{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:17:28Z","timestamp":1750306648939,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2014,8,11]],"date-time":"2014-08-11T00:00:00Z","timestamp":1407715200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2014,8,11]]},"DOI":"10.1145\/2627369.2627662","type":"proceedings-article","created":{"date-parts":[[2014,8,1]],"date-time":"2014-08-01T20:13:39Z","timestamp":1406924019000},"page":"307-310","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["A digital dynamic write margin sensor for low power read\/write operations in 28nm SRAM"],"prefix":"10.1145","author":[{"given":"Peter","family":"Beshay","sequence":"first","affiliation":[{"name":"University of Virginia, Charlottesville, VA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vikas","family":"Chandra","sequence":"additional","affiliation":[{"name":"ARM Inc, San Jose, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rob","family":"Aitken","sequence":"additional","affiliation":[{"name":"ARM Inc, San Jose, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Benton H.","family":"Calhoun","sequence":"additional","affiliation":[{"name":"University of Virginia, Charlottesville, VA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2014,8,11]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2010818"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.5555\/1266366.1266648"},{"key":"e_1_3_2_1_3_1","volume-title":"Automation and Test in Europe","author":"Chandra Vikas","year":"2010","unstructured":"Chandra , Vikas , Cezary Pietrzyk , and Robert Aitken . \"On the efficacy of write-assist techniques in low voltage nanoscale SRA Ms. \" Proceedings of the Conference on Design , Automation and Test in Europe . European Design and Automation Association , 2010 . Chandra, Vikas, Cezary Pietrzyk, and Robert Aitken. \"On the efficacy of write-assist techniques in low voltage nanoscale SRAMs.\" Proceedings of the Conference on Design, Automation and Test in Europe. European Design and Automation Association, 2010."},{"key":"e_1_3_2_1_4_1","volume-title":"2010 IEEE International. IEEE","author":"Nho Hyunwoo","year":"2010","unstructured":"Nho , Hyunwoo , et al. \"A 32nm High-k metal gate SRAM with adaptive dynamic stability enhancement for low-voltage operation.\" Solid-State Circuits Conference Digest of Technical Papers (ISSCC) , 2010 IEEE International. IEEE , 2010 . Nho, Hyunwoo, et al. \"A 32nm High-k metal gate SRAM with adaptive dynamic stability enhancement for low-voltage operation.\" Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International. IEEE, 2010."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2012511"},{"key":"e_1_3_2_1_6_1","volume-title":"Digest of Technical Papers. ISSCC. 2005 IEEE International. IEEE","author":"Yamaoka Masanao","year":"2005","unstructured":"Yamaoka , Masanao , et al. \"Low-power embedded SRAM modules with expanded margins for writing.\" Solid-State Circuits Conference, 2005 . Digest of Technical Papers. ISSCC. 2005 IEEE International. IEEE , 2005 . Yamaoka, Masanao, et al. \"Low-power embedded SRAM modules with expanded margins for writing.\" Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International. IEEE, 2005."},{"key":"e_1_3_2_1_7_1","volume-title":"IEDM Technical Digest. IEEE International. IEEE","author":"Bhavnagarwala Azeez","year":"2005","unstructured":"Bhavnagarwala , Azeez , et al. \"Fluctuation limits & scaling opportunities for CMOS SRAM cells.\" Electron Devices Meeting, 2005 . IEDM Technical Digest. IEEE International. IEEE , 2005 . Bhavnagarwala, Azeez, et al. \"Fluctuation limits & scaling opportunities for CMOS SRAM cells.\" Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. IEEE, 2005."},{"key":"e_1_3_2_1_8_1","volume-title":"2012 IEEE International. IEEE","author":"Souri Kamran","year":"2012","unstructured":"Souri , Kamran , Youngcheol Chae , and Kofi Makinwa . \" A CMOS temperature sensor with a voltage-calibrated inaccuracy of \u22600.15\u00b0 C (3\u03c3) from-- 55 to 125\u00b0 C.\" Solid-State Circuits Conference Digest of Technical Papers (ISSCC) , 2012 IEEE International. IEEE , 2012 . Souri, Kamran, Youngcheol Chae, and Kofi Makinwa. \"A CMOS temperature sensor with a voltage-calibrated inaccuracy of \u22600.15\u00b0 C (3\u03c3) from-- 55 to 125\u00b0 C.\" Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International. IEEE, 2012."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342738"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342700"}],"event":{"name":"ISLPED'14: International Symposium on Low Power Electronics and Design","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS"],"location":"La Jolla California USA","acronym":"ISLPED'14"},"container-title":["Proceedings of the 2014 international symposium on Low power electronics and design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2627369.2627662","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2627369.2627662","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T06:56:08Z","timestamp":1750229768000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2627369.2627662"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,8,11]]},"references-count":10,"alternative-id":["10.1145\/2627369.2627662","10.1145\/2627369"],"URL":"https:\/\/doi.org\/10.1145\/2627369.2627662","relation":{},"subject":[],"published":{"date-parts":[[2014,8,11]]},"assertion":[{"value":"2014-08-11","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}