generation Add On.  ATG - IBM\u00ae Rational\u00ae Rhapsody\u00aeAutomatic Test Generation Add On."},{"key":"e_1_3_2_1_2_1","unstructured":"AUTOSAR - AUtomotive Open System ARchitecture. http:\/\/www.autosar.org.  AUTOSAR - AUtomotive Open System ARchitecture. http:\/\/www.autosar.org."},{"key":"e_1_3_2_1_3_1","unstructured":"MuProD. http:\/\/www.muprod.eu\/.  MuProD. http:\/\/www.muprod.eu\/."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"crossref","first-page":"182","DOI":"10.1007\/978-3-319-03077-7_13","volume-title":"Hardware and Software: Verification and Testing","author":"Abel A.","year":"2013","unstructured":"A. Abel , A. Adir , T. Blochwitz , L. Greenberg , and T. Salman . Development and verification of complex hybrid systems using synthesizable monitors . In Hardware and Software: Verification and Testing , pages 182 -- 198 . Springer , 2013 . A. Abel, A. Adir, T. Blochwitz, L. Greenberg, and T. Salman. Development and verification of complex hybrid systems using synthesizable monitors. In Hardware and Software: Verification and Testing, pages 182--198. Springer, 2013."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/217474.217542"},{"key":"e_1_3_2_1_6_1","first-page":"303","volume-title":"SEKE","author":"Bin E.","year":"2010","unstructured":"E. Bin , A. Ghanayim , K. Holtz , E. Marcus , R. Morad , O. Peled , M. Rimon , G. Shurek , and E. Tsanko . Ontology-based tools in the service of hardware verification . In SEKE , pages 303 -- 308 , 2010 . E. Bin, A. Ghanayim, K. Holtz, E. Marcus, R. Morad, O. Peled, M. Rimon, G. Shurek, and E. Tsanko. Ontology-based tools in the service of hardware verification. In SEKE, pages 303--308, 2010."},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.5555\/1032648.1033362"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.5555\/1114283.1114504"},{"key":"e_1_3_2_1_9_1","volume-title":"IPCCC","author":"Fournier L.","year":"1995","unstructured":"L. Fournier , D. Lewin , M. Levinger , E. Roytman , and G. Shurek . Constraint satisfaction for test program generation . In IPCCC , 1995 . L. Fournier, D. Lewin, M. Levinger, E. Roytman, and G. Shurek. Constraint satisfaction for test program generation. In IPCCC, 1995."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.5555\/140370.140377"}],"event":{"name":"DAC '14: The 51st Annual Design Automation Conference 2014","sponsor":["EDAC Electronic Design Automation Consortium","SIGBED ACM Special Interest Group on Embedded Systems","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA"],"location":"San Francisco CA USA","acronym":"DAC '14"},"container-title":["Proceedings of the 51st Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2602978","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2593069.2602978","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T07:01:12Z","timestamp":1750230072000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2593069.2602978"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":10,"alternative-id":["10.1145\/2593069.2602978","10.1145\/2593069"],"URL":"https:\/\/doi.org\/10.1145\/2593069.2602978","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]},"assertion":[{"value":"2014-06-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}