{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T02:00:03Z","timestamp":1771639203184,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":28,"publisher":"ACM","license":[{"start":{"date-parts":[[2017,9,18]],"date-time":"2017-09-18T00:00:00Z","timestamp":1505692800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2017,9,18]]},"DOI":"10.1145\/3128473.3128474","type":"proceedings-article","created":{"date-parts":[[2017,9,1]],"date-time":"2017-09-01T12:27:52Z","timestamp":1504268872000},"page":"1-10","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["A Strategy for Functional Defect Prediction in Homogenous Datasets"],"prefix":"10.1145","author":[{"given":"A.","family":"Pontes","sequence":"first","affiliation":[{"name":"Universidade Federal da Para\u00edba, Brazil"}]},{"given":"C.","family":"Siebra","sequence":"additional","affiliation":[{"name":"Universidade Federal da Para\u00edba, Brazil"}]},{"given":"M.","family":"Bittencourt","sequence":"additional","affiliation":[{"name":"Universidade Federal da Para\u00edba, Brazil"}]}],"member":"320","published-online":{"date-parts":[[2017,9,18]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.5815\/ijmecs.2015.09.07"},{"key":"e_1_3_2_1_2_1","first-page":"54","article-title":"Software defect prediction system using multilayer perceptron neural network with data mining","volume":"3","author":"Gayathri M","year":"2014","unstructured":"M Gayathri and A Sudha . 2014 Software defect prediction system using multilayer perceptron neural network with data mining . International Journal of Recent Technology and Engineering , 3 : 54 -- 59 . M Gayathri and A Sudha. 2014 Software defect prediction system using multilayer perceptron neural network with data mining. International Journal of Recent Technology and Engineering, 3:54--59.","journal-title":"International Journal of Recent Technology and Engineering"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICES.2013.6508369"},{"key":"e_1_3_2_1_4_1","unstructured":"D Kerana Hanirex and KP Kaliyamurthie. 2013. Multi-classification approach for detecting thyroid attacks. International Journal of Pharma and Bio Sciences.  D Kerana Hanirex and KP Kaliyamurthie. 2013. Multi-classification approach for detecting thyroid attacks. International Journal of Pharma and Bio Sciences."},{"key":"e_1_3_2_1_5_1","volume-title":"Foundation of Software Testing. Pearson Education","author":"Mathur Aditya P.","unstructured":"Aditya P. Mathur . 2007. Foundation of Software Testing. Pearson Education , first edition edition. Aditya P. Mathur. 2007. Foundation of Software Testing. Pearson Education, first edition edition."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/FOSE.2007.25"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISED.2010.52"},{"key":"e_1_3_2_1_8_1","volume-title":"Dr Sunil Kumar Gupta, and Rajeev Kumar Bedi","author":"Mahajan Er Rohit","year":"2014","unstructured":"Er Rohit Mahajan , Dr Sunil Kumar Gupta, and Rajeev Kumar Bedi . 2014 .Comparison of various approaches of software fault prediction: Areview. International Journal of Advanced Technology & Engineering Research (IJATER) . Er Rohit Mahajan, Dr Sunil Kumar Gupta, and Rajeev Kumar Bedi. 2014.Comparison of various approaches of software fault prediction: Areview. International Journal of Advanced Technology & Engineering Research (IJATER)."},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSM.2010.5609530"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2013.6693087"},{"issue":"12","key":"e_1_3_2_1_11_1","first-page":"1394","article-title":"Survey on software defect prediction using machine learning techniques","volume":"3","author":"Paramshetti Pooja","year":"2014","unstructured":"Pooja Paramshetti and DA Phalke 2014 . Survey on software defect prediction using machine learning techniques . International Journal Of Science And Research , 3 ( 12 ): 1394 -- 1397 . Pooja Paramshetti and DA Phalke 2014. Survey on software defect prediction using machine learning techniques. International Journal Of Science And Research, 3(12):1394--1397.","journal-title":"International Journal Of Science And Research"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2014.11.006"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.5555\/800253.807736"},{"key":"e_1_3_2_1_14_1","first-page":"2395","volume-title":"Engineering and Technology (IJSRSET)","author":"Jan Syed Roohullah","year":"2016","unstructured":"Syed Roohullah Jan , Syed Tauhid Ullah Shah , Zia Ullah Johar , Yasin Shah , and Fazlullah Khan . 2016 . An innovative approach to investigate various software testing techniques and strategies. International Journal of Scientific Research in Science , Engineering and Technology (IJSRSET) , pp. 2395 -- 1990 . Syed Roohullah Jan, Syed Tauhid Ullah Shah, Zia Ullah Johar, Yasin Shah, and Fazlullah Khan. 2016. An innovative approach to investigate various software testing techniques and strategies. International Journal of Scientific Research in Science, Engineering and Technology (IJSRSET), pp. 2395--1990."},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/SCAM.2014.31"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194011005256"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1002\/stvr.294"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/FOSE.2007.29"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/2811411.2811544"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2014.03.032"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1142\/S0218213008003947"},{"issue":"1","key":"e_1_3_2_1_22_1","first-page":"108","article-title":"Prediction of code fault using naive bayes and svm classifiers","volume":"20","author":"Sankar K","year":"2014","unstructured":"K Sankar , S Kannan , and P Jennifer . 2014 . Prediction of code fault using naive bayes and svm classifiers . Middle-East Journal Of Scientific Research , 20 ( 1 ): 108 -- 113 . K Sankar, S Kannan, and P Jennifer. 2014. Prediction of code fault using naive bayes and svm classifiers. Middle-East Journal Of Scientific Research, 20(1):108--113.","journal-title":"Middle-East Journal Of Scientific Research"},{"issue":"2","key":"e_1_3_2_1_23_1","first-page":"68","article-title":"Support vector machine for software defect prediction","volume":"1","author":"Selvaraj PA","year":"2013","unstructured":"PA Selvaraj and Dr P Thangaraj . 2013 . Support vector machine for software defect prediction . International Journal of Engineering & Technology Research , 1 ( 2 ): 68 -- 76 . PA Selvaraj and Dr P Thangaraj. 2013. Support vector machine for software defect prediction. International Journal of Engineering & Technology Research, 1(2):68--76.","journal-title":"International Journal of Engineering & Technology Research"},{"key":"e_1_3_2_1_24_1","volume-title":"Proceedings of the 9th International Conference on Neural Information Processing, 5:2312--2316","author":"Thet Thwin Mie Mie","year":"2002","unstructured":"Mie Mie Thet Thwin and Tong-Seng Quah . 2002 . Application of neuralnetwork for predicting software development faults using object-oriented design metrics . In Proceedings of the 9th International Conference on Neural Information Processing, 5:2312--2316 . Mie Mie Thet Thwin and Tong-Seng Quah. 2002. Application of neuralnetwork for predicting software development faults using object-oriented design metrics. In Proceedings of the 9th International Conference on Neural Information Processing, 5:2312--2316."},{"key":"e_1_3_2_1_25_1","doi-asserted-by":"publisher","DOI":"10.1109\/CISE.2010.5677057"},{"key":"e_1_3_2_1_26_1","volume-title":"Nearest neighbor sampling for better defect prediction. ACM SIGSOFT Software Engineering Notes, 30(4):1--6","author":"Boetticher Gary D","year":"2005","unstructured":"Gary D Boetticher . Nearest neighbor sampling for better defect prediction. ACM SIGSOFT Software Engineering Notes, 30(4):1--6 , 2005 . Gary D Boetticher. Nearest neighbor sampling for better defect prediction. ACM SIGSOFT Software Engineering Notes, 30(4):1--6, 2005."},{"key":"e_1_3_2_1_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/MySEC.2011.6140679"},{"key":"e_1_3_2_1_28_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.10.025"}],"event":{"name":"SAST '17: 2nd Brazilian Symposium on Systematic and Automated Software Testing","location":"Fortaleza Brazil","acronym":"SAST '17","sponsor":["SBC Sociedade Brasileira de Computa\u00e7\u00e3o"]},"container-title":["Proceedings of the 2nd Brazilian Symposium on Systematic and Automated Software Testing"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3128473.3128474","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3128473.3128474","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T02:11:01Z","timestamp":1750212661000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3128473.3128474"}},"subtitle":["A case study in the SIGAA academic system"],"short-title":[],"issued":{"date-parts":[[2017,9,18]]},"references-count":28,"alternative-id":["10.1145\/3128473.3128474","10.1145\/3128473"],"URL":"https:\/\/doi.org\/10.1145\/3128473.3128474","relation":{},"subject":[],"published":{"date-parts":[[2017,9,18]]},"assertion":[{"value":"2017-09-18","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}