{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:11:29Z","timestamp":1750306289881,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,5,18]],"date-time":"2016-05-18T00:00:00Z","timestamp":1463529600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"Semiconductor Research Corporation"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,5,18]]},"DOI":"10.1145\/2902961.2903040","type":"proceedings-article","created":{"date-parts":[[2016,5,13]],"date-time":"2016-05-13T18:21:10Z","timestamp":1463163670000},"page":"185-189","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":7,"title":["Tracking Data Flow at Gate-Level through Structural Checking"],"prefix":"10.1145","author":[{"given":"Thao","family":"Le","sequence":"first","affiliation":[{"name":"University of Arkansas, Fayetteville, AR, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jia","family":"Di","sequence":"additional","affiliation":[{"name":"University of Arkansas, Fayetteville, AR, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[{"name":"University of Florida, Gainesville, FL, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Domenic","family":"Forte","sequence":"additional","affiliation":[{"name":"University of Florida, Gainesville, FL, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lei","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Connecticut, Storrs, CT, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2016,5,18]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.7"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1166\/jcies.2012.1029"},{"key":"e_1_3_2_1_3_1","volume-title":"2013 Government Microcircuit Applications & Critical Technology Conference (GOMACTech)","author":"Hinds M.","year":"2013","unstructured":"M. Hinds , J. Brady and J. Di . Signal Assets - a Useful Concept for Abstracting Circuit Functionality . In 2013 Government Microcircuit Applications & Critical Technology Conference (GOMACTech) , 2013 . M. Hinds, J. Brady and J. Di. Signal Assets - a Useful Concept for Abstracting Circuit Functionality. In 2013 Government Microcircuit Applications & Critical Technology Conference (GOMACTech), 2013."},{"key":"e_1_3_2_1_4_1","volume-title":"Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on. ().","author":"Tehranipoor H.","year":"2013","unstructured":"Salmani, H. and Tehranipoor , M . Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level . In Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on. (). , 2013 , 190--195. Salmani, H. and Tehranipoor, M. Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level. In Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2013 IEEE International Symposium on. ()., 2013, 190--195."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2354293"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.5555\/2561828.2561931"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2011.2164908"},{"key":"e_1_3_2_1_8_1","first-page":"4","article-title":"Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. In Very Large Scale Integration (VLSI) Systems","volume":"23","author":"Plusquellic C.","year":"2015","unstructured":"Saqib, F., Ismari, D., Lamech, C. and Plusquellic , J . Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. In Very Large Scale Integration (VLSI) Systems , IEEE Transactions on , 23 , 4 ( 2015 ), 776--780. DOI=10.1109\/TVLSI.2014.2318307. Saqib, F., Ismari, D., Lamech, C. and Plusquellic, J. Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. In Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, 23, 4 (2015), 776--780. DOI=10.1109\/TVLSI.2014.2318307.","journal-title":"IEEE Transactions on"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/1814217.1814225"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/2676548"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1394608.1382156"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1378533.1378538"},{"key":"e_1_3_2_1_13_1","unstructured":"http:\/\/opencores.org  http:\/\/opencores.org"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOM.2012.6503599"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2013.2245155"}],"event":{"name":"GLSVLSI '16: Great Lakes Symposium on VLSI 2016","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CEDA","IEEE CASS"],"location":"Boston Massachusetts USA","acronym":"GLSVLSI '16"},"container-title":["Proceedings of the 26th edition on Great Lakes Symposium on VLSI"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2902961.2903040","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2902961.2903040","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:39:04Z","timestamp":1750221544000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2902961.2903040"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5,18]]},"references-count":15,"alternative-id":["10.1145\/2902961.2903040","10.1145\/2902961"],"URL":"https:\/\/doi.org\/10.1145\/2902961.2903040","relation":{},"subject":[],"published":{"date-parts":[[2016,5,18]]},"assertion":[{"value":"2016-05-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}