{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:16:33Z","timestamp":1763468193136,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":29,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,7,13]],"date-time":"2014-07-13T00:00:00Z","timestamp":1405209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,7,13]]},"DOI":"10.1145\/2616498.2616552","type":"proceedings-article","created":{"date-parts":[[2014,7,11]],"date-time":"2014-07-11T12:10:42Z","timestamp":1405080642000},"page":"1-7","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Performance Improvement and Workflow Development of Virtual Diffraction Calculations"],"prefix":"10.1145","author":[{"given":"Shawn P.","family":"Coleman","sequence":"first","affiliation":[{"name":"University of Arkansas, NANO 213B, Fayetteville, AR 72701, 479-575-7205"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sudhakar","family":"Pamidighantam","sequence":"additional","affiliation":[{"name":"NCSA, 1205 West Clark Street, Urbana, IL 61801, 217-333-5831"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Van Moer","sequence":"additional","affiliation":[{"name":"NCSA, 2102D NCSA Bldg, Urbana, IL 61801, (217) 333-2268"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yang","family":"Wang","sequence":"additional","affiliation":[{"name":"Pittsburg Supercomputing Center, 4400 Fifth Ave., Pittsburgh, PA 15213, 412-268-2795"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lars","family":"Koesterke","sequence":"additional","affiliation":[{"name":"Texas Advanced Computing Center, 10100 Burnet Rd., Austin, TX 78758, 512-232-5190"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Douglas E.","family":"Spearot","sequence":"additional","affiliation":[{"name":"University of Arkansas, NANO 213, Fayetteville, AR 72701, 479-575-2040"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2014,7,13]]},"reference":[{"volume-title":"2009 Transmission Electron Microscopy: A Textbook for Materials Science","author":"Willams D.B.","key":"e_1_3_2_1_1_1","unstructured":"Willams , D.B. , Carter , C.B. 2009 Transmission Electron Microscopy: A Textbook for Materials Science . Springer , New York, NY . Willams, D.B., Carter, C.B. 2009 Transmission Electron Microscopy: A Textbook for Materials Science. Springer, New York, NY."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.117951"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.328613"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1016\/0001-6160(80)90124-8"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/0001-6160(83)90085-8"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(84)90700-3"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1016\/0001-6160(86)90253-1"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1016\/0001-6160(88)90047-8"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2007.09.007"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2008.12.011"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.scriptamat.2008.02.056"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1209\/0295-5075\/89\/66002"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.71.024114"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.msea.2005.03.041"},{"key":"e_1_3_2_1_15_1","unstructured":"LAMMPS 2014. http:\/\/lammps.sandia.gov.  LAMMPS 2014. http:\/\/lammps.sandia.gov."},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1088\/0965-0393\/21\/5\/055020"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-013-0829-3"},{"key":"e_1_3_2_1_18_1","unstructured":"B. E. Warren 1990. X-Ray Diffraction Dover Publications New York NY.  B. E. Warren 1990. X-Ray Diffraction Dover Publications New York NY."},{"key":"e_1_3_2_1_19_1","unstructured":"Colliex C. Cowley J.M. Dudarev S.L. Fink M. Gj\u00f8nnes K. Hilderbrandt R. Howie A. Lynch D.F. Peng L.-M. Ren G. Ross A.W. Smith  Jr. V.H. Spence J.C.H. Steeds J. Wang J. Whelan M.J. and Zvyagin B.B. 2004. Scattering factors for the diffraction of electrons by crystalline solids. International Tables for Crystallography Volume C: Mathematical Physical and Chemical Tables 3rd ed. edited by: Prince E. Kluwer Academic Publishers Norwell MA 259--429.  Colliex C. Cowley J.M. Dudarev S.L. Fink M. Gj\u00f8nnes K. Hilderbrandt R. Howie A. Lynch D.F. Peng L.-M. Ren G. Ross A.W. Smith Jr. V.H. Spence J.C.H. Steeds J. Wang J. Whelan M.J. and Zvyagin B.B. 2004. Scattering factors for the diffraction of electrons by crystalline solids. International Tables for Crystallography Volume C: Mathematical Physical and Chemical Tables 3rd ed. edited by: Prince E. Kluwer Academic Publishers Norwell MA 259--429."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1107\/S0108767395014371"},{"key":"e_1_3_2_1_21_1","unstructured":"Brown P.J. Fox A.G. Maslen E.N. O'Keefe M.A. and Willis B.T.M. 2004. X-ray scattering. International Tables for Crystallography Volume C: Mathematical Physical and Chemical Tables 3rd ed. edited by: Prince E. Kluwer Academic Publishers Norwell MA 554--595.  Brown P.J. Fox A.G. Maslen E.N. O'Keefe M.A. and Willis B.T.M. 2004. X-ray scattering. International Tables for Crystallography Volume C: Mathematical Physical and Chemical Tables 3rd ed. edited by: Prince E. Kluwer Academic Publishers Norwell MA 554--595."},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1107\/S0108767389007567"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1107\/S0567740880002981"},{"key":"e_1_3_2_1_24_1","unstructured":"VisIt 2014. https:\/\/wci.llnl.gov\/codes\/visit\/.  VisIt 2014. https:\/\/wci.llnl.gov\/codes\/visit\/."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1151-2916.1998.tb02581.x"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10723-006-9043-7"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jocs.2014.01.005"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1145\/2110486.2110490"},{"key":"e_1_3_2_1_29_1","unstructured":"http:\/\/www.unicore.eu.  http:\/\/www.unicore.eu."}],"event":{"name":"XSEDE '14: Annual Conference of the Extreme Science and Engineering Discovery Environment","sponsor":["NSF National Science Foundation","Drexel University","Indiana University Indiana University"],"location":"Atlanta GA USA","acronym":"XSEDE '14"},"container-title":["Proceedings of the 2014 Annual Conference on Extreme Science and Engineering Discovery Environment"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2616498.2616552","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2616498.2616552","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T07:00:58Z","timestamp":1750230058000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2616498.2616552"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7,13]]},"references-count":29,"alternative-id":["10.1145\/2616498.2616552","10.1145\/2616498"],"URL":"https:\/\/doi.org\/10.1145\/2616498.2616552","relation":{},"subject":[],"published":{"date-parts":[[2014,7,13]]},"assertion":[{"value":"2014-07-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}