{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,7]],"date-time":"2023-09-07T19:40:24Z","timestamp":1694115624191},"publisher-location":"New York, NY, USA","reference-count":0,"publisher":"ACM","isbn-type":[{"value":"0897919823","type":"print"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1998,6]]},"DOI":"10.1145\/277851","type":"proceedings","created":{"date-parts":[[2003,11,13]],"date-time":"2003-11-13T21:09:32Z","timestamp":1068757772000},"source":"Crossref","is-referenced-by-count":0,"title":["Proceedings of the 1998 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems"],"prefix":"10.1145","member":"320","published-online":{"date-parts":[[1998,6]]},"event":{"name":"SIGMETRICS98: Joint International Conference on Measurement and Modeling of Computer Systems","location":"Madison Wisconsin USA","acronym":"SIGMETRICS98","sponsor":["SIGMETRICS ACM Special Interest Group on Measurement and Evaluation","IFIP WG 7.3 IFIP WG 7.3"]},"container-title":[],"original-title":[],"deposited":{"date-parts":[[2023,9,4]],"date-time":"2023-09-04T19:28:19Z","timestamp":1693855699000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/proceedings\/10.1145\/277851"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1998,6]]},"ISBN":["0897919823"],"references-count":0,"alternative-id":["10.1145\/277851"],"URL":"https:\/\/doi.org\/10.1145\/277851","relation":{},"subject":[],"published":{"date-parts":[[1998,6]]}}}