{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,12]],"date-time":"2025-09-12T18:50:33Z","timestamp":1757703033685,"version":"3.41.0"},"reference-count":25,"publisher":"Association for Computing Machinery (ACM)","issue":"1","license":[{"start":{"date-parts":[[2016,11,30]],"date-time":"2016-11-30T00:00:00Z","timestamp":1480464000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"ANR LIESSE","award":["ANR-12-INSE-0008-01"],"award-info":[{"award-number":["ANR-12-INSE-0008-01"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["J. Emerg. Technol. Comput. Syst."],"published-print":{"date-parts":[[2017,1,31]]},"abstract":"<jats:p>The development of cryptographic devices was followed by the development of so-called implementation attacks, which are intended to retrieve secret information exploiting the hardware itself. Among these attacks, fault attacks can be used to disturb the circuit while performing a computation to retrieve the secret. Among possible means of injecting a fault, laser beams have proven to be accurate and powerful. The laser can be used to illuminate the circuit either from its frontside (i.e., where metal interconnections are first encountered) or from the backside (i.e., through the substrate). Historically, frontside injection was preferred because it does not require the die to be thinned. Nevertheless, due to the increasing integration of metal layers in modern technologies, frontside injections do not allow targeting of any desired location. Indeed, metal lines act as mirrors, and they reflect and refract most of the energy provided by the laser beam. Conversely, backside injections, although more difficult to set up, allow an increase of the resolution of the target location and remove the drawbacks of the frontside technique. This article compares experimental results from frontside and backside fault injections. The effectiveness of the two techniques is measured in terms of exploitable errors on an AES circuit (i.e., errors that can be used to extract the value of the secret key used during the encryption process). We will show, conversely to what is generally assumed, that frontside injection can provide even better results compared to backside injection, especially for low-cost beams with a large laser spot.<\/jats:p>","DOI":"10.1145\/2845999","type":"journal-article","created":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T19:13:10Z","timestamp":1480619590000},"page":"1-15","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Frontside Versus Backside Laser Injection"],"prefix":"10.1145","volume":"13","author":[{"given":"Stephan De","family":"Castro","sequence":"first","affiliation":[{"name":"LIRMM, Montpellier Cedex France"}]},{"given":"Jean-Max","family":"Dutertre","sequence":"additional","affiliation":[{"name":"ENSMSE, LSAS, CMP Gardanne"}]},{"given":"Bruno","family":"Rouzeyre","sequence":"additional","affiliation":[{"name":"LIRMM, Montpellier Cedex France"}]},{"given":"Giorgio Di","family":"Natale","sequence":"additional","affiliation":[{"name":"LIRMM, Montpellier Cedex France"}]},{"given":"Marie-Lise","family":"Flottes","sequence":"additional","affiliation":[{"name":"LIRMM, Montpellier Cedex France"}]}],"member":"320","published-online":{"date-parts":[[2016,11,30]]},"reference":[{"key":"e_1_2_1_1_1","volume-title":"Retrieved","author":"AES.","year":"2001","unstructured":"AES. 2001 . Federal Information Processing Standards Publication 197 . Retrieved October 26, 2016, from http:\/\/csrc.nist.gov\/publications\/fips\/fips197\/fips-197.pdf. AES. 2001. Federal Information Processing Standards Publication 197. Retrieved October 26, 2016, from http:\/\/csrc.nist.gov\/publications\/fips\/fips197\/fips-197.pdf."},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2011.10"},{"key":"e_1_2_1_3_1","volume-title":"Retrieved","author":"Ali Subidh","year":"2010","unstructured":"Subidh Ali , Debdeep Mukhopadhyay , and Michael Tunstall . 2010 . Differential Fault Analysis of AES Using a Single Multiple-Byte Fault . Retrieved October 26, 2016, from https:\/\/eprint.iacr.org\/2010\/636.pdf. Subidh Ali, Debdeep Mukhopadhyay, and Michael Tunstall. 2010. Differential Fault Analysis of AES Using a Single Multiple-Byte Fault. Retrieved October 26, 2016, from https:\/\/eprint.iacr.org\/2010\/636.pdf."},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.5555\/646762.706179"},{"key":"e_1_2_1_5_1","series-title":"Lecture Notes in Computer Science","volume-title":"Financial Cryptography","author":"Blomer Johannes","unstructured":"Johannes Blomer and Jean-Pierre Seifert . 2003. Fault based cryptanalysis of the Advanced Encryption Standard (AES) . In Financial Cryptography . Lecture Notes in Computer Science , Vol. 2742 . Springer , 162--181. Johannes Blomer and Jean-Pierre Seifert. 2003. Fault based cryptanalysis of the Advanced Encryption Standard (AES). In Financial Cryptography. Lecture Notes in Computer Science, Vol. 2742. Springer, 162--181."},{"key":"e_1_2_1_6_1","volume-title":"Lipton","author":"Boneh Dan","year":"1997","unstructured":"Dan Boneh , Richard A. DeMillo , and Richard J . Lipton . 1997 . On the importance of checking cryptographic protocols for faults. 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National Aeronautics and Space Administration Office of Management Scientific and Technical Information Division. http:\/\/books.google.fr\/books?id&equals;5WaXdXV4wnMC."},{"key":"e_1_2_1_8_1","series-title":"Lecture Notes in Computer Science","volume-title":"Information Security and Privacy","author":"Chien-Ning Chen","unstructured":"Chen Chien-Ning and Yen Sung-Ming . 2003. Differential fault analysis on AES key schedule and some countermeasures . In Information Security and Privacy . Lecture Notes in Computer Science , Vol. 2727 . Springer , 118--129. Chen Chien-Ning and Yen Sung-Ming. 2003. Differential fault analysis on AES key schedule and some countermeasures. In Information Security and Privacy. Lecture Notes in Computer Science, Vol. 2727. Springer, 118--129."},{"key":"e_1_2_1_9_1","volume-title":"Proceedings of the 2nd International Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC\u201905)","author":"Choukri Hamid","year":"2005","unstructured":"Hamid Choukri and Michael Tunstall . 2005 . Round reduction using faults . In Proceedings of the 2nd International Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC\u201905) . 13--24. Hamid Choukri and Michael Tunstall. 2005. Round reduction using faults. In Proceedings of the 2nd International Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC\u201905). 13--24."},{"volume-title":"Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST\u201914)","author":"Courbon F.","key":"e_1_2_1_10_1","unstructured":"F. Courbon , P. Loubet-Moundi , J. J. A. Fournier , and A. Tria . 2014. Increasing the efficiency of laser fault injections using fast gate level reverse engineering . In Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST\u201914) . 60--63. F. Courbon, P. Loubet-Moundi, J. J. A. Fournier, and A. Tria. 2014. Increasing the efficiency of laser fault injections using fast gate level reverse engineering. In Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST\u201914). 60--63."},{"key":"e_1_2_1_11_1","series-title":"Lecture Notes in Computer Science","volume-title":"Applied Cryptography and Network Security","author":"Dusart Pierre","unstructured":"Pierre Dusart , Gilles Letourneux , and Olivier Vivolo . 2003. Differential fault analysis on A.E.S . In Applied Cryptography and Network Security . Lecture Notes in Computer Science , Vol. 2846 . Springer , 293--306. Pierre Dusart, Gilles Letourneux, and Olivier Vivolo. 2003. Differential fault analysis on A.E.S. In Applied Cryptography and Network Security. Lecture Notes in Computer Science, Vol. 2846. 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