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Therefore, in-field tracking of path delays is essential, and to respond to this need, several delay sensor designs have been proposed in the literature. However, due to the significant overhead of these sensors and the large number of critical paths in today's IC, it is infeasible to monitor the delay of every critical path in silicon. We present an aging- and variationaware representative path selection technique based on machine learning that allows to measure the delay of a small set of paths and infer the delay of a larger pool of paths that are likely to fail due to delay variations. Simulation results for benchmark circuits highlight the accuracy of the proposed approach for predicting critical-path delay based on the selected representative paths.<\/jats:p>","DOI":"10.1145\/2746237","type":"journal-article","created":{"date-parts":[[2015,6,25]],"date-time":"2015-06-25T14:36:19Z","timestamp":1435242979000},"page":"1-23","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":27,"title":["Aging- and Variation-Aware Delay Monitoring Using Representative Critical Path Selection"],"prefix":"10.1145","volume":"20","author":[{"given":"Farshad","family":"Firouzi","sequence":"first","affiliation":[{"name":"Karlsruhe Institute of Technology, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fangming","family":"Ye","sequence":"additional","affiliation":[{"name":"Duke University, Durham, NC"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"Duke University, Durham, NC"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mehdi B.","family":"Tahoori","sequence":"additional","affiliation":[{"name":"Karlsruhe Institute of Technology, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2015,6,24]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700619"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.56"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391524"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1016\/0098-3004(84)90020-7"},{"volume-title":"Proceedings of the IEEE Custom Integrated Circuits Conference (CICC'06)","author":"Bhardwaj S.","key":"e_1_2_1_6_1","unstructured":"S. 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