{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:18:07Z","timestamp":1763468287663,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":44,"publisher":"ACM","license":[{"start":{"date-parts":[[2015,12,5]],"date-time":"2015-12-05T00:00:00Z","timestamp":1449273600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["0954107"],"award-info":[{"award-number":["0954107"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2015,12,5]]},"DOI":"10.1145\/2830772.2830799","type":"proceedings-article","created":{"date-parts":[[2016,1,11]],"date-time":"2016-01-11T13:38:13Z","timestamp":1452519493000},"page":"611-622","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":15,"title":["CLEAN-ECC"],"prefix":"10.1145","author":[{"given":"Seong-Lyong","family":"Gong","sequence":"first","affiliation":[{"name":"ECE, UT Austin"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minsoo","family":"Rhu","sequence":"additional","affiliation":[{"name":"NVIDIA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jungrae","family":"Kim","sequence":"additional","affiliation":[{"name":"ECE, UT Austin"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinsuk","family":"Chung","sequence":"additional","affiliation":[{"name":"ECE, UT Austin"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mattan","family":"Erez","sequence":"additional","affiliation":[{"name":"ECE, UT Austin"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2015,12,5]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000100"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"crossref","unstructured":"D. H. Yoon M. K. Jeong M. B. Sullivan and M. Erez \"The dynamic granularity memory system \" in Proc. of ISCA 2012.   D. H. Yoon M. K. Jeong M. B. Sullivan and M. Erez \"The dynamic granularity memory system \" in Proc. of ISCA 2012.","DOI":"10.1109\/ISCA.2012.6237047"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/2540708.2540717"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555372"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/2150976.2150989"},{"key":"e_1_3_2_1_6_1","first-page":"1","article-title":"A study of dram failures in the field","author":"Sridharan V.","year":"2012","journal-title":"Proc. of SC"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1145\/2503210.2503257"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/2694344.2694348"},{"key":"e_1_3_2_1_9_1","unstructured":"\"BIOS and Kernel Developer's Guide (BKDG) for AMD Family 15h Models 00h-0Fh Processors \" Jan 2013.  \"BIOS and Kernel Developer's Guide (BKDG) for AMD Family 15h Models 00h-0Fh Processors \" Jan 2013."},{"key":"e_1_3_2_1_10_1","unstructured":"\"Intel Xeon Processor E7 Family: Reliability Availability and Serviceability \" 2011.  \"Intel Xeon Processor E7 Family: Reliability Availability and Serviceability \" 2011."},{"key":"e_1_3_2_1_11_1","unstructured":"T. J. Dell \"A white paper on the benefits of chipkill-correct ecc for pc server main memory \" 1997.  T. J. Dell \"A white paper on the benefits of chipkill-correct ecc for pc server main memory \" 1997."},{"key":"e_1_3_2_1_12_1","unstructured":"IBM IBM 3330 data storage.  IBM IBM 3330 data storage."},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/50202.50214"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1147\/sj.71.0015"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/305138.305156"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1145\/1654059.1654102"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/L-CA.2008.13"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"crossref","unstructured":"F. A. Ware and C. Hampel \"Improving power and data efficiency with threaded memory modules \" in Proceedings of the International Conference on Computer Design (ICCD) 2006.  F. A. Ware and C. Hampel \"Improving power and data efficiency with threaded memory modules \" in Proceedings of the International Conference on Computer Design (ICCD) 2006.","DOI":"10.1109\/ICCD.2006.4380850"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2008.4771792"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2010.36"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2013.6522325"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"crossref","unstructured":"S. Li D. H. Yoon K. Chen J. Zhao J. H. Ahn J. B. Brockman Y. Xie and N. P. Jouppi \"Mage: Adaptive granularity and ecc for resilient and power efficient memory systems \" in Proc. of SC 2012.   S. Li D. H. Yoon K. Chen J. Zhao J. H. Ahn J. B. Brockman Y. Xie and N. P. Jouppi \"Mage: Adaptive granularity and ecc for resilient and power efficient memory systems \" in Proc. of SC 2012.","DOI":"10.1109\/SC.2012.73"},{"key":"e_1_3_2_1_23_1","doi-asserted-by":"crossref","unstructured":"J. Kim M. Sullivan and M. Erez \"Bamboo ecc: Strong safe and flexible codes for reliable computer memory \" in Proc. of HPCA Feb. 2015.  J. Kim M. Sullivan and M. Erez \"Bamboo ecc: Strong safe and flexible codes for reliable computer memory \" in Proc. of HPCA Feb. 2015.","DOI":"10.1109\/HPCA.2015.7056025"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1145\/2503210.2503243"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1145\/1736020.1736064"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/2366231.2337192"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/SC.2014.89"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1815983"},{"key":"e_1_3_2_1_29_1","unstructured":"R. Blankenship D. Brzezinski and E. Valverde \"Memory error detection and\/or correction \" Aug. 21 2012. US Patent 8 250 435.  R. Blankenship D. Brzezinski and E. Valverde \"Memory error detection and\/or correction \" Aug. 21 2012. US Patent 8 250 435."},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1007\/BF00929618"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/279358.279404"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2004.10010"},{"key":"e_1_3_2_1_33_1","doi-asserted-by":"publisher","DOI":"10.1145\/2024716.2024718"},{"key":"e_1_3_2_1_34_1","unstructured":"M. K. Jeong D. H. Yoon and M. Erez \"Drsim: A platform for flexible DRAM system research.\" http:\/\/lph.ece.utexas.edu\/public\/DrSim.  M. K. Jeong D. H. Yoon and M. Erez \"Drsim: A platform for flexible DRAM system research.\" http:\/\/lph.ece.utexas.edu\/public\/DrSim."},{"volume-title":"CPU 2006","year":"2006","author":"Standard Performance Evaluation Corporation","key":"e_1_3_2_1_35_1"},{"key":"e_1_3_2_1_36_1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2012.6168944"},{"key":"e_1_3_2_1_37_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2008.44"},{"key":"e_1_3_2_1_38_1","unstructured":"M. Technology \"Calculating memory system power for ddr3 \" Technical Report TN-41-01 2007.  M. Technology \"Calculating memory system power for ddr3 \" Technical Report TN-41-01 2007."},{"key":"e_1_3_2_1_39_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"e_1_3_2_1_40_1","doi-asserted-by":"publisher","DOI":"10.1145\/339647.339668"},{"key":"e_1_3_2_1_41_1","unstructured":"Micron Corp. Micron 1 Gb \u00d74 \u00d78 \u00d716 DDR3 SDRAM: MT41J256M4 MT41J128M8 and MT41J64M16 2006.  Micron Corp. Micron 1 Gb \u00d74 \u00d78 \u00d716 DDR3 SDRAM: MT41J256M4 MT41J128M8 and MT41J64M16 2006."},{"key":"e_1_3_2_1_42_1","unstructured":"D. Roberts and P. Nair \"FAULTSIM: A fast configurable memory-resilience simulator \" in The Memory Forum: In conjunction with ISCA vol. 41.  D. Roberts and P. Nair \"FAULTSIM: A fast configurable memory-resilience simulator \" in The Memory Forum: In conjunction with ISCA vol. 41."},{"key":"e_1_3_2_1_43_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065034"},{"key":"e_1_3_2_1_44_1","unstructured":"\"FreePDK45.\" http:\/\/www.eda.ncsu.edu\/wiki\/FreePDK45:Contents 2006.  \"FreePDK45.\" http:\/\/www.eda.ncsu.edu\/wiki\/FreePDK45:Contents 2006."}],"event":{"name":"MICRO-48: The 48th Annual IEEE\/ACM International Symposium of Microarchitecture","sponsor":["IEEE Computer Society TC-uARCH","SIGMICRO ACM Special Interest Group on Microarchitectural Research and Processing"],"location":"Waikiki Hawaii","acronym":"MICRO-48"},"container-title":["Proceedings of the 48th International Symposium on Microarchitecture"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2830772.2830799","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2830772.2830799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T05:48:40Z","timestamp":1750225720000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2830772.2830799"}},"subtitle":["high reliability ECC for adaptive granularity memory system"],"short-title":[],"issued":{"date-parts":[[2015,12,5]]},"references-count":44,"alternative-id":["10.1145\/2830772.2830799","10.1145\/2830772"],"URL":"https:\/\/doi.org\/10.1145\/2830772.2830799","relation":{},"subject":[],"published":{"date-parts":[[2015,12,5]]},"assertion":[{"value":"2015-12-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}