{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:10:30Z","timestamp":1750306230495,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,11,7]],"date-time":"2016-11-07T00:00:00Z","timestamp":1478476800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,11,7]]},"DOI":"10.1145\/2966986.2980079","type":"proceedings-article","created":{"date-parts":[[2016,10,18]],"date-time":"2016-10-18T12:23:59Z","timestamp":1476793439000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Resiliency in dynamically power managed designs"],"prefix":"10.1145","author":[{"given":"Liangzhen","family":"Lai","sequence":"first","affiliation":[{"name":"ARM Research"}]},{"given":"Vikas","family":"Chandra","sequence":"additional","affiliation":[{"name":"ARM Research"}]},{"given":"Rob","family":"Aitken","sequence":"additional","affiliation":[{"name":"ARM Research"}]}],"member":"320","published-online":{"date-parts":[[2016,11,7]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.5555\/603095.603127"},{"key":"e_1_3_2_1_2_1","unstructured":"Beaglebone black. http:\/\/beagleboard.org\/Products\/BeagleBone+Black."},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","unstructured":"D. Brooks et al. Dynamic thermal management for high-performance microprocessors. In High-Performance Computer Architecture.","DOI":"10.5555\/580550.876439"},{"key":"e_1_3_2_1_5_1","first-page":"1","volume-title":"On the efficacy of nbti mitigation techniques","author":"Chan T.-B.","year":"2011","unstructured":"T.-B. Chan et al. On the efficacy of nbti mitigation techniques. In IEEE\/ACM Design, Automation and Test in Europe, pages 1--6. IEEE, 2011."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000108"},{"key":"e_1_3_2_1_7_1","unstructured":"ffmpeg. https:\/\/www.ffmpeg.org\/."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.5555\/2971808.2971810"},{"issue":"2","key":"e_1_3_2_1_9_1","first-page":"131","article-title":"45nm transistor reliability","volume":"12","author":"Hicks J.","year":"2008","unstructured":"J. Hicks et al. 45nm transistor reliability. Intel Technology Journal, 12(2):131--144, 2008.","journal-title":"Intel Technology Journal"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.5555\/1534835"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2014.2315882"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.5555\/2830689.2830697"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428083"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/2206781.2206849"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6531971"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"}],"event":{"name":"ICCAD '16: IEEE\/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE CS","IEEE-EDS Electronic Devices Society"],"location":"Austin Texas","acronym":"ICCAD '16"},"container-title":["Proceedings of the 35th International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2980079","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2966986.2980079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:23:12Z","timestamp":1750220592000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2980079"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,7]]},"references-count":16,"alternative-id":["10.1145\/2966986.2980079","10.1145\/2966986"],"URL":"https:\/\/doi.org\/10.1145\/2966986.2980079","relation":{},"subject":[],"published":{"date-parts":[[2016,11,7]]},"assertion":[{"value":"2016-11-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}