{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T06:40:08Z","timestamp":1750228808987,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":27,"publisher":"ACM","license":[{"start":{"date-parts":[[2015,6,7]],"date-time":"2015-06-07T00:00:00Z","timestamp":1433635200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"Program of China National 1000 Young Talent Plan"},{"name":"Shanghai science and Technology Committee","award":["15YF1406000"],"award-info":[{"award-number":["15YF1406000"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61202026,61332001"],"award-info":[{"award-number":["61202026,61332001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2015,6,7]]},"DOI":"10.1145\/2744769.2744864","type":"proceedings-article","created":{"date-parts":[[2015,6,2]],"date-time":"2015-06-02T05:35:02Z","timestamp":1433223302000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["Jump test for metallic CNTs in CNFET-based SRAM"],"prefix":"10.1145","author":[{"given":"Feng","family":"Xie","sequence":"first","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China"}]},{"given":"Xiaoyao","family":"Liang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China"}]},{"given":"Qiang","family":"Xu","sequence":"additional","affiliation":[{"name":"The Chinese University of Hong Kong, Shatin, N.T., Hong Kong"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Duke University, Durham, NC"}]},{"given":"Naifeng","family":"Jing","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China"}]},{"given":"Li","family":"Jiang","sequence":"additional","affiliation":[{"name":"Shanghai Jiao Tong University, Shanghai, China and State Key Laboratory of High-end Server & Storage Technology, China"}]}],"member":"320","published-online":{"date-parts":[[2015,6,7]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"\"International technology roadmap for semiconductors \" 2008. {Online}. Available: http:\/\/www.itrs.net\/  \"International technology roadmap for semiconductors \" 2008. {Online}. Available: http:\/\/www.itrs.net\/"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.818338"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesb.2012.01.066"},{"key":"e_1_3_2_1_4_1","first-page":"343","volume-title":"Proceedings. New Frontiers in Testing, International. IEEE","author":"Dekker R.","year":"1988","unstructured":"R. Dekker and F. L. Thijssen , \" Fault modeling and test algorithm development for static random access memories,\" in Test Conference, 1988 . Proceedings. New Frontiers in Testing, International. IEEE , 1988 , pp. 343 -- 352 . R. Dekker and F. L. Thijssen, \"Fault modeling and test algorithm development for static random access memories,\" in Test Conference, 1988. Proceedings. New Frontiers in Testing, International. IEEE, 1988, pp. 343--352."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.909043"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2033168"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629995"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2003278"},{"key":"e_1_3_2_1_9_1","first-page":"841","volume-title":"Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube fets,\" in Proceedings of the conference on Design, automation and test in Europe","author":"Hashempour H.","year":"2007","unstructured":"H. Hashempour and F. Lombardi , \" Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube fets,\" in Proceedings of the conference on Design, automation and test in Europe . EDA Consortium , 2007 , pp. 841 -- 846 . H. Hashempour and F. Lombardi, \"Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube fets,\" in Proceedings of the conference on Design, automation and test in Europe. EDA Consortium, 2007, pp. 841--846."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.77"},{"key":"e_1_3_2_1_11_1","first-page":"176","article-title":"A low power 8t sram cell design technique for cnfet","volume":"01","author":"Kim Y. B.","year":"2008","unstructured":"Y. B. Kim , \" A low power 8t sram cell design technique for cnfet ,\" in International SoC Design Conference , vol. 01 , Nov 2008 , pp. I- 176 --I-179. Y. B. Kim et al., \"A low power 8t sram cell design technique for cnfet,\" in International SoC Design Conference, vol. 01, Nov 2008, pp. I-176--I-179.","journal-title":"International SoC Design Conference"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1086534"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2053207"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2011.07.015"},{"key":"e_1_3_2_1_15_1","first-page":"1","volume-title":"2010 IEEE International Conference on","author":"Nan H.","year":"2010","unstructured":"H. Nan , K. K. Kim , and K. Choi , \" Novel cnfet sram cell design operating in sub-threshold region using back-gate biasing,\" in Electro\/Information Technology (EIT) , 2010 IEEE International Conference on , May 2010 , pp. 1 -- 6 . H. Nan, K. K. Kim, and K. Choi, \"Novel cnfet sram cell design operating in sub-threshold region using back-gate biasing,\" in Electro\/Information Technology (EIT), 2010 IEEE International Conference on, May 2010, pp. 1--6."},{"key":"e_1_3_2_1_16_1","first-page":"1","volume-title":"2009 IEEE International. IEEE","author":"Patil N.","year":"2009","unstructured":"N. Patil : Vlsi-compatible metallic carbon nanotube removal for imperfection-immune cascaded multi-stage digital logic circuits using carbon nanotube fets,\" in Electron Devices Meeting (IEDM) , 2009 IEEE International. IEEE , 2009 , pp. 1 -- 4 . N. Patil et al., \"Vmr: Vlsi-compatible metallic carbon nanotube removal for imperfection-immune cascaded multi-stage digital logic circuits using carbon nanotube fets,\" in Electron Devices Meeting (IEDM), 2009 IEEE International. IEEE, 2009, pp. 1--4."},{"key":"e_1_3_2_1_17_1","first-page":"971","volume-title":"IEEE","author":"Shahidipour H.","year":"2010","unstructured":"H. Shahidipour of cnt diameter variability on a cnfet-based sram,\" in IEEE Asia Pacific Conference on Circuits and Systems . IEEE , 2010 , pp. 971 -- 974 . H. Shahidipour et al., \"Effects of cnt diameter variability on a cnfet-based sram,\" in IEEE Asia Pacific Conference on Circuits and Systems. IEEE, 2010, pp. 971--974."},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1038\/nature12502"},{"key":"e_1_3_2_1_19_1","first-page":"501","volume-title":"Automation and Test in Europe, 1998.","author":"van de Goor A.","year":"1998","unstructured":"A. van de Goor tests for word-oriented memories,\" in Design , Automation and Test in Europe, 1998. , Proceedings , Feb 1998 , pp. 501 -- 508 . A. van de Goor et al., \"March tests for word-oriented memories,\" in Design, Automation and Test in Europe, 1998., Proceedings, Feb 1998, pp. 501--508."},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2013.69"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2092780"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629933"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2023197"},{"key":"e_1_3_2_1_24_1","first-page":"340","article-title":"Near-threshold cntfet sram cell design with gated cell power supply","author":"Zhang Z.","year":"2013","unstructured":"Z. Zhang and J. Delgado-Frias , \" Near-threshold cntfet sram cell design with gated cell power supply ,\" in International Midwest Symposium on Circuits and Systems , Aug 2013 , pp. 340 -- 343 . Z. Zhang and J. Delgado-Frias, \"Near-threshold cntfet sram cell design with gated cell power supply,\" in International Midwest Symposium on Circuits and Systems, Aug 2013, pp. 340--343.","journal-title":"International Midwest Symposium on Circuits and Systems"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2012.2197636"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1126\/science.1133781"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837497"}],"event":{"name":"DAC '15: The 52nd Annual Design Automation Conference 2015","sponsor":["SIGDA ACM Special Interest Group on Design Automation"],"location":"San Francisco California","acronym":"DAC '15"},"container-title":["Proceedings of the 52nd Annual Design Automation Conference"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2744769.2744864","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2744769.2744864","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T06:12:03Z","timestamp":1750227123000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2744769.2744864"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6,7]]},"references-count":27,"alternative-id":["10.1145\/2744769.2744864","10.1145\/2744769"],"URL":"https:\/\/doi.org\/10.1145\/2744769.2744864","relation":{},"subject":[],"published":{"date-parts":[[2015,6,7]]},"assertion":[{"value":"2015-06-07","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}