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Nearly everybody has an intuitive understanding of what robustness means, but there is no proper way how to measure robustness of integrated circuits already during the design phase. Therefore, a general cross-layer robustness model and methods to quantitatively measure robustness are presented. Moreover, these methods are refined to predict the robustness against degradation of digital circuits due to aging effects.<\/jats:p>","DOI":"10.1145\/2743022","type":"journal-article","created":{"date-parts":[[2015,9,22]],"date-time":"2015-09-22T12:31:00Z","timestamp":1442925060000},"page":"1-22","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["A Cross-Layer Approach to Measure the Robustness of Integrated Circuits"],"prefix":"10.1145","volume":"12","author":[{"given":"Martin","family":"Barke","sequence":"first","affiliation":[{"name":"Technische Universit\u00e4t M\u00fcnchen, Munchen, Germany"}]},{"given":"Ulf","family":"Schlichtmann","sequence":"additional","affiliation":[{"name":"Technische Universit\u00e4t M\u00fcnchen, Munchen, Germany"}]}],"member":"320","published-online":{"date-parts":[[2015,9,21]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACQED.2012.6320491"},{"key":"e_1_2_1_2_1","volume-title":"Proceedings of the EDA Workshop. 19--24","author":"Barke Martin","year":"2013","unstructured":"Martin Barke , Veit B. 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