{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:13:32Z","timestamp":1750306412400,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":22,"publisher":"ACM","license":[{"start":{"date-parts":[[2015,4,22]],"date-time":"2015-04-22T00:00:00Z","timestamp":1429660800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100001824","name":"Czech Science Foundation","doi-asserted-by":"publisher","award":["GA14-19213S"],"award-info":[{"award-number":["GA14-19213S"]}],"id":[{"id":"10.13039\/501100001824","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003329","name":"Ministerio de Econom\u00eda y Competitividad","doi-asserted-by":"publisher","award":["TIN2013-47276-C6-1-R"],"award-info":[{"award-number":["TIN2013-47276-C6-1-R"]}],"id":[{"id":"10.13039\/501100003329","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003030","name":"Ag\u00e8ncia de Gesti\u00f3 d'Ajuts Universitaris i de Recerca","doi-asserted-by":"publisher","award":["2014 SGR 1232"],"award-info":[{"award-number":["2014 SGR 1232"]}],"id":[{"id":"10.13039\/501100003030","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2015,4,22]]},"DOI":"10.1145\/2788539.2788544","type":"proceedings-article","created":{"date-parts":[[2015,11,30]],"date-time":"2015-11-30T19:03:51Z","timestamp":1448910231000},"page":"39-46","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Surface reflectance characterization by statistical tools"],"prefix":"10.1145","author":[{"given":"Vlastimil","family":"Havran","sequence":"first","affiliation":[{"name":"Czech Technical University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mateu","family":"Sbert","sequence":"additional","affiliation":[{"name":"University of Girona"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2015,4,22]]},"reference":[{"volume-title":"Proceedings of SPIE 7453","author":"Balling B. L.","key":"e_1_3_2_1_1_1","unstructured":"Balling , B. L. , and Marciniak , M. A . 2009. Comparison of Several Surfaces for Use as a MWIR BRDF Standard . In Proceedings of SPIE 7453 , Infrared Spaceborne Remote Sensing and Instrumentation XVII, SPIE, 74530O--74530O--10. Balling, B. L., and Marciniak, M. A. 2009. Comparison of Several Surfaces for Use as a MWIR BRDF Standard. In Proceedings of SPIE 7453, Infrared Spaceborne Remote Sensing and Instrumentation XVII, SPIE, 74530O--74530O--10."},{"volume-title":"Importance Sampling for Production Rendering. In ACM SIGGRAPH 2010 Course Notes, ACM SIGGRAH.","author":"Colbert M.","key":"e_1_3_2_1_2_1","unstructured":"Colbert , M. , Premoze , S. , and Francois , G . 2010 . Importance Sampling for Production Rendering. In ACM SIGGRAPH 2010 Course Notes, ACM SIGGRAH. Colbert, M., Premoze, S., and Francois, G. 2010. Importance Sampling for Production Rendering. In ACM SIGGRAPH 2010 Course Notes, ACM SIGGRAH."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1111\/cgf.12256"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8659.2010.01786.x"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"crossref","unstructured":"Dror R. Adelson E. and Willsky A. 2001. Recognition of Surface Reflectance Properties from a Single Image under Unknown Real-World Illumination. In MIT AIM.  Dror R. Adelson E. and Willsky A. 2001. Recognition of Surface Reflectance Properties from a Single Image under Unknown Real-World Illumination. In MIT AIM.","DOI":"10.1117\/12.429494"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8659.2009.01493.x"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/2670473.2670496"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/97879.97895"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.23.000314"},{"volume-title":"Realistic Image Synthesis Using Photon Mapping","author":"Jensen H. W.","key":"e_1_3_2_1_10_1","unstructured":"Jensen , H. W. 2001. Realistic Image Synthesis Using Photon Mapping . A. K. Peters, Ltd. , Natick, MA, USA. Jensen, H. W. 2001. Realistic Image Synthesis Using Photon Mapping. A. K. Peters, Ltd., Natick, MA, USA."},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/15922.15902"},{"key":"e_1_3_2_1_12_1","unstructured":"Lafortune E. P. and Willems Y. D. 1994. Using the Modified Phong Reflectance Model for Physically Based Rendering. Tech. Rep. report CW197 Dept. of Computer Science K.U.Leuven.  Lafortune E. P. and Willems Y. D. 1994. Using the Modified Phong Reflectance Model for Physically Based Rendering. Tech. Rep. report CW197 Dept. of Computer Science K.U.Leuven."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/258734.258801"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/882262.882343"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.5555\/2383654.2383671"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"crossref","unstructured":"Nicodemus F. E. Richmond J. C. Hsia J. J. Ginsberg I. W. and Limperis T. 1977. Geometric Considerations and Nomenclature for Reflectance. Monograph 161 National Bureau of Standards (US) October.  Nicodemus F. E. Richmond J. C. Hsia J. J. Ginsberg I. W. and Limperis T. 1977. Geometric Considerations and Nomenclature for Reflectance. Monograph 161 National Bureau of Standards (US) October.","DOI":"10.6028\/NBS.MONO.160"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVCG.2010.230"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/344779.344812"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"crossref","unstructured":"Rubinstein R. and Kroese D. 2008. Simulation and the Monte Carlo Method. Wiley Series in Probability and Statistics. Wiley.   Rubinstein R. and Kroese D. 2008. Simulation and the Monte Carlo Method. Wiley Series in Probability and Statistics. Wiley.","DOI":"10.1002\/9780470230381"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/218380.218498"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1145\/1321261.1321292"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8659.2011.01890.x"}],"event":{"name":"SCCG'15: Spring Conference on Computer Graphics","sponsor":["SIGGRAPH ACM Special Interest Group on Computer Graphics and Interactive Techniques"],"location":"Smolenice Slovakia","acronym":"SCCG'15"},"container-title":["Proceedings of the 31st Spring Conference on Computer Graphics"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2788539.2788544","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2788539.2788544","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T05:07:45Z","timestamp":1750223265000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2788539.2788544"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4,22]]},"references-count":22,"alternative-id":["10.1145\/2788539.2788544","10.1145\/2788539"],"URL":"https:\/\/doi.org\/10.1145\/2788539.2788544","relation":{},"subject":[],"published":{"date-parts":[[2015,4,22]]},"assertion":[{"value":"2015-04-22","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}