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The RF\/analog performance evaluation has been carried out using the ATLAS 3D device simulator in terms of evaluation of figure-of-merits metrics such as transconductance (g\n            <jats:sub>m<\/jats:sub>\n            ), gate-to-source\/drain capacitances (C\n            <jats:sub>gg<\/jats:sub>\n            ), cutoff frequency (f\n            <jats:sub>T<\/jats:sub>\n            ), and maximum frequency of oscillation (f\n            <jats:sub>max<\/jats:sub>\n            ). Apart from RF\/analog performance investigation, the variation of ON-current to OFF-current ratio (I\n            <jats:sub>ON<\/jats:sub>\n            \/I\n            <jats:sub>OFF<\/jats:sub>\n            ) and transconductance generation factor (g\n            <jats:sub>m<\/jats:sub>\n            \/I\n            <jats:sub>ds<\/jats:sub>\n            ) have also been carried out. From this study, it is observed that smaller fin width of the device improves its performance.\n          <\/jats:p>","DOI":"10.1145\/2903143","type":"journal-article","created":{"date-parts":[[2016,5,16]],"date-time":"2016-05-16T12:27:17Z","timestamp":1463401637000},"page":"1-12","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":26,"title":["Impact of Fin Width Scaling on RF\/Analog Performance of Junctionless Accumulation-Mode Bulk FinFET"],"prefix":"10.1145","volume":"12","author":[{"given":"Kalyan","family":"Biswas","sequence":"first","affiliation":[{"name":"MCKV Institute of Engineering, Liluah, WB, India"}]},{"given":"Angsuman","family":"Sarkar","sequence":"additional","affiliation":[{"name":"Kalyani Government Engineering College, Kalyani, WB, India"}]},{"given":"Chandan Kumar","family":"Sarkar","sequence":"additional","affiliation":[{"name":"Jadavpur University, Kolkata, WB, India"}]}],"member":"320","published-online":{"date-parts":[[2016,5,13]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.09.015"},{"key":"e_1_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2292852"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2009.12.013"},{"key":"e_1_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.81630"},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2364093"},{"key":"e_1_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2010.2093506"},{"key":"e_1_2_1_7_1","doi-asserted-by":"crossref","unstructured":"J. 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