{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,26]],"date-time":"2026-09-26T21:06:58Z","timestamp":1790456818973,"version":"4.1.0"},"publisher-location":"New York, NY, USA","reference-count":33,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,9,8]],"date-time":"2016-09-08T00:00:00Z","timestamp":1473292800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100000266","name":"Engineering and Physical Sciences Research Council","doi-asserted-by":"publisher","award":["EP\/L011751\/1"],"award-info":[{"award-number":["EP\/L011751\/1"]}],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,9,8]]},"DOI":"10.1145\/2961111.2962620","type":"proceedings-article","created":{"date-parts":[[2016,9,21]],"date-time":"2016-09-21T12:42:53Z","timestamp":1474461773000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":21,"title":["So You Need More Method Level Datasets for Your Software Defect Prediction?"],"prefix":"10.1145","author":[{"given":"Thomas","family":"Shippey","sequence":"first","affiliation":[{"name":"Computer Science, Brunel University London, Uxbridge, United Kingdon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tracy","family":"Hall","sequence":"additional","affiliation":[{"name":"Computer Science, Brunel University London, Uxbridge, United Kingdon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Steve","family":"Counsell","sequence":"additional","affiliation":[{"name":"Computer Science, Brunel University London, Uxbridge, United Kingdon"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Bowes","sequence":"additional","affiliation":[{"name":"Science and Technology Research Institute, University of Hertfordshire, Hatfield, United Kingdom"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"320","published-online":{"date-parts":[[2016,9,8]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595716"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1882291.1882352"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-013-0129-8"},{"key":"e_1_3_2_1_4_1","first-page":"408","volume-title":"Software Engineering, 2003. Proceedings. 25th International Conference on","author":"Cubranic D.","unstructured":"D. Cubranic and G. Murphy . Hipikat: recommending pertinent software development artifacts . In Software Engineering, 2003. Proceedings. 25th International Conference on , pages 408 -- 418 . D. Cubranic and G. Murphy. Hipikat: recommending pertinent software development artifacts. In Software Engineering, 2003. Proceedings. 25th International Conference on, pages 408--418."},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.5555\/2486788.2486844"},{"key":"e_1_3_2_1_6_1","first-page":"23","volume-title":"Software Maintenance, 2003. Proceedings. International Conference on","author":"Fischer M.","unstructured":"M. Fischer , M. Pinzger , and H. Gall . Populating a release history database from version control and bug tracking systems . In Software Maintenance, 2003. Proceedings. International Conference on , pages 23 -- 32 . M. Fischer, M. Pinzger, and H. Gall. Populating a release history database from version control and bug tracking systems. In Software Maintenance, 2003. Proceedings. International Conference on, pages 23--32."},{"key":"e_1_3_2_1_7_1","first-page":"23","volume-title":"Proceedings of the International Conference on Software Maintenance","author":"Fischer M.","unstructured":"M. Fischer , M. Pinzger , and H. Gall . Populating a release history database from version control and bug tracking systems . In Proceedings of the International Conference on Software Maintenance , pages 23 --, Washington, DC, USA, 2003. IEEE Computer Society. M. Fischer, M. Pinzger, and H. Gall. Populating a release history database from version control and bug tracking systems. In Proceedings of the International Conference on Software Maintenance, pages 23--, Washington, DC, USA, 2003. IEEE Computer Society."},{"key":"e_1_3_2_1_8_1","first-page":"96","volume-title":"15th Annual Conference on","author":"Gray D.","unstructured":"D. Gray , D. Bowes , N. Davey , Y. Sun , and B. Christianson . The misuse of the nasa metrics data program data sets for automated software defect prediction. In Evaluation Assessment in Software Engineering (EASE 2011) , 15th Annual Conference on , pages 96 -- 103 . D. Gray, D. Bowes, N. Davey, Y. Sun, and B. Christianson. The misuse of the nasa metrics data program data sets for automated software defect prediction. In Evaluation Assessment in Software Engineering (EASE 2011), 15th Annual Conference on, pages 96--103."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-sen.2011.0132"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.103"},{"key":"e_1_3_2_1_11_1","first-page":"1","volume-title":"IEEE standard classification for software anomalies","author":"IEEE.","year":"2009","unstructured":"IEEE. IEEE standard classification for software anomalies . IEEE Std 1044- 2009 (Revision of IEEE Std 1044-1993), pages 1 -- 23 , 2010. IEEE. IEEE standard classification for software anomalies. IEEE Std 1044-2009 (Revision of IEEE Std 1044-1993), pages 1--23, 2010."},{"issue":"1","key":"e_1_3_2_1_12_1","first-page":"86","article-title":"Significance of different software metrics in defect prediction","volume":"1","author":"Jureczko M.","year":"2011","unstructured":"M. Jureczko . Significance of different software metrics in defect prediction . Software Engineering: An International Journal , 1 ( 1 ): 86 -- 95 , 2011 . M. Jureczko. Significance of different software metrics in defect prediction. Software Engineering: An International Journal, 1(1):86--95, 2011.","journal-title":"Software Engineering: An International Journal"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2016.56"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACIT-CSI.2015.104"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2006.23"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2007.66"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985859"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2015.73"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/1370750.1370762"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.5555\/2820282.2820290"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.09.001"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.5555\/1890580.1890593"},{"key":"e_1_3_2_1_23_1","volume-title":"The promise repository of empirical software engineering data","author":"Menzies T.","year":"2015","unstructured":"T. Menzies , R. Krishna , and D. Pryor . The promise repository of empirical software engineering data , 2015 . URL http:\/\/openscience.us\/repo. T. Menzies, R. Krishna, and D. Pryor. The promise repository of empirical software engineering data, 2015. URL http:\/\/openscience.us\/repo."},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1145\/1062455.1062514"},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2010.25"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.1145\/2393596.2393671"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/2915970.2916007"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2013.11"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/1082983.1083147"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884857"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1145\/1390817.1390826"},{"key":"e_1_3_2_1_32_1","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025120"},{"key":"e_1_3_2_1_34_1","doi-asserted-by":"publisher","DOI":"10.1109\/PROMISE.2007.10"}],"event":{"name":"ESEM '16: ACM\/IEEE 9th International Symposium on Empirical Software Engineering and Measurement","location":"Ciudad Real Spain","acronym":"ESEM '16","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","IEEE CS"]},"container-title":["Proceedings of the 10th ACM\/IEEE International Symposium on Empirical Software Engineering and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2961111.2962620","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2961111.2962620","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T03:39:35Z","timestamp":1750217975000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2961111.2962620"}},"subtitle":["Voil\u00e0!"],"short-title":[],"issued":{"date-parts":[[2016,9,8]]},"references-count":33,"alternative-id":["10.1145\/2961111.2962620","10.1145\/2961111"],"URL":"https:\/\/doi.org\/10.1145\/2961111.2962620","relation":{},"subject":[],"published":{"date-parts":[[2016,9,8]]},"assertion":[{"value":"2016-09-08","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}