{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:17:29Z","timestamp":1763468249575,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":22,"publisher":"ACM","license":[{"start":{"date-parts":[[2015,5,20]],"date-time":"2015-05-20T00:00:00Z","timestamp":1432080000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000774","name":"Defense Threat Reduction Agency","doi-asserted-by":"publisher","award":["HDTRA1-10-1-0013"],"award-info":[{"award-number":["HDTRA1-10-1-0013"]}],"id":[{"id":"10.13039\/100000774","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2015,5,20]]},"DOI":"10.1145\/2742060.2742066","type":"proceedings-article","created":{"date-parts":[[2015,5,19]],"date-time":"2015-05-19T13:49:03Z","timestamp":1432043343000},"page":"45-50","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["A Simulation Framework for Analyzing Transient Effects Due to Thermal Noise in Sub-Threshold Circuits"],"prefix":"10.1145","author":[{"given":"Marco","family":"Donato","sequence":"first","affiliation":[{"name":"Brown University, Providence, RI, USA"}]},{"given":"R. Iris","family":"Bahar","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI, USA"}]},{"given":"William","family":"Patterson","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI, USA"}]},{"given":"Alexander","family":"Zaslavsky","sequence":"additional","affiliation":[{"name":"Brown University, Providence, RI, USA"}]}],"member":"320","published-online":{"date-parts":[[2015,5,20]]},"reference":[{"doi-asserted-by":"publisher","key":"e_1_3_2_1_1_1","DOI":"10.1111\/1467-9868.00282"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_2_1","DOI":"10.1088\/0026-1394\/45\/6\/S17"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_3_1","DOI":"10.1109\/SubVT.2012.6404325"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_4_1","DOI":"10.5555\/22989"},{"issue":"2","key":"e_1_3_2_1_5_1","first-page":"267","volume":"98","author":"Calhoun B.","year":"2010","unstructured":"B. Calhoun , J. Ryan , S. Khanna , M. Putic , and J. Lach . Flexible Circuits and Architectures for Ultralow Power. Proc. IEEE , 98 ( 2 ): 267 -- 282 , Feb. 2010 . B. Calhoun, J. Ryan, S. Khanna, M. Putic, and J. Lach. Flexible Circuits and Architectures for Ultralow Power. Proc. IEEE, 98(2):267--282, Feb. 2010.","journal-title":"Flexible Circuits and Architectures for Ultralow Power. Proc. IEEE"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_6_1","DOI":"10.1103\/PhysRevE.54.2084"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_7_1","DOI":"10.1007\/978-3-662-10065-3"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_8_1","DOI":"10.1109\/TDMR.2010.2069100"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_9_1","DOI":"10.1109\/TED.2011.2177983"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_10_1","DOI":"10.1109\/TED.2011.2180604"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_11_1","DOI":"10.1002\/nav.3800260304"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_12_1","DOI":"10.1109\/NANOARCH.2007.4400859"},{"key":"e_1_3_2_1_13_1","volume-title":"Modeling and Analysis of Nonstationary Low-frequency Noise in Circuit Simulators: Enabling Non Monte Carlo Techniques. In ICCAD","author":"Mahmutoglu A. G.","year":"2014","unstructured":"A. G. Mahmutoglu and A. Demir . Modeling and Analysis of Nonstationary Low-frequency Noise in Circuit Simulators: Enabling Non Monte Carlo Techniques. In ICCAD 2014 . A. G. Mahmutoglu and A. Demir. Modeling and Analysis of Nonstationary Low-frequency Noise in Circuit Simulators: Enabling Non Monte Carlo Techniques. In ICCAD 2014."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_14_1","DOI":"10.5555\/2561828.2561926"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_15_1","DOI":"10.1145\/272991.272995"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"crossref","first-page":"201","DOI":"10.1109\/ACCESS.2013.2260816","article-title":"BSIM-SPICE Models Enable FinFET and UTB IC Designs","volume":"1","author":"Paydavosi N.","year":"2013","unstructured":"N. Paydavosi , S. Venugopalan , Y. Chauhan , J. Duarte , S. Jandhyala , A. Niknejad , and C. Hu . BSIM-SPICE Models Enable FinFET and UTB IC Designs . Access, IEEE , 1 : 201 -- 215 , 2013 . N. Paydavosi, S. Venugopalan, Y. Chauhan, J. Duarte, S. Jandhyala, A. Niknejad, and C. Hu. BSIM-SPICE Models Enable FinFET and UTB IC Designs. Access, IEEE, 1:201--215, 2013.","journal-title":"Access, IEEE"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_17_1","DOI":"10.1109\/101.261888"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_18_1","DOI":"10.1145\/2228360.2228414"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_19_1","DOI":"10.1016\/j.jmp.2009.12.002"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_20_1","DOI":"10.5555\/2556161"},{"issue":"5","key":"e_1_3_2_1_21_1","first-page":"823","volume":"36","author":"Uhlenbeck G.","year":"1930","unstructured":"G. Uhlenbeck and L. Ornstein . On the Theory of the Brownian Motion. Phys. Rev. , 36 ( 5 ): 823 -- 841 , Sept. 1930 . G. Uhlenbeck and L. Ornstein. On the Theory of the Brownian Motion. Phys. Rev., 36(5):823--841, Sept. 1930.","journal-title":"On the Theory of the Brownian Motion. Phys. Rev."},{"key":"e_1_3_2_1_22_1","volume-title":"Noise in Solid State Devices and Circuits","author":"Van der Ziel A.","year":"1986","unstructured":"A. Van der Ziel . Noise in Solid State Devices and Circuits . Wiley-Interscience , 1986 . A. Van der Ziel. Noise in Solid State Devices and Circuits. Wiley-Interscience, 1986."}],"event":{"sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA","IEEE CASS"],"acronym":"GLSVLSI '15","name":"GLSVLSI '15: Great Lakes Symposium on VLSI 2015","location":"Pittsburgh Pennsylvania USA"},"container-title":["Proceedings of the 25th edition on Great Lakes Symposium on VLSI"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2742060.2742066","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2742060.2742066","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T06:12:38Z","timestamp":1750227158000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2742060.2742066"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5,20]]},"references-count":22,"alternative-id":["10.1145\/2742060.2742066","10.1145\/2742060"],"URL":"https:\/\/doi.org\/10.1145\/2742060.2742066","relation":{},"subject":[],"published":{"date-parts":[[2015,5,20]]},"assertion":[{"value":"2015-05-20","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}