{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:36:02Z","timestamp":1750221362078,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":23,"publisher":"ACM","license":[{"start":{"date-parts":[[2017,12,5]],"date-time":"2017-12-05T00:00:00Z","timestamp":1512432000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2017,12,5]]},"DOI":"10.1145\/3150928.3150935","type":"proceedings-article","created":{"date-parts":[[2018,7,31]],"date-time":"2018-07-31T16:28:33Z","timestamp":1533054513000},"page":"156-163","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Scalable analytical model of the reliability of multi-core systems-on-chip by interacting Markovian agents"],"prefix":"10.1145","author":[{"given":"Andrea","family":"Bobbio","sequence":"first","affiliation":[{"name":"DiSit - Universit\u00e0 Piemonte, Orientale, Alessandria, Italy"}]},{"given":"Cristiana","family":"Bolchini","sequence":"additional","affiliation":[{"name":"Deib - Politecnico di Milano, Milano, Italy"}]},{"given":"Davide","family":"Cerotti","sequence":"additional","affiliation":[{"name":"DiSit - Universit\u00e0 Piemonte, Orientale, Alessandria, Italy"}]},{"given":"Marco","family":"Gribaudo","sequence":"additional","affiliation":[{"name":"Deib - Politecnico di Milano, Milano, Italy"}]},{"given":"Antonio","family":"Miele","sequence":"additional","affiliation":[{"name":"Deib - Politecnico di Milano, Milano, Italy"}]}],"member":"320","published-online":{"date-parts":[[2017,12,5]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"185","volume-title":"Markovian agent models: A dynamic population of interdependent markovian agents","author":"Bobbio A.","year":"2016","unstructured":"A. Bobbio , D. Cerotti , M. Gribaudo , M. Iacono , and D. Manini . Markovian agent models: A dynamic population of interdependent markovian agents . In E. K. Al-Begain and A. B. (Eds.), editors, Seminal Contrib. to Modelling and Simulation, pages 185 -- 203 . Springer , 2016 . A. Bobbio, D. Cerotti, M. Gribaudo, M. Iacono, and D. Manini. Markovian agent models: A dynamic population of interdependent markovian agents. In E. K. Al-Begain and A. B. (Eds.), editors, Seminal Contrib. to Modelling and Simulation, pages 185--203. Springer, 2016."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_2_1","DOI":"10.1109\/TC.1986.1676840"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_3_1","DOI":"10.1109\/ICCD.2014.6974677"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_4_1","DOI":"10.1016\/j.peva.2010.11.007"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_5_1","DOI":"10.1007\/978-3-662-43505-2_69"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_6_1","DOI":"10.1166\/jolpe.2006.007"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_7_1","DOI":"10.1017\/S0305004100030437"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_8_1","DOI":"10.1109\/TVLSI.2008.917574"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_9_1","DOI":"10.1109\/ICCD.2014.6974729"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_10_1","DOI":"10.1145\/2380445.2380455"},{"key":"e_1_3_2_1_11_1","first-page":"51","volume-title":"Conf. Design Autom. & Test in Europe","author":"Huang L.","year":"2010","unstructured":"L. Huang and Q. Xu . AgeSim: A simulation framework for evaluating the lifetime reliability of processor-based SoCs . In Conf. Design Autom. & Test in Europe , pages 51 -- 56 , 2010 . L. Huang and Q. Xu. AgeSim: A simulation framework for evaluating the lifetime reliability of processor-based SoCs. In Conf. Design Autom. & Test in Europe, pages 51--56, 2010."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_12_1","DOI":"10.1109\/TR.2010.2048679"},{"unstructured":"ITRS. Int. Tech. Roadmap for Semiconductors. http:\/\/www.itrs2.net\/ 2011.  ITRS. Int. Tech. Roadmap for Semiconductors. http:\/\/www.itrs2.net\/ 2011.","key":"e_1_3_2_1_13_1"},{"key":"e_1_3_2_1_14_1","volume-title":"Failure mechanisms and models for semiconductor devices. JEDEC Publ. JEP122G","author":"Solid State Tech EDEC","year":"2010","unstructured":"J EDEC Solid State Tech . Ass. Failure mechanisms and models for semiconductor devices. JEDEC Publ. JEP122G , 2010 . JEDEC Solid State Tech. Ass. Failure mechanisms and models for semiconductor devices. JEDEC Publ. JEP122G, 2010."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_15_1","DOI":"10.1109\/TVLSI.2007.915477"},{"key":"e_1_3_2_1_16_1","series-title":"Vol. 1","volume-title":"Handbook","author":"Kececioglu D.","year":"1991","unstructured":"D. Kececioglu . Reliab. Eng . Handbook ( Vol. 1 ) . Prentice-Hall , Upper Saddle River, NJ, USA, 1991 . D. Kececioglu. Reliab. Eng. Handbook (Vol. 1). Prentice-Hall, Upper Saddle River, NJ, USA, 1991."},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_17_1","DOI":"10.1145\/1669112.1669172"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_18_1","DOI":"10.1109\/24.740502"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_19_1","DOI":"10.5555\/3130379.3130739"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_20_1","DOI":"10.1145\/980152.980157"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_21_1","DOI":"10.5555\/998680.1006725"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_22_1","DOI":"10.5555\/1009382.1009733"},{"doi-asserted-by":"publisher","key":"e_1_3_2_1_24_1","DOI":"10.1145\/1878961.1879013"}],"event":{"sponsor":["EAI The European Alliance for Innovation"],"acronym":"VALUETOOLS 2017","name":"VALUETOOLS 2017: 11th EAI International Conference on Performance Evaluation Methodologies and Tools","location":"Venice Italy"},"container-title":["Proceedings of the 11th EAI International Conference on Performance Evaluation Methodologies and Tools"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3150928.3150935","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3150928.3150935","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T02:26:19Z","timestamp":1750213579000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3150928.3150935"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12,5]]},"references-count":23,"alternative-id":["10.1145\/3150928.3150935","10.1145\/3150928"],"URL":"https:\/\/doi.org\/10.1145\/3150928.3150935","relation":{},"subject":[],"published":{"date-parts":[[2017,12,5]]},"assertion":[{"value":"2017-12-05","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}