{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T18:44:33Z","timestamp":1771699473959,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,5,18]],"date-time":"2016-05-18T00:00:00Z","timestamp":1463529600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,5,18]]},"DOI":"10.1145\/2902961.2903018","type":"proceedings-article","created":{"date-parts":[[2016,5,13]],"date-time":"2016-05-13T18:21:10Z","timestamp":1463163670000},"page":"51-56","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":7,"title":["Parameter-importance based Monte-Carlo Technique for Variation-aware Analog Yield Optimization"],"prefix":"10.1145","author":[{"given":"Sita","family":"kondamadugula","sequence":"first","affiliation":[{"name":"International Institute of Information Technology,Bangalore, Bangalore, India"}]},{"given":"Srinath R.","family":"Naidu","sequence":"additional","affiliation":[{"name":"International Institute of Information Technology,Bangalore, Bangalore, India"}]}],"member":"320","published-online":{"date-parts":[[2016,5,18]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1987.1270292"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.905671"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.5555\/1131481.1131586"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.1999.759983"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156492000059"},{"issue":"3","key":"e_1_3_2_1_7_1","first-page":"323","article-title":"An efficient, accurate method for estimating and optimizing parametric yield {ic manufacture}. Solid-State Circuits","volume":"29","author":"Elias Norman J","year":"1994","unstructured":"Norman J Elias . Acceptance sampling : An efficient, accurate method for estimating and optimizing parametric yield {ic manufacture}. Solid-State Circuits , IEEE Journal of , 29 ( 3 ): 323 -- 327 , 1994 . Norman J Elias. Acceptance sampling: An efficient, accurate method for estimating and optimizing parametric yield {ic manufacture}. Solid-State Circuits, IEEE Journal of, 29(3):323--327, 1994.","journal-title":"IEEE Journal of"},{"issue":"7","key":"e_1_3_2_1_8_1","first-page":"778","article-title":"Yield optimizationof analog ics using two-step analytic modeling methods. Solid-State Circuits","volume":"28","author":"Guardiani Carlo","year":"1993","unstructured":"Carlo Guardiani , Primo Scandolara , Jacques Benkoski , and Germano Nicollini . Yield optimizationof analog ics using two-step analytic modeling methods. Solid-State Circuits , IEEE Journal of , 28 ( 7 ): 778 -- 783 , 1993 . Carlo Guardiani, Primo Scandolara, Jacques Benkoski, and Germano Nicollini. Yield optimizationof analog ics using two-step analytic modeling methods. Solid-State Circuits, IEEE Journal of, 28(7):778--783, 1993.","journal-title":"IEEE Journal of"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882513"},{"key":"e_1_3_2_1_10_1","first-page":"267","volume-title":"ICECS 2009. 16th IEEE International Conference on","author":"Liu Bo","year":"2009","unstructured":"Bo Liu , Francisco V Fern\u00e1ndez , Dimitri De Jonghe , and Georges Gielen . Less expensive and high quality stopping criteria for mc-based analog ic yield optimization. In Electronics, Circuits, and Systems, 2009 . ICECS 2009. 16th IEEE International Conference on , pages 267 -- 270 . IEEE, 2009 . Bo Liu, Francisco V Fern\u00e1ndez, Dimitri De Jonghe, and Georges Gielen. Less expensive and high quality stopping criteria for mc-based analog ic yield optimization. In Electronics, Circuits, and Systems, 2009. ICECS 2009. 16th IEEE International Conference on, pages 267--270. IEEE, 2009."},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2106850"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.905672"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.147"},{"issue":"1","key":"e_1_3_2_1_14_1","first-page":"77","article-title":"Statistical approach for yield optimization for minimum energy operation in subthreshold circuits considering variability issues. Semiconductor Manufacturing","volume":"23","author":"Khan Nomani Md Waliullah","year":"2010","unstructured":"Md Waliullah Khan Nomani , Mohab Anis , and Goutam Koley . Statistical approach for yield optimization for minimum energy operation in subthreshold circuits considering variability issues. Semiconductor Manufacturing , IEEE Transactions on , 23 ( 1 ): 77 -- 86 , 2010 .. Md Waliullah Khan Nomani, Mohab Anis, and Goutam Koley. Statistical approach for yield optimization for minimum energy operation in subthreshold circuits considering variability issues. Semiconductor Manufacturing, IEEE Transactions on, 23(1):77--86, 2010..","journal-title":"IEEE Transactions on"},{"key":"e_1_3_2_1_15_1","volume-title":"Analog circuit sizing using adaptive worst-case parameter sets. In date, page 0581","author":"Schwencker Robert","year":"2002","unstructured":"Robert Schwencker , Frank Schenkel , Michael Pronath , and H Graeb . Analog circuit sizing using adaptive worst-case parameter sets. In date, page 0581 . IEEE , 2002 . Robert Schwencker, Frank Schenkel, Michael Pronath, and H Graeb. Analog circuit sizing using adaptive worst-case parameter sets. In date, page 0581. IEEE, 2002."},{"key":"e_1_3_2_1_16_1","volume-title":"Geometric random walks: a survey. Combinatorial and computational geometry, 52(573--612):2","author":"Vempala Santosh","year":"2005","unstructured":"Santosh Vempala . Geometric random walks: a survey. Combinatorial and computational geometry, 52(573--612):2 , 2005 . Santosh Vempala. Geometric random walks: a survey. Combinatorial and computational geometry, 52(573--612):2, 2005."}],"event":{"name":"GLSVLSI '16: Great Lakes Symposium on VLSI 2016","location":"Boston Massachusetts USA","acronym":"GLSVLSI '16","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA","IEEE CASS"]},"container-title":["Proceedings of the 26th edition on Great Lakes Symposium on VLSI"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2902961.2903018","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2902961.2903018","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:39:03Z","timestamp":1750221543000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2902961.2903018"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5,18]]},"references-count":16,"alternative-id":["10.1145\/2902961.2903018","10.1145\/2902961"],"URL":"https:\/\/doi.org\/10.1145\/2902961.2903018","relation":{},"subject":[],"published":{"date-parts":[[2016,5,18]]},"assertion":[{"value":"2016-05-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}