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We start with a generic gate model for Rensselaer\u2019s Optimistic Simulation System, a parallel discrete-event simulation framework. This generic model encompasses all functionality needed by optimistic simulation using reverse computation. We then describe a parser system that uses a standardized gate library to create a specific model for simulation. The generated model is composed of several functions, including those needed for an accurate model of timing behavior. To quantify the improvements that an automatically generated model can have over a hand written model, we compare two gate library models: an automatically generated\n            <jats:sc>lsi<\/jats:sc>\n            -10\n            <jats:sc>k<\/jats:sc>\n            library model and a previously investigated, handwritten, simplified\n            <jats:sc>gtech<\/jats:sc>\n            library model. We conclude that the automatically generated model is a more accurate model of actual hardware. In comparison to previous results, we find that the automatically generated model is able to achieve better optimistic simulation performance when measured against conservative simulation. To test the automatically generated model, we evaluate the performance of a simulation of a full-scale OpenSPARC T2 processor model. This model consists of nearly 6 million LPs. We achieve a peak performance of 1.63 million events per second during a conservative simulation. To understand the relatively weaker performance of optimistic simulation, we investigate hot spots of event activity and visually identify a workload imbalance.\n          <\/jats:p>","DOI":"10.1145\/3046685","type":"journal-article","created":{"date-parts":[[2017,5,31]],"date-time":"2017-05-31T19:32:40Z","timestamp":1496259160000},"page":"1-23","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":3,"title":["Automatic Model Generation for Gate-Level Circuit PDES with Reverse Computation"],"prefix":"10.1145","volume":"27","author":[{"given":"Elsa","family":"Gonsiorowski","sequence":"first","affiliation":[{"name":"Rensselaer Polytechnic Institute, Troy NY"}]},{"given":"Justin M.","family":"Lapre","sequence":"additional","affiliation":[{"name":"Rensselaer Polytechnic Institute, Troy NY"}]},{"given":"Christopher D.","family":"Carothers","sequence":"additional","affiliation":[{"name":"Rensselaer Polytechnic Institute, Troy NY"}]}],"member":"320","published-online":{"date-parts":[[2017,5,27]]},"reference":[{"key":"e_1_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.261"},{"volume-title":"Proceedings of the 22nd ACM\/IEEE Design Automation Conference (DAC\u201985)","author":"Arya Anjali","key":"e_1_2_1_2_1","unstructured":"Anjali Arya , V. 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