{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:48:49Z","timestamp":1750308529497,"version":"3.41.0"},"reference-count":38,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2015,12,2]],"date-time":"2015-12-02T00:00:00Z","timestamp":1449014400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"National Science Foundation","award":["IIA-0926278, CCF-0915537 and CCF-0832282"],"award-info":[{"award-number":["IIA-0926278, CCF-0915537 and CCF-0832282"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Des. Autom. Electron. Syst."],"published-print":{"date-parts":[[2015,12,2]]},"abstract":"<jats:p>This article proposes a novel methodology for robust analog\/mixed-signal IC design by introducing a notion of budget of uncertainty. This method employs a new conic uncertainty model to capture process variability and describes variability-affected circuit design as a set-based robust optimization problem. For a prespecified yield requirement, the proposed method conducts uncertainty budgeting by associating performance yield with the size of uncertainty set for process variations. Hence the uncertainty budgeting problem can be further translated into a tractable robust optimization problem. Compared with the existing robust design flow based on ellipsoid model, this method is able to produce more reliable design solutions by allowing varying size of conic uncertainty set at different design points. In addition, the proposed method addresses the limitation that the size of the ellipsoid model is calculated solely relying on the distribution of process parameters, while neglecting the dependence of circuit performance upon these design parameters. The proposed robust design framework has been verified on various analog\/mixed-signal circuits to demonstrate its efficiency against the ellipsoid model. Up to 24% reduction of design cost has been achieved by using the uncertainty budgeting-based method.<\/jats:p>","DOI":"10.1145\/2778959","type":"journal-article","created":{"date-parts":[[2015,12,4]],"date-time":"2015-12-04T13:43:07Z","timestamp":1449236587000},"page":"1-25","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["A New Uncertainty Budgeting-Based Method for Robust Analog\/Mixed-Signal Design"],"prefix":"10.1145","volume":"21","author":[{"given":"Jin","family":"Sun","sequence":"first","affiliation":[{"name":"Nanjing University of Science and Technology and University of Arizona, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Claudio","family":"Talarico","sequence":"additional","affiliation":[{"name":"Gonzaga University, Spokane, WA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Priyank","family":"Gupta","sequence":"additional","affiliation":[{"name":"The University of Texas at Austin, Austin, TX"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janet","family":"Roveda","sequence":"additional","affiliation":[{"name":"University of Arizona, Tucson, AZ"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2015,12,2]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/IWSOC.2005.78"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1137\/080716542"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1137\/080734510"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1287\/opre.1030.0065"},{"key":"e_1_2_1_5_1","volume-title":"Operations Research: Models, Methods, And Applications for Innovative Decision Making, INFORMS.","author":"Bertsimas D.","year":"2006","unstructured":"D. Bertsimas and A. Thiele . 2006 . Robust and data-driven optimization: Modern decision-making under uncertainty. In Tutorials in Operations Research: Models, Methods, And Applications for Innovative Decision Making, INFORMS. D. Bertsimas and A. Thiele. 2006. Robust and data-driven optimization: Modern decision-making under uncertainty. In Tutorials in Operations Research: Models, Methods, And Applications for Innovative Decision Making, INFORMS."},{"volume-title":"Pattern Recognition and Machine Learning","author":"Bishop C.","key":"e_1_2_1_6_1","unstructured":"C. Bishop . 2006. Pattern Recognition and Machine Learning . Springer , Berlin . C. Bishop. 2006. Pattern Recognition and Machine Learning. Springer, Berlin."},{"key":"e_1_2_1_7_1","unstructured":"D. Boning and S. Nassif. 2001. Models of process variations in device and interconnect. In Design of High-Performance Microprocessor Circuits Chapter 6. A. Chandrakasan W. J. Bowhill and F. Cox (Eds.) IEEE Press 98--115. D. Boning and S. Nassif. 2001. Models of process variations in device and interconnect. In Design of High-Performance Microprocessor Circuits Chapter 6. A. Chandrakasan W. J. Bowhill and F. Cox (Eds.) IEEE Press 98--115."},{"key":"e_1_2_1_8_1","doi-asserted-by":"crossref","unstructured":"S. Boyd and L. Vandenberghe. 2004. Convex Optimization. Cambridge University Press New York NY. S. Boyd and L. Vandenberghe. 2004. Convex Optimization. Cambridge University Press New York NY.","DOI":"10.1017\/CBO9780511804441"},{"key":"e_1_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.5555\/996070.1009954"},{"key":"e_1_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2157843"},{"key":"e_1_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2013.12.004"},{"key":"e_1_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1214\/009053604000000067"},{"key":"e_1_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2007.910281"},{"key":"e_1_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2217961"},{"volume-title":"Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC'08)","author":"Hargreaves B.","key":"e_1_2_1_15_1","unstructured":"B. Hargreaves , H. Hult , and S. Reda . 2008. Within-die process variations: How accurately can they be statistically modeled? In Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC'08) . 524--530. B. Hargreaves, H. Hult, and S. Reda. 2008. Within-die process variations: How accurately can they be statistically modeled? In Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC'08). 524--530."},{"key":"e_1_2_1_16_1","unstructured":"T. Hastie R. Tibshirani and J. Friedman. 2003. The Elements of Statistical Learning Springer Berlin. T. Hastie R. Tibshirani and J. Friedman. 2003. The Elements of Statistical Learning Springer Berlin."},{"key":"e_1_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2061292"},{"volume-title":"Proceedings of the International Conference on Computer-Aided Design (ICCAD'05)","author":"Li X.","key":"e_1_2_1_18_1","unstructured":"X. Li , J. Le , L. Pileggi , and A. Strojwas . 2005. Projection-based performance modeling for inter\/intra-die variations . In Proceedings of the International Conference on Computer-Aided Design (ICCAD'05) . 721--727. X. Li, J. Le, L. Pileggi, and A. Strojwas. 2005. Projection-based performance modeling for inter\/intra-die variations. In Proceedings of the International Conference on Computer-Aided Design (ICCAD'05). 721--727."},{"key":"e_1_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0024-3795(98)10032-0"},{"key":"e_1_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2021034"},{"key":"e_1_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1145\/2770287.2770327"},{"key":"e_1_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1137\/S0097539792240406"},{"key":"e_1_2_1_23_1","unstructured":"M. Orshansky S. Nassif and D. Boning. 2008. Design for Manufacturability and Statistical Design: A Constructive Approach. Springer New York NY. M. Orshansky S. Nassif and D. Boning. 2008. Design for Manufacturability and Statistical Design: A Constructive Approach. Springer New York NY."},{"key":"e_1_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"e_1_2_1_25_1","doi-asserted-by":"crossref","unstructured":"S. Roy and A. Asenov. 2005. Where do the dopants go? Science 309 5733 (2005) 388--390. S. Roy and A. Asenov. 2005. Where do the dopants go? Science 309 5733 (2005) 388--390.","DOI":"10.1126\/science.1111104"},{"volume-title":"Wiley Series","author":"Seber G.","key":"e_1_2_1_26_1","unstructured":"G. Seber . 1984. Multivariate Observations . Wiley Series , Hoboken, NJ . G. Seber. 1984. Multivariate Observations. Wiley Series, Hoboken, NJ."},{"key":"e_1_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2011628"},{"key":"e_1_2_1_28_1","first-page":"464","article-title":"A geometric programming-based worst case gate sizing method incorporating spatial correlation","volume":"53","author":"Singh J.","year":"2011","unstructured":"J. Singh , V. Nookala , Z. Luo , and S. Sapatnekar . 2011 . A geometric programming-based worst case gate sizing method incorporating spatial correlation . IEEE Trans. Comput.-Aid. Des. Integr. Circuits Syst. 53 , 3 (2011), 464 -- 501 . J. Singh, V. Nookala, Z. Luo, and S. Sapatnekar. 2011. A geometric programming-based worst case gate sizing method incorporating spatial correlation. IEEE Trans. Comput.-Aid. Des. Integr. Circuits Syst. 53, 3 (2011), 464--501.","journal-title":"IEEE Trans. Comput.-Aid. Des. Integr. Circuits Syst."},{"key":"e_1_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907241"},{"key":"e_1_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2011628"},{"volume-title":"Interpolation of Spatial Data","author":"Stein M. L.","key":"e_1_2_1_31_1","unstructured":"M. L. Stein . 1999. Interpolation of Spatial Data . Springer , New York, NY . M. L. Stein. 1999. Interpolation of Spatial Data. Springer, New York, NY."},{"key":"e_1_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/81.873869"},{"key":"e_1_2_1_33_1","doi-asserted-by":"crossref","first-page":"267","DOI":"10.1111\/j.2517-6161.1996.tb02080.x","article-title":"Regression shrinkage and selection via the Lasso","volume":"58","author":"Tibshirani R.","year":"1996","unstructured":"R. Tibshirani . 1996 . Regression shrinkage and selection via the Lasso . J. Royal Stat. Soc. 58 , 1 (1996), 267 -- 288 . R. Tibshirani. 1996. Regression shrinkage and selection via the Lasso. J. Royal Stat. Soc. 58, 1 (1996), 267--288.","journal-title":"J. Royal Stat. Soc."},{"key":"e_1_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1145\/1123008.1123011"},{"key":"e_1_2_1_35_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2013996"},{"key":"e_1_2_1_36_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2262292"},{"volume-title":"Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC'10)","author":"Yu H.","key":"e_1_2_1_37_1","unstructured":"H. Yu , X. Liu , H. Wang , and S. Tan . 2010. A fast analog mismatch analysis by an incremental and stochastic trajectory piecewise linear macromodel . In Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC'10) . 211--216. H. Yu, X. Liu, H. Wang, and S. Tan. 2010. A fast analog mismatch analysis by an incremental and stochastic trajectory piecewise linear macromodel. In Proceedings of the Asia and South Pacific Design Automation Conference (ASPDAC'10). 211--216."},{"key":"e_1_2_1_38_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2245942"}],"container-title":["ACM Transactions on Design Automation of Electronic Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2778959","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2778959","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T18:55:51Z","timestamp":1750272951000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2778959"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12,2]]},"references-count":38,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2015,12,2]]}},"alternative-id":["10.1145\/2778959"],"URL":"https:\/\/doi.org\/10.1145\/2778959","relation":{},"ISSN":["1084-4309","1557-7309"],"issn-type":[{"type":"print","value":"1084-4309"},{"type":"electronic","value":"1557-7309"}],"subject":[],"published":{"date-parts":[[2015,12,2]]},"assertion":[{"value":"2014-12-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2015-05-01","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2015-12-02","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}