{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T17:09:10Z","timestamp":1773248950920,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":10,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,11,7]],"date-time":"2016-11-07T00:00:00Z","timestamp":1478476800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,11,7]]},"DOI":"10.1145\/2966986.2966999","type":"proceedings-article","created":{"date-parts":[[2016,10,18]],"date-time":"2016-10-18T12:23:59Z","timestamp":1476793439000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":5,"title":["An efficient and accurate algorithm for computing RC current response with applications to EM reliability evaluation"],"prefix":"10.1145","author":[{"given":"Zhong","family":"Guan","sequence":"first","affiliation":[{"name":"UC Santa Barbara"}]},{"given":"Malgorzata","family":"Marek-Sadowska","sequence":"additional","affiliation":[{"name":"UC Santa Barbara"}]}],"member":"320","published-online":{"date-parts":[[2016,11,7]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"crossref","unstructured":"K.D. Lee \"Electromigration Recovery and Short Lead Effect under Bipolar- and Unipolar-Pulse Current \" IRPS June 2012","DOI":"10.1109\/IRPS.2012.6241869"},{"key":"e_1_3_2_1_3_1","volume-title":"May","author":"Guan Z.","year":"2014","unstructured":"Z. Guan, M. Marek-Sadowska, S. Nassif and B. Li, \"Atomic Flux Divergence Based Current Conversion Scheme for Signal Line Electromigration Reliability Assessment,\" IITC, May 2014."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.712097"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.150"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2005.17"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.331409"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2160882"},{"key":"e_1_3_2_1_9_1","first-page":"99","article-title":"A Fast and Retargetable Framework for Logic-IP-Internal Electromigration Assessment Comprehending Advanced Waveform Effects","author":"Jain P.","year":"2016","unstructured":"P. Jain, J. Cortadella, and S. S. Sapatnekar, \"A Fast and Retargetable Framework for Logic-IP-Internal Electromigration Assessment Comprehending Advanced Waveform Effects,\" IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. PP, Issue: 99, Jan. 2016.","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"crossref","unstructured":"Z. Guan M. Marek-Sadowska \"AFD-Based Method for Signal Line EM Reliability Evaluation \" ISQED March 2016.","DOI":"10.1109\/ISQED.2016.7479241"}],"event":{"name":"ICCAD '16: IEEE\/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN","location":"Austin Texas","acronym":"ICCAD '16","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE CS","IEEE-EDS Electronic Devices Society"]},"container-title":["Proceedings of the 35th International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2966999","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2966986.2966999","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:55:53Z","timestamp":1750222553000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2966999"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,7]]},"references-count":10,"alternative-id":["10.1145\/2966986.2966999","10.1145\/2966986"],"URL":"https:\/\/doi.org\/10.1145\/2966986.2966999","relation":{},"subject":[],"published":{"date-parts":[[2016,11,7]]},"assertion":[{"value":"2016-11-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}