{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:11:29Z","timestamp":1750306289647,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,5,18]],"date-time":"2016-05-18T00:00:00Z","timestamp":1463529600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"European Commission","award":["FP7-612069-HARPA"],"award-info":[{"award-number":["FP7-612069-HARPA"]}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,5,18]]},"DOI":"10.1145\/2902961.2902992","type":"proceedings-article","created":{"date-parts":[[2016,5,13]],"date-time":"2016-05-13T18:21:10Z","timestamp":1463163670000},"page":"373-376","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":8,"title":["Capturing True Workload Dependency of BTI-induced Degradation in CPU Components"],"prefix":"10.1145","author":[{"given":"Dimitrios","family":"Stamoulis","sequence":"first","affiliation":[{"name":"McGill University, Montreal, PQ, Canada"}]},{"given":"Simone","family":"Corbetta","sequence":"additional","affiliation":[{"name":"imec vzw, Leuven, Belgium"}]},{"given":"Dimitrios","family":"Rodopoulos","sequence":"additional","affiliation":[{"name":"National Technical University of Athens, Athens, Greece"}]},{"given":"Pieter","family":"Weckx","sequence":"additional","affiliation":[{"name":"imec vzw, Leuven, Belgium"}]},{"given":"Peter","family":"Debacker","sequence":"additional","affiliation":[{"name":"imec vzw, Leuven, Belgium"}]},{"given":"Brett H.","family":"Meyer","sequence":"additional","affiliation":[{"name":"McGill University, Montreal, PQ, Canada"}]},{"given":"Ben","family":"Kaczer","sequence":"additional","affiliation":[{"name":"imec vzw, Leuven, Belgium"}]},{"given":"Praveen","family":"Raghavan","sequence":"additional","affiliation":[{"name":"imec vzw, Leuven, Belgium"}]},{"given":"Dimitrios","family":"Soudris","sequence":"additional","affiliation":[{"name":"National Technical University of Athens, Athens, Greece"}]},{"given":"Francky","family":"Catthoor","sequence":"additional","affiliation":[{"name":"imec vzw, Leuven, Belgium"}]},{"given":"Zeljko","family":"Zilic","sequence":"additional","affiliation":[{"name":"McGill University, Montreal, PQ, Canada"}]}],"member":"320","published-online":{"date-parts":[[2016,5,18]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488856"},{"key":"e_1_3_2_1_2_1","first-page":"3.1","volume-title":"IEEE IRPS","author":"Kaczer B.","unstructured":"B. Kaczer Atomistic approach to variability of bias-temperature instability in circuit simulations . In IEEE IRPS , pages XT. 3.1 --XT.3.5, April 2011. B. Kaczer et al. Atomistic approach to variability of bias-temperature instability in circuit simulations. In IEEE IRPS, pages XT.3.1--XT.3.5, April 2011."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2011.5783193"},{"issue":"2","key":"e_1_3_2_1_4_1","first-page":"704","article-title":"Atomistic pseudo-transient BTI simulation with inherent workload memory","volume":"14","author":"Rodopoulos D.","year":"2014","unstructured":"D. Rodopoulos Atomistic pseudo-transient BTI simulation with inherent workload memory . IEEE TDMR , 14 ( 2 ): 704 -- 714 , June 2014 . D. Rodopoulos et al. Atomistic pseudo-transient BTI simulation with inherent workload memory. IEEE TDMR, 14(2):704--714, June 2014.","journal-title":"IEEE TDMR"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2014.6838587"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/2742060.2742079"},{"key":"e_1_3_2_1_7_1","first-page":"2.1","volume-title":"IEEE IRPS","author":"Fang J.","unstructured":"J. Fang and S. Sapatnekar . Understanding the impact of transistor-level BTI variability . In IEEE IRPS , pages CR. 2.1 --CR.2.6, Apr. 2012. J. Fang and S. Sapatnekar. Understanding the impact of transistor-level BTI variability. In IEEE IRPS, pages CR.2.1--CR.2.6, Apr. 2012."},{"issue":"1","key":"e_1_3_2_1_8_1","first-page":"182","article-title":"Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates","volume":"14","author":"Kukner H.","year":"2014","unstructured":"H. Kukner Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates . IEEE TDMR , 14 ( 1 ): 182 -- 193 , Mar. 2014 . H. Kukner et al. Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates. IEEE TDMR, 14(1):182--193, Mar. 2014.","journal-title":"IEEE TDMR"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783362"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488858"},{"key":"e_1_3_2_1_11_1","volume-title":"WCET 2010, 2010","author":"Gustafsson J.","year":"2010","unstructured":"J. Gustafsson The m\u00e4lardalen WCET benchmarks: Past, present and future . In WCET 2010, 2010 , Brussels, Belgium, pages 136--146 , 2010 . J. Gustafsson et al. The m\u00e4lardalen WCET benchmarks: Past, present and future. In WCET 2010, 2010, Brussels, Belgium, pages 136--146, 2010."},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.893809"},{"key":"e_1_3_2_1_13_1","unstructured":"OpenSPARC Oracle. http:\/\/www.oracle.com. OpenSPARC Oracle. http:\/\/www.oracle.com."},{"key":"e_1_3_2_1_14_1","first-page":"3A","volume-title":"IEEE IRPS","author":"P.","unstructured":"P. Weckx P. et al. Defect-based methodology for workload-dependent circuit lifetime projections - Application to SRAM . In IEEE IRPS , pages 3A .4.1--3A.4.7, Apr. 2013. P. Weckx P. et al. Defect-based methodology for workload-dependent circuit lifetime projections - Application to SRAM. In IEEE IRPS, pages 3A.4.1--3A.4.7, Apr. 2013."},{"key":"e_1_3_2_1_15_1","first-page":"5D","volume-title":"IEEE IRPS","author":"Weckx P.","unstructured":"P. Weckx Non-monte-carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation -- application to 6t SRAM . In IEEE IRPS , pages 5D .2.1--5D.2.6, 2014. P. Weckx et al. Non-monte-carlo methodology for high-sigma simulations of circuits under workload-dependent BTI degradation -- application to 6t SRAM. In IEEE IRPS, pages 5D.2.1--5D.2.6, 2014."},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4614-4078-9","volume-title":"Circuit Design for Reliability","author":"Reis Y.","year":"2015","unstructured":"Y. Reis , Ricardo; Cao and G. Wirth , editors . Circuit Design for Reliability . Springer , 2015 . Y. Reis, Ricardo; Cao and G. Wirth, editors. Circuit Design for Reliability. Springer, 2015."},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131624"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"}],"event":{"name":"GLSVLSI '16: Great Lakes Symposium on VLSI 2016","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA","IEEE CASS"],"location":"Boston Massachusetts USA","acronym":"GLSVLSI '16"},"container-title":["Proceedings of the 26th edition on Great Lakes Symposium on VLSI"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2902961.2902992","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2902961.2902992","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:39:03Z","timestamp":1750221543000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2902961.2902992"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5,18]]},"references-count":18,"alternative-id":["10.1145\/2902961.2902992","10.1145\/2902961"],"URL":"https:\/\/doi.org\/10.1145\/2902961.2902992","relation":{},"subject":[],"published":{"date-parts":[[2016,5,18]]},"assertion":[{"value":"2016-05-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}