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Unfortunately, deep submicron CMOS process technology is marred by increasing susceptibility to wear. Prolonged operational stress gives rise to accelerated wearout and failure due to several physical failure mechanisms, including hot-carrier injection (HCI) and negative-bias temperature instability (NBTI). Each failure mechanism correlates with different usage-based stresses, all of which can eventually generate permanent faults. While the wearout of an individual core in many-core CMPs may not necessarily be catastrophic, a single fault in the interprocessor network-on-chip (NoC) fabric could render the entire chip useless, as it could lead to protocol-level deadlocks, or even partition away vital components such as the memory controller or other critical I\/O. In this article, we study HCI- and NBTI-induced wear due to actual stresses caused by real workloads, applied onto the interconnect microarchitecture and develop a critical path model for NBTI-induced wearout. A key finding of this modeling is that, counter to prevailing wisdom, wearout in the CMP's on-chip interconnect is correlated with lack of load observed in the NoC routers rather than high load. We then develop a novel wearout-decelerating scheme in which routers under low load have their wear-sensitive components exercised without significantly impacting cycle time, pipeline depth, area, or power consumption of the overall router. A novel deterministic approach is proposed for the generation of appropriate exercise-mode data, ensuring design parameter targets are met. We subsequently show that the proposed design yields an \u223c2,300\u00d7 decrease in the rate of wear.<\/jats:p>","DOI":"10.1145\/2770873","type":"journal-article","created":{"date-parts":[[2015,9,29]],"date-time":"2015-09-29T19:22:29Z","timestamp":1443554549000},"page":"1-26","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":8,"title":["Use It or Lose It"],"prefix":"10.1145","volume":"20","author":[{"given":"Hyungjun","family":"Kim","sequence":"first","affiliation":[{"name":"Texas A&amp;M University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siva Bhanu Krishna","family":"Boga","sequence":"additional","affiliation":[{"name":"Texas A&amp;M University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arseniy","family":"Vitkovskiy","sequence":"additional","affiliation":[{"name":"Cyprus University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stavros","family":"Hadjitheophanous","sequence":"additional","affiliation":[{"name":"University of Cyprus"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paul V.","family":"Gratz","sequence":"additional","affiliation":[{"name":"Texas A&amp;M University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vassos","family":"Soteriou","sequence":"additional","affiliation":[{"name":"Cyprus University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maria K.","family":"Michael","sequence":"additional","affiliation":[{"name":"University of Cyprus"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2015,9,28]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.5555\/1331699.1331710"},{"key":"e_1_2_1_2_1","volume-title":"Friedman","author":"Abramovici M.","year":"1990","unstructured":"M. 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