{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T04:33:28Z","timestamp":1750221208125,"version":"3.41.0"},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","license":[{"start":{"date-parts":[[2018,9,19]],"date-time":"2018-09-19T00:00:00Z","timestamp":1537315200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2018,9,19]]},"DOI":"10.1145\/3277453.3277477","type":"proceedings-article","created":{"date-parts":[[2018,12,21]],"date-time":"2018-12-21T13:33:51Z","timestamp":1545399231000},"page":"112-117","update-policy":"https:\/\/doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Reliability Evaluation of Complex Equipment Based on Virtual Samples and Performance Degradation"],"prefix":"10.1145","author":[{"given":"Xinchao","family":"Zhao","sequence":"first","affiliation":[{"name":"Naval Aeronautical University, Yantai, Shandong,China"}]},{"given":"Weimin","family":"Lv","sequence":"additional","affiliation":[{"name":"Naval Aeronautical University, Yantai, Shandong,China"}]}],"member":"320","published-online":{"date-parts":[[2018,9,19]]},"reference":[{"volume-title":"Assessment of System Performance Degradation and Reliability. J. Tactical Missile Technology, (Nov.","year":"2011","author":"Zhang J.","key":"e_1_3_2_1_1_1"},{"volume-title":"Proc. Natl. Sci. Counc. ROC(A). (May.","year":"1999","author":"Chao M.","key":"e_1_3_2_1_2_1"},{"key":"e_1_3_2_1_3_1","article-title":"Statistical tools for the rapid development & evaluation of high-reliability products. J","author":"Meeker W. Q.","year":"1999","journal-title":"IEEE Trans."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2000.816300"},{"key":"e_1_3_2_1_5_1","first-page":"4","article-title":"Real time performance reliability prediction","volume":"50","author":"Lu H.","year":"2001","journal-title":"J. IEEE Transaction on Reliability."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.05.013"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"crossref","unstructured":"Chao D. H. Ma J. and Chen S. Y. 2011. Assessment of storage reliability for FOGs by multivariate degradation data. J. Optics and Precisio n Engineering. 19 (Jan. 2011) 35--40.  Chao D. H. Ma J. and Chen S. Y. 2011. Assessment of storage reliability for FOGs by multivariate degradation data. J. Optics and Precisio n Engineering. 19 (Jan. 2011) 35--40.","DOI":"10.3788\/OPE.20111901.0035"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(00)00102-2"},{"volume-title":"Ordnance Engineering Academy","year":"2009","author":"Wang Y. M.","key":"e_1_3_2_1_9_1"},{"key":"e_1_3_2_1_10_1","unstructured":"Fan L. X. Zheng X. J. and Fang. J. 2014. Assessment of life reliability for weapon barrel by multivariate degradation data. J. Sichuan military Engineering Journal. 35 2 (Feb. 2014) 52--54+77.  Fan L. X. Zheng X. J. and Fang. J. 2014. Assessment of life reliability for weapon barrel by multivariate degradation data. J. Sichuan military Engineering Journal. 35 2 (Feb. 2014) 52--54+77."},{"key":"e_1_3_2_1_11_1","first-page":"3","article-title":"Reliability analysis approach based on multivariate degradation data","volume":"31","author":"Zhong Q. H.","year":"2011","journal-title":"J. Systems Engineering---Theory&Practice."},{"key":"e_1_3_2_1_12_1","unstructured":"Zhang G. L. Cai J. Y. Liang Y. Y. Lv M. and Lu G. A fault prediction approach for multiple performance measures based on distance analysis. J. Electronics Optics & Control 21 2 (Feb. 2014) 32--35.  Zhang G. L. Cai J. Y. Liang Y. Y. Lv M. and Lu G. A fault prediction approach for multiple performance measures based on distance analysis. J. Electronics Optics & Control 21 2 (Feb. 2014) 32--35."},{"key":"e_1_3_2_1_13_1","unstructured":"Li W. H. Shen P. G. and Ma S. N. Study on multi-parameters storage life prediction method for aerospace relay in accelerated degradation. J. Journal of Electrical Engineering. 12 1 (Jan. 2017.) 22--27.  Li W. H. Shen P. G. and Ma S. N. Study on multi-parameters storage life prediction method for aerospace relay in accelerated degradation. J. Journal of Electrical Engineering. 12 1 (Jan. 2017.) 22--27."},{"key":"e_1_3_2_1_14_1","first-page":"6","article-title":"Reliability assessment for complicated electronic equipment with virtual samples of accelerated degradation tests","volume":"47","author":"Xu Y. L.","year":"2013","journal-title":"J. Journal of Xi'an JiaoTong University."},{"key":"e_1_3_2_1_15_1","article-title":"Prediction for electronic component performance based on modified elman neural network","volume":"45","author":"Lv W. M.","year":"2017","journal-title":"J. Modern Defence Technology."},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"crossref","unstructured":"Doksum K. A. and Hoyland A. 1993. Models for variable-stress accelerated life testing experiments based on wiener processes and the inverse gaussian distribution. J. Theory of Probability & Its Applications. 37. 1993. 137--139.  Doksum K. A. and Hoyland A. 1993. Models for variable-stress accelerated life testing experiments based on wiener processes and the inverse gaussian distribution. J. Theory of Probability & Its Applications. 37. 1993. 137--139.","DOI":"10.1137\/1137030"},{"key":"e_1_3_2_1_17_1","unstructured":"Wang H. W. Xu T. X. and Wang B. 2014 Lifetime prediction of missile electrical connector based on wiener model. J. Tactical Missile Technology.2014. 42--45.  Wang H. W. Xu T. X. and Wang B. 2014 Lifetime prediction of missile electrical connector based on wiener model. J. Tactical Missile Technology.2014. 42--45."},{"key":"e_1_3_2_1_18_1","unstructured":"Su C. Y. Li S. L. Niu T. H. and Jing Y. Y. 2012. Storage reliability estimation method base on performance degradation data of dormant electronics. J. Tactical Missile Technology. 2012. 50--53.  Su C. Y. Li S. L. Niu T. H. and Jing Y. Y. 2012. Storage reliability estimation method base on performance degradation data of dormant electronics. J. Tactical Missile Technology. 2012. 50--53."}],"event":{"name":"EEET '18: 2018 International Conference on Electronics and Electrical Engineering Technology","acronym":"EEET '18","location":"Tianjin China"},"container-title":["Proceedings of the 2018 International Conference on Electronics and Electrical Engineering Technology"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3277453.3277477","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3277453.3277477","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T01:39:38Z","timestamp":1750210778000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3277453.3277477"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9,19]]},"references-count":18,"alternative-id":["10.1145\/3277453.3277477","10.1145\/3277453"],"URL":"https:\/\/doi.org\/10.1145\/3277453.3277477","relation":{},"subject":[],"published":{"date-parts":[[2018,9,19]]},"assertion":[{"value":"2018-09-19","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}