{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,4]],"date-time":"2026-04-04T18:11:27Z","timestamp":1775326287881,"version":"3.50.1"},"publisher-location":"New York, NY, USA","reference-count":16,"publisher":"ACM","license":[{"start":{"date-parts":[[2018,11,5]],"date-time":"2018-11-05T00:00:00Z","timestamp":1541376000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"funder":[{"name":"DARPA","award":["HR0011-16-C-0052, HR0011-12-2-0016"],"award-info":[{"award-number":["HR0011-16-C-0052, HR0011-12-2-0016"]}]},{"DOI":"10.13039\/100000001","name":"NSF","doi-asserted-by":"publisher","award":["CCF-1409872, CCF-1423645"],"award-info":[{"award-number":["CCF-1409872, CCF-1423645"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2018,11,5]]},"DOI":"10.1145\/3240765.3240842","type":"proceedings-article","created":{"date-parts":[[2018,11,6]],"date-time":"2018-11-06T13:36:57Z","timestamp":1541511417000},"page":"1-8","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":117,"title":["RFUZZ"],"prefix":"10.1145","author":[{"given":"Kevin","family":"Laeufer","sequence":"first","affiliation":[{"name":"University of California"}]},{"given":"Jack","family":"Koenig","sequence":"additional","affiliation":[{"name":"University of California"}]},{"given":"Donggyu","family":"Kim","sequence":"additional","affiliation":[{"name":"University of California"}]},{"given":"Jonathan","family":"Bachrach","sequence":"additional","affiliation":[{"name":"University of California"}]},{"given":"Koushik","family":"Sen","sequence":"additional","affiliation":[{"name":"University of California"}]}],"member":"320","published-online":{"date-parts":[[2018,11,5]]},"reference":[{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1109\/CEC.2001.934425"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775907"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2016.95"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.5555\/1987082.1987095"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2017.8203780"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-02658-4_32"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001151"},{"key":"e_1_3_2_1_9_1","volume-title":"17th Asia and South Pacific Design Automation Conference.","author":"Nahir A.","unstructured":"A. Nahir, A. Ziv, and S. Panda. 2012. Optimizing test-generation to the execution platform. In 17th Asia and South Pacific Design Automation Conference."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.5555\/648021.745967"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/MEMCOD.2015.7340479"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.5555\/1554870"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10710-005-2985-x"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2001.955007"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1145\/309847.309909"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2419622"},{"key":"e_1_3_2_1_17_1","volume-title":"Accessed","author":"Zalewski Micha\u0142","year":"2014","unstructured":"Micha\u0142 Zalewski. 2014. American Fuzzy Lop Technical Details. http:\/\/lcamtuf.coredump.cx\/afl\/technical_details.txt. (2014). Accessed April, 2018."}],"event":{"name":"ICCAD '18: IEEE\/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN","location":"San Diego California","acronym":"ICCAD '18","sponsor":["IEEE-EDS Electronic Devices Society","IEEE CAS","IEEE CEDA"]},"container-title":["Proceedings of the International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3240765.3240842","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3240765.3240842","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3240765.3240842","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T00:57:33Z","timestamp":1750208253000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3240765.3240842"}},"subtitle":["coverage-directed fuzz testing of RTL on FPGAs"],"short-title":[],"issued":{"date-parts":[[2018,11,5]]},"references-count":16,"alternative-id":["10.1145\/3240765.3240842","10.1145\/3240765"],"URL":"https:\/\/doi.org\/10.1145\/3240765.3240842","relation":{},"subject":[],"published":{"date-parts":[[2018,11,5]]},"assertion":[{"value":"2018-11-05","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}