{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,19]],"date-time":"2025-06-19T04:07:30Z","timestamp":1750306050499,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":20,"publisher":"ACM","license":[{"start":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T00:00:00Z","timestamp":1497744000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF1302375 ."],"award-info":[{"award-number":["CCF1302375 ."]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2017,6,18]]},"DOI":"10.1145\/3061639.3062301","type":"proceedings-article","created":{"date-parts":[[2017,6,13]],"date-time":"2017-06-13T12:18:42Z","timestamp":1497356322000},"page":"1-6","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Phase-driven Learning-based Dynamic Reliability Management For Multi-core Processors"],"prefix":"10.1145","author":[{"given":"Zhiyuan","family":"Yang","sequence":"first","affiliation":[{"name":"University of Maryland, College Park, MD, USA"}]},{"given":"Caleb","family":"Serafy","sequence":"additional","affiliation":[{"name":"University of Maryland, College Park, MD, USA and Oracle Inc., Santa Clara, CA"}]},{"given":"Tiantao","family":"Lu","sequence":"additional","affiliation":[{"name":"University of Maryland, College Park, MD, USA and Cadence Design Systems Inc., San Jose, CA"}]},{"given":"Ankur","family":"Srivastava","sequence":"additional","affiliation":[{"name":"University of Maryland, College Park, MD, USA"}]}],"member":"320","published-online":{"date-parts":[[2017,6,18]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898082"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1454115.1454128"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837292"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593199"},{"key":"e_1_3_2_1_5_1","first-page":"326","article-title":"Electromigration behavior of 3D-IC TSV interconnects","volume":"2012","author":"Frank T.","year":"2012","unstructured":"T. Frank , Electromigration behavior of 3D-IC TSV interconnects . In ECTC , 2012 IEEE 62nd, pages 326 -- 330 . IEEE, 2012 . T. Frank, et al. Electromigration behavior of 3D-IC TSV interconnects. In ECTC, 2012 IEEE 62nd, pages 326--330. IEEE, 2012.","journal-title":"ECTC"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024746"},{"key":"e_1_3_2_1_7_1","first-page":"1","volume-title":"Automation & Test in Europe Conference & Exhibition","author":"Gupta M. S.","year":"2007","unstructured":"M. S. Gupta , Understanding voltage variations in chip multiprocessors using a distributed power-delivery network. In 2007 Design , Automation & Test in Europe Conference & Exhibition , pages 1 -- 6 . IEEE, 2007 . M. S. Gupta, et al. Understanding voltage variations in chip multiprocessors using a distributed power-delivery network. In 2007 Design, Automation & Test in Europe Conference & Exhibition, pages 1--6. IEEE, 2007."},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/ECTC.2010.5490753"},{"key":"e_1_3_2_1_9_1","first-page":"51","volume-title":"Proceedings of the DATE","author":"Huang L.","year":"2009","unstructured":"L. Huang , Lifetime reliability-aware task allocation and scheduling for MPSoC platforms . In Proceedings of the DATE , pages 51 -- 56 . EDAA, 2009 . L. Huang, et al. Lifetime reliability-aware task allocation and scheduling for MPSoC platforms. In Proceedings of the DATE, pages 51--56. EDAA, 2009."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2006.30"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.5555\/2971808.2971915"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2905010"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/2540708.2540746"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2010.2101771"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ITHERM.2014.6892267"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1261391"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2012.29"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/2370816.2370865"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/225830.223990"}],"event":{"name":"DAC '17: The 54th Annual Design Automation Conference 2017","sponsor":["EDAC Electronic Design Automation Consortium","SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"],"location":"Austin TX USA","acronym":"DAC '17"},"container-title":["Proceedings of the 54th Annual Design Automation Conference 2017"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3061639.3062301","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3061639.3062301","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3061639.3062301","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T03:03:26Z","timestamp":1750215806000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3061639.3062301"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,6,18]]},"references-count":20,"alternative-id":["10.1145\/3061639.3062301","10.1145\/3061639"],"URL":"https:\/\/doi.org\/10.1145\/3061639.3062301","relation":{},"subject":[],"published":{"date-parts":[[2017,6,18]]},"assertion":[{"value":"2017-06-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}