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Storage"],"published-print":{"date-parts":[[2016,6,27]]},"abstract":"<jats:p>To satisfy the explosive growth of data in large-scale data centers, where redundant arrays of independent disks (RAIDs), especially RAID-5, are widely deployed, effective storage scaling and disk expansion methods are desired. However, a way to reduce the data migration overhead and maintain the reliability of the original RAID are major concerns of storage scaling. To address these problems, we propose a new RAID scaling scheme, H-Scale, to achieve fast RAID scaling via hybrid stripe layouts. H-Scale takes advantage of the loose restriction of stripe structures to choose migrated data and to create hybrid stripe structures. The main advantages of our scheme include: (1) dramatically reducing the data migration overhead and thus speeding up the scaling process, (2) maintaining the original RAID\u2019s reliability, (3) balancing the workload among disks after scaling, and (4) providing a general scaling approach for different RAID levels. Our theoretical analysis show that H-Scale outperforms existing scaling solutions in terms of data migration, I\/O overheads, and parity update operations. Evaluation results on a prototype implementation demonstrate that H-Scale speeds up the online scaling process by up to 60% under SPC traces, and similar improvements on scaling time and user response time are also achieved by evaluations using standard benchmarks.<\/jats:p>","DOI":"10.1145\/2822895","type":"journal-article","created":{"date-parts":[[2016,5,2]],"date-time":"2016-05-02T08:16:07Z","timestamp":1462176967000},"page":"1-30","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":6,"title":["H-Scale"],"prefix":"10.1145","volume":"12","author":[{"given":"Jiguang","family":"Wan","sequence":"first","affiliation":[{"name":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Hubei, China"}]},{"given":"Peng","family":"Xu","sequence":"additional","affiliation":[{"name":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Hubei, China"}]},{"given":"Xubin","family":"He","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Virginia Commonwealth University"}]},{"given":"Jibin","family":"Wang","sequence":"additional","affiliation":[{"name":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Hubei, China"}]},{"given":"Junyao","family":"Li","sequence":"additional","affiliation":[{"name":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Hubei, China"}]},{"given":"Changsheng","family":"Xie","sequence":"additional","affiliation":[{"name":"Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Hubei, China"}]}],"member":"320","published-online":{"date-parts":[[2016,4,29]]},"reference":[{"key":"e_1_2_1_1_1","volume-title":"Filed","author":"Anderson Michael H.","year":"2002","unstructured":"Michael H. 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