{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T16:57:38Z","timestamp":1777568258754,"version":"3.51.4"},"reference-count":29,"publisher":"Association for Computing Machinery (ACM)","issue":"6","license":[{"start":{"date-parts":[[2016,11,11]],"date-time":"2016-11-11T00:00:00Z","timestamp":1478822400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Trans. Graph."],"published-print":{"date-parts":[[2016,11,11]]},"abstract":"<jats:p>We develop a method to acquire the BRDF of a homogeneous flat sample from only two images, taken by a near-field perspective camera, and lit by a directional light source. Our method uses the MERL BRDF database to determine the optimal set of lightview pairs for data-driven reflectance acquisition. We develop a mathematical framework to estimate error from a given set of measurements, including the use of multiple measurements in an image simultaneously, as needed for acquisition from near-field setups. The novel error metric is essential in the near-field case, where we show that using the condition-number alone performs poorly. We demonstrate practical near-field acquisition of BRDFs from only one or two input images. Our framework generalizes to configurations like a fixed camera setup, where we also develop a simple extension to spatially-varying BRDFs by clustering the materials.<\/jats:p>","DOI":"10.1145\/2980179.2982396","type":"journal-article","created":{"date-parts":[[2016,11,11]],"date-time":"2016-11-11T17:02:54Z","timestamp":1478883774000},"page":"1-12","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":46,"title":["Minimal BRDF sampling for two-shot near-field reflectance acquisition"],"prefix":"10.1145","volume":"35","author":[{"given":"Zexiang","family":"Xu","sequence":"first","affiliation":[{"name":"University of California"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jannik Boll","family":"Nielsen","sequence":"additional","affiliation":[{"name":"Technical University of Denmark"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiyang","family":"Yu","sequence":"additional","affiliation":[{"name":"University of California"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Henrik Wann","family":"Jensen","sequence":"additional","affiliation":[{"name":"University of California"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ravi","family":"Ramamoorthi","sequence":"additional","affiliation":[{"name":"University of California"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2016,12,5]]},"reference":[{"key":"e_1_2_2_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/2461912.2461978"},{"key":"e_1_2_2_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/2766967"},{"key":"e_1_2_2_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/2601097.2601193"},{"key":"e_1_2_2_4_1","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.21.000001"},{"key":"e_1_2_2_5_1","volume-title":"A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation. Master's thesis","author":"Foo S. C.","unstructured":"Foo , S. C. 1997. A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation. Master's thesis , Cornell University . Foo, S. C. 1997. A gonioreflectometer for measuring the bidirectional reflectance of material for use in illumination computation. Master's thesis, Cornell University."},{"key":"e_1_2_2_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/1243980.1243984"},{"key":"e_1_2_2_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2007.4408935"},{"key":"e_1_2_2_8_1","volume-title":"Computer Vision and Pattern Recognition","volume":"1","author":"Hertzmann A.","unstructured":"Hertzmann , A. , and Seitz , S. M . 2003. Shape and materials by example: A photometric stereo approach . In Computer Vision and Pattern Recognition , vol. 1 , IEEE, 533--540. Hertzmann, A., and Seitz, S. M. 2003. Shape and materials by example: A photometric stereo approach. In Computer Vision and Pattern Recognition, vol. 1, IEEE, 533--540."},{"key":"e_1_2_2_9_1","first-page":"11","article-title":"Development of a method of classifying paints according to gloss","volume":"97","author":"Hunter R. S.","year":"1939","unstructured":"Hunter , R. S. , and Judd , D. B. 1939 . Development of a method of classifying paints according to gloss . ASTM Bulletin , 97 , 11 -- 18 . Hunter, R. S., and Judd, D. B. 1939. Development of a method of classifying paints according to gloss. ASTM Bulletin, 97, 11--18.","journal-title":"ASTM Bulletin"},{"key":"e_1_2_2_10_1","volume-title":"The measurement of appearance","author":"Hunter R. S.","unstructured":"Hunter , R. S. 1987. The measurement of appearance . John Wiley & Sons . Hunter, R. S. 1987. The measurement of appearance. John Wiley & Sons."},{"key":"e_1_2_2_11_1","doi-asserted-by":"crossref","unstructured":"Karner K. Mayer H. and Gervautz M. 1996. An image-based measurement system for anisotropic reflection. Computer Graphics Forum (EUROGRAPHICS 96) 15 3 119--128.  Karner K. Mayer H. and Gervautz M. 1996. An image-based measurement system for anisotropic reflection. Computer Graphics Forum (EUROGRAPHICS 96) 15 3 119--128.","DOI":"10.1111\/1467-8659.1530119"},{"key":"e_1_2_2_12_1","doi-asserted-by":"publisher","DOI":"10.1111\/1467-8659.00695"},{"key":"e_1_2_2_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/2077341.2077350"},{"key":"e_1_2_2_14_1","doi-asserted-by":"publisher","DOI":"10.5555\/2383815.2383829"},{"key":"e_1_2_2_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/882262.882343"},{"key":"e_1_2_2_16_1","volume-title":"Eurographics Rendering Workshop, 241--247","author":"Matusik W.","year":"2003","unstructured":"Matusik , W. , Pfister , H. , Brand , M. , and McMillan , L. 2003 . Efficient isotropic BRDF measurement . In Eurographics Rendering Workshop, 241--247 . Matusik, W., Pfister, H., Brand, M., and McMillan, L. 2003. Efficient isotropic BRDF measurement. In Eurographics Rendering Workshop, 241--247."},{"key":"e_1_2_2_17_1","doi-asserted-by":"publisher","DOI":"10.1145\/383259.383276"},{"key":"e_1_2_2_18_1","doi-asserted-by":"publisher","DOI":"10.1145\/1276377.1276469"},{"key":"e_1_2_2_19_1","doi-asserted-by":"publisher","DOI":"10.5555\/2383654.2383671"},{"key":"e_1_2_2_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/2816795.2818085"},{"key":"e_1_2_2_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2013.6475040"},{"key":"e_1_2_2_22_1","doi-asserted-by":"publisher","DOI":"10.1145\/2010324.1964940"},{"key":"e_1_2_2_23_1","volume-title":"European Conference on Computer Vision, 45--58","author":"Romeiro F.","unstructured":"Romeiro , F. , and Zickler , T . 2010. Blind reflectometry . In European Conference on Computer Vision, 45--58 . Romeiro, F., and Zickler, T. 2010. Blind reflectometry. In European Conference on Computer Vision, 45--58."},{"key":"e_1_2_2_24_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-88693-8_63"},{"key":"e_1_2_2_25_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-7091-6453-2_2"},{"key":"e_1_2_2_26_1","doi-asserted-by":"publisher","DOI":"10.1364\/JOSA.57.001105"},{"key":"e_1_2_2_27_1","doi-asserted-by":"publisher","DOI":"10.1145\/2461912.2461944"},{"key":"e_1_2_2_28_1","doi-asserted-by":"publisher","DOI":"10.1145\/133994.134078"},{"key":"e_1_2_2_29_1","doi-asserted-by":"publisher","DOI":"10.1145\/383259.383318"}],"container-title":["ACM Transactions on Graphics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2980179.2982396","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2980179.2982396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T03:49:57Z","timestamp":1750218597000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2980179.2982396"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,11]]},"references-count":29,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2016,11,11]]}},"alternative-id":["10.1145\/2980179.2982396"],"URL":"https:\/\/doi.org\/10.1145\/2980179.2982396","relation":{},"ISSN":["0730-0301","1557-7368"],"issn-type":[{"value":"0730-0301","type":"print"},{"value":"1557-7368","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,11,11]]},"assertion":[{"value":"2016-12-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}