{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:10:30Z","timestamp":1750306230480,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":31,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,11,7]],"date-time":"2016-11-07T00:00:00Z","timestamp":1478476800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,11,7]]},"DOI":"10.1145\/2966986.2967051","type":"proceedings-article","created":{"date-parts":[[2016,10,18]],"date-time":"2016-10-18T12:23:59Z","timestamp":1476793439000},"page":"1-8","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":9,"title":["LRR-DPUF"],"prefix":"10.1145","author":[{"given":"Jin","family":"Miao","sequence":"first","affiliation":[{"name":"Cadence Design Systems"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Meng","family":"Li","sequence":"additional","affiliation":[{"name":"University of Texas at Austin"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Subhendu","family":"Roy","sequence":"additional","affiliation":[{"name":"Cadence Design Systems"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bei","family":"Yu","sequence":"additional","affiliation":[{"name":"The Chinese University of Hong Kong, NT, Hong Kong"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2016,11,7]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/1973009.1973111"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.5555\/2616606.2617103"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700636"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898067"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378190"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488807"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278484"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559053"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2009.5225055"},{"key":"e_1_3_2_1_13_1","first-page":"523","volume-title":"Proc. EUROCRYPT","author":"Dodis Yevgeniy","year":"2004","unstructured":"Yevgeniy Dodis, Leonid Reyzin, and Adam Smith. Fuzzy extractors: How to generate strong keys from biometrics and other noisy data. In Proc. EUROCRYPT, pages 523--540, 2004."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_18"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2013.2279798"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.5555\/2616606.2617100"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2014.6927449"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2015.7085467"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1016\/0166-218X(94)00161-6"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.5555\/2648668.2648761"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763259"},{"key":"e_1_3_2_1_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228379"},{"issue":"2","key":"e_1_3_2_1_23_1","first-page":"235","article-title":"The mask error factor in optical lithography","volume":"13","author":"Wong Alfred K.","year":"2000","unstructured":"Alfred K. Wong, Richard A. Ferguson, and Scott M. Mansfield. The mask error factor in optical lithography. IEEE TSM, 13(2):235--242, 2000.","journal-title":"IEEE TSM"},{"key":"e_1_3_2_1_24_1","volume-title":"Proc. SPIE","volume":"905213","author":"Axelrad V.","year":"2014","unstructured":"V. Axelrad, K. Mikami, M. Smayling, K. Tsujita, and H. Yaegashi. Characterization of 1D layout technology at advanced nodes and low k1. In Proc. SPIE, volume 905213--905213, 2014."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.728987"},{"key":"e_1_3_2_1_26_1","doi-asserted-by":"publisher","DOI":"10.5555\/2561828.2561884"},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1117\/12.458262"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-1362-2_11"},{"key":"e_1_3_2_1_29_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.01.007"},{"key":"e_1_3_2_1_30_1","doi-asserted-by":"publisher","DOI":"10.5555\/603095.603127"},{"key":"e_1_3_2_1_31_1","doi-asserted-by":"publisher","DOI":"10.1109\/16.163460"}],"event":{"name":"ICCAD '16: IEEE\/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE CS","IEEE-EDS Electronic Devices Society"],"location":"Austin Texas","acronym":"ICCAD '16"},"container-title":["Proceedings of the 35th International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2967051","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2966986.2967051","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:23:12Z","timestamp":1750220592000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2967051"}},"subtitle":["learning resilient and reliable digital physical unclonable function"],"short-title":[],"issued":{"date-parts":[[2016,11,7]]},"references-count":31,"alternative-id":["10.1145\/2966986.2967051","10.1145\/2966986"],"URL":"https:\/\/doi.org\/10.1145\/2966986.2967051","relation":{},"subject":[],"published":{"date-parts":[[2016,11,7]]},"assertion":[{"value":"2016-11-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}