{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:10:52Z","timestamp":1750306252452,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2017,4,3]],"date-time":"2017-04-03T00:00:00Z","timestamp":1491177600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["105-3111-Y-001-041, 105-2221-E-001-004-MY2, 105-2221-E-001-013-MY3"],"award-info":[{"award-number":["105-3111-Y-001-041, 105-2221-E-001-004-MY2, 105-2221-E-001-013-MY3"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2017,4,3]]},"DOI":"10.1145\/3019612.3019680","type":"proceedings-article","created":{"date-parts":[[2017,5,25]],"date-time":"2017-05-25T16:27:32Z","timestamp":1495729652000},"page":"1460-1466","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":2,"title":["A pattern-aware write strategy to enhance the reliability of flash-memory storage systems"],"prefix":"10.1145","author":[{"given":"Tseng-Yi","family":"Chen","sequence":"first","affiliation":[{"name":"Institute of Information Science, Taipei, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuan-Hao","family":"Chang","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Taipei, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuan-Hung","family":"Kuan","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Taipei, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ming-Chang","family":"Yang","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Taipei, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu-Ming","family":"Chang","sequence":"additional","affiliation":[{"name":"Institute of Information Science, Taipei, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pi-Cheng","family":"Hsiu","sequence":"additional","affiliation":[{"name":"Research Center for Information Technology Innovation, Taipei, Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"320","published-online":{"date-parts":[[2017,4,3]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"521","volume-title":"Automation Test in Europe Conference Exhibition (DATE)","author":"Cai Y.","year":"2012","unstructured":"Y. Cai , E. F. Haratsch , O. Mutlu , and K. Mai . Error patterns in mlc nand flash memory: Measurement, characterization, and analysis. In 2012 Design , Automation Test in Europe Conference Exhibition (DATE) , pages 521 -- 526 , March 2012 . Y. Cai, E. F. Haratsch, O. Mutlu, and K. Mai. Error patterns in mlc nand flash memory: Measurement, characterization, and analysis. In 2012 Design, Automation Test in Europe Conference Exhibition (DATE), pages 521--526, March 2012."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056062"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2013.6657034"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378623"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1145\/1508244.1508271"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2014.6875201"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2015.7208284"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2012.6232375"},{"key":"e_1_3_2_1_9_1","unstructured":"Samsung. Samsung v-nand@ONLINE http:\/\/www.samsung.com\/semiconductor\/products\/flash-storage\/v-nand\/ 2015.  Samsung. Samsung v-nand@ONLINE http:\/\/www.samsung.com\/semiconductor\/products\/flash-storage\/v-nand\/ 2015."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/1450135.1450171"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2285891"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746283"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2015.7208277"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2014.6855547"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2014.2365499"}],"event":{"name":"SAC 2017: Symposium on Applied Computing","sponsor":["SIGAPP ACM Special Interest Group on Applied Computing"],"location":"Marrakech Morocco","acronym":"SAC 2017"},"container-title":["Proceedings of the Symposium on Applied Computing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3019612.3019680","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3019612.3019680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:23:57Z","timestamp":1750220637000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3019612.3019680"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4,3]]},"references-count":15,"alternative-id":["10.1145\/3019612.3019680","10.1145\/3019612"],"URL":"https:\/\/doi.org\/10.1145\/3019612.3019680","relation":{},"subject":[],"published":{"date-parts":[[2017,4,3]]},"assertion":[{"value":"2017-04-03","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}