{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T03:47:41Z","timestamp":1772164061664,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":6,"publisher":"ACM","license":[{"start":{"date-parts":[[2015,6,15]],"date-time":"2015-06-15T00:00:00Z","timestamp":1434326400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2015,6,15]]},"DOI":"10.1145\/2745844.2745901","type":"proceedings-article","created":{"date-parts":[[2015,6,8]],"date-time":"2015-06-08T11:11:12Z","timestamp":1433761872000},"page":"473-474","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":10,"title":["Performance Characterization of Hyperscale Applicationson on NVMe SSDs"],"prefix":"10.1145","author":[{"given":"Qiumin","family":"Xu","sequence":"first","affiliation":[{"name":"University of Southern California, Los Angeles, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Huzefa","family":"Siyamwala","sequence":"additional","affiliation":[{"name":"San Jose State University, San Jose, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mrinmoy","family":"Ghosh","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor Inc, Milpitas, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manu","family":"Awasthi","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor Inc, Milpitas, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tameesh","family":"Suri","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor Inc, Milpitas, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zvika","family":"Guz","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor Inc, Milpitas, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Anahita","family":"Shayesteh","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor Inc, Milpitas, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijay","family":"Balakrishnan","sequence":"additional","affiliation":[{"name":"Samsung Semiconductor Inc, Milpitas, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2015,6,15]]},"reference":[{"key":"e_1_3_2_1_1_1","unstructured":"\"TPC-C Benchmark Standard Specification Revision 5.11 \" http:\/\/www.tpc.org\/tpcc\/spec\/tpcc_current.pdf 2010.  \"TPC-C Benchmark Standard Specification Revision 5.11 \" http:\/\/www.tpc.org\/tpcc\/spec\/tpcc_current.pdf 2010."},{"key":"e_1_3_2_1_2_1","unstructured":"\"Benchmarking Cassandra Scalability on AWS - Over a million writes per second \" http:\/\/techblog.netflix.com\/2011\/11\/benchmarking-cassandra-scalability-on.html 2011.  \"Benchmarking Cassandra Scalability on AWS - Over a million writes per second \" http:\/\/techblog.netflix.com\/2011\/11\/benchmarking-cassandra-scalability-on.html 2011."},{"key":"e_1_3_2_1_3_1","unstructured":"\"NVM Express Explained \" http:\/\/nvmexpress.org\/wp-content\/uploads\/2013\/04\/NVMe_whitepaper.pdf 2013.  \"NVM Express Explained \" http:\/\/nvmexpress.org\/wp-content\/uploads\/2013\/04\/NVMe_whitepaper.pdf 2013."},{"key":"e_1_3_2_1_4_1","volume-title":"Bigtable: A Distributed Storage System for Structured Data,\" in Proceedings of OSDI","author":"Chang F.","year":"2006"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1807128.1807152"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1773912.1773922"}],"event":{"name":"SIGMETRICS '15: ACM SIGMETRICS \/ International Conference on Measurement and Modeling of Computer Systems","location":"Portland Oregon USA","acronym":"SIGMETRICS '15","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation"]},"container-title":["Proceedings of the 2015 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2745844.2745901","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2745844.2745901","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T02:16:43Z","timestamp":1750213003000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2745844.2745901"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6,15]]},"references-count":6,"alternative-id":["10.1145\/2745844.2745901","10.1145\/2745844"],"URL":"https:\/\/doi.org\/10.1145\/2745844.2745901","relation":{"is-identical-to":[{"id-type":"doi","id":"10.1145\/2796314.2745901","asserted-by":"object"}]},"subject":[],"published":{"date-parts":[[2015,6,15]]},"assertion":[{"value":"2015-06-15","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}